A Numerical Study of Fatigue Life of J-Leaded Solder Joints Using the Energy Partitioning Approach

1993 ◽  
Vol 115 (4) ◽  
pp. 416-423 ◽  
Author(s):  
S. Verma ◽  
A. Dasgupta ◽  
D. Barker
Keyword(s):  
Fatigue Life ◽  
Solder Joint ◽  
Numerical Study ◽  
Elastic Strain Energy ◽  
Energy Partitioning ◽  
Temperature Cycling ◽  
Temperature Cycle ◽  
Strain History ◽  
Stress And Strain ◽  
Solder Joint Fatigue

A surface-mount J-leaded device is modeled in this study, to investigate the effects of selected design, loading and manufacturing variables on solder joint fatigue life. The solder is modeled as a viscoplastic material, while the remaining materials are assumed to be linear elastic, as a first order approximation. Finite element analysis is used to determine the stress and strain history in the solder, due to temperature cycling. A “typical” temperature cycle with uniform dwell periods is applied to the solder joint. The computed stress and strain histories are utilized to construct hysteresis plots at each location in the solder joint. The hysteresis plots are then partitioned into elastic strain energy, plastic work and creep work dissipation. The fatigue life of the solder joint is then estimated through the energy partitioning technique. Parametric studies are conducted to investigate qualitatively the dependence of solder joint fatigue life on selected material properties, geometric variables, life cycle as well as accelerated loads, and manufacturing variabilities.

The Effect of Intermetallic Compound in Solder Joint Fatigue Life Prediction Using Finite Element Modeling

2003 ◽  
Author(s):  
Mohammad Masum Hossain ◽  
Dereje Agonafer ◽  
Puligandla Viswanadham ◽  
Tommi Reinikainen
Keyword(s):  
Finite Element ◽  
Fatigue Life ◽  
Intermetallic Compound ◽  
Solder Joint ◽  
Finite Element Modeling ◽  
Life Prediction ◽  
Temperature Cycling ◽  
Fatigue Life Prediction ◽  
Element Modeling ◽  
Solder Joint Fatigue

The life-prediction modeling of an electronic package requires a sequence of critical assumptions concerning the finite element models. The solder structures accommodate the bulk of the plastic strain that is generated during accelerated temperature cycling due to the thermal expansion mismatch between the various materials that constitute the package. Finite element analysis is extensively used for simulating the effect of accelerated temperature cycling on electronic packages. There are a number of issues that need to be addressed to improve the current FEM models. One of the limitations inherent to the presently available models is the accuracy in property values of eutectic 63Sn/37Pb solder or other solder materials (i.e. 62Sn/36Pb/2Ag). Life prediction methodologies for high temperature solders (90Pb/10Sn, 95Pb/5Sn, etc.) or lead-free based inter-connects materials, are almost non-existent due to their low volume use or relative infancy. [1] Another major limitation for the models presently available is excluding the effect of intermetallic compound (Cu6Sn5, Cu3Sn) formation and growth between solder joint and Cu pad due to the reflow processes, rework and during the thermal aging. The mechanical reliability of these intermetallic compounds clearly influences the mechanical integrity of the interconnection. The brittle failures of solder balls have been identified with the growth of a number of intermetallic compounds both at the interfaces between metallic layers and in the bulk solder balls. In this paper, the effect of intermetallic compound in fatigue life prediction using finite element modeling is described. A Chip Scale Package 3D Quarter model is chosen to do the FE analysis. Accelerated temperature cycling is performed to obtain the plastic work due to thermal expansion mismatch between the various materials. Solder joint fatigue life prediction methodologies were incorporated so that finite element simulation results were translated into estimated cycles to failure. The results are compared with conventional models that do not include intermetallic effects. Conventionally available material properties are assumed for the eutectic 63Sn/37Pb solder and the intermetallic material properties. The importance of including intermetallic effect in finite element modeling will be discussed.

A Modeling Study of the Effect of Underfill Materials on Solder Joint Thermal Fatigue of Ball Grid Array Package

2014 ◽  
Author(s):  
Wei Wang ◽  
Tung Nguyen
Keyword(s):  
Fatigue Life ◽  
Solder Joint ◽  
Thermal Cycling ◽  
Young’S Modulus ◽  
Material Properties ◽  
Young's Modulus ◽  
Ball Grid Array ◽  
Temperature Cycling ◽  
Solder Joint Fatigue ◽  
Underfill Material

Flip Chip Ball Grid Array packages (FCBGA) have been widely used in microelectronic industry in integrated circuit (IC) packages. Due to the intrinsic mismatch of the coefficient of thermal expansion (CTE) between silicon chip and Printed Circuit Board (PCB) material, solder joint fatigue failure due to thermal cycling becomes the most important concern for this technology. Underfill materials have been widely used as a solution to improving solder joint fatigue life. It is of importance to understand the effect of underfill material properties on the solder joint fatigue life. In this study, finite element method (FEM) was employed to study the effect of underfill materials on solder joint low cycle fatigue life in thermal cycling. ANSYS code was used to calculate the inelastic energy density generated in temperature cycling. The viscoplastic model was used for the solder to consider the inelastic and time dependent behavior under thermal cycling. By using the FEM model, the underfill material properties, the Young’s modulus and CTE were examined to study their effects on the solder joint fatigue life. It was found that the improvement of solder fatigue life could be achieved only when the CTE was low. This improvement could be strengthened by large Young’s modulus to increase the solder strength. In contrast, a large CTE underfill material could deepen the solder joint fatigue damage. This worsening effect became more significant as the Young’s modulus became larger. This study could serve as a foundation for understanding the mechanism of solder joint fatigue in the presence of underfill materials and provide guidance to choose appropriate underfill materials to improve BGA solder joint thermal fatigue in temperature cycling.

Comparison of LCC Solder Joint Life Predictions With Experimental Data

1995 ◽  
Vol 117 (2) ◽  
pp. 109-115 ◽  
Author(s):  
Liang-chi Wen ◽  
Ronald G. Ross
Keyword(s):  
Solder Joint ◽  
Cyclic Strain ◽  
Peak Stress ◽  
Temperature Cycling ◽  
Temperature Cycle ◽  
Strain History ◽  
Test Program ◽  
Test Vehicle ◽  
Creep Fatigue ◽  
Life Predictions

The ability of solder joint life-prediction algorithms to predict the failure of solder joints due to temperature-cycling induced creep-fatigue has been investigated using representative leadless chip carriers (LCCs) as the test vehicle. Four different algorithms are assessed: the classic Coffin-Manson algorithm, a modified Coffin-Manson algorithm with dependency on peak stress, and two strain-energy based algorithms. JPL’s special purpose nonlinear finite element computer program was used to dynamically simulate the solder joint response to the standard NASA temperature cycling environment, which ranges from −55°C to +100°C with a 4-hour period. The computed stress-strain history provided the inputs needed by each of the failure algorithms. To test the accuracy of the analytical predictions, three different sizes of LCCs (68 pins, 28 pins, and 20 pins) were subjected to an experimental test program using the same 4-hour temperature cycle as used in the analytical predictions. The three different sized ceramic packages, each with a 50-mil pitch, provided a range of cyclic strain ranges and solder fillet geometries so as to test the algorithms against realistic electronic packaging variables. The study highlights limitations in the historical Coffin-Manson relationship, and points up possible improvements associated with incorporating a stress modifier into the Coffin-Manson equation. This modification is also somewhat simpler and more accurate than the energy-density based algorithms, which also performed quite well.

scholarly journals Prediction of mechanical properties and fatigue life of nano silver paste in chip interconnection

2020 ◽  
Author(s):  
Hui YANG ◽  
Jihui Wu
Keyword(s):  
Fatigue Life ◽  
Solder Joint ◽  
Thermal Cycling ◽  
Solder Joints ◽  
Stress And Strain ◽  
Nano Silver ◽  
Finite Element Software ◽  
Flip Chips ◽  
Empirical Correction ◽  
Prediction Of Mechanical Properties

Abstract The simulation of nano-silver solder joints in flip-chips is performed by the finite element software ANSYS, and the stress-strain distribution results of the solder joints are displayed. In this simulation, the solder joints use Anand viscoplastic constitutive model, which can reasonably simulate the stress and strain of solder joints under thermal cycling load. At the same time this model has been embedded in ANSYS software, so it is more convenient to use. The final simulation results show that the areas where the maximum stresses and strains occur at the solder joints are mostly distributed in the contact areas between the solder joints and the copper pillars and at the solder joints. During the entire thermal cycling load process, the area where the maximum change in stress and strain occurs is always at the solder joint, and when the temperature changes, the temperature at the solder joint changes significantly. Based on comprehensive analysis, the relevant empirical correction calculation equation is used to calculate and predict the thermal fatigue life of nano-silver solder joints. The analysis results provide a reference for the application of nano-silver solder in the electronic packaging industry.

Reliability of SAC 105 and SAC1205N under Drop Tests

2016 ◽  
Vol 2016 (1) ◽  
pp. 000106-000110
Author(s):  
Jia-Shen Lan ◽  
Stuwart Fan ◽  
Louie Huang ◽  
Mei-Ling Wu
Keyword(s):  
Fatigue Life ◽  
Solder Joint ◽  
Simulation Model ◽  
Drop Test ◽  
Test Execution ◽  
Fine Pitch ◽  
Mechanical Shocks ◽  
Drop Tests ◽  
Solder Joint Fatigue ◽  
Package Reliability

Abstract In this paper, the solder joint failure and the solder joint fatigue life in the Thin-profile Fine-pitch Ball Grid Array (TFBGA) Package was investigated by performing the drop test, and implementing a simulation model. Owing to the need to meet the increasing demands for functionality, microelectronic package reliability can be compromised and has become the key issue when executing drop tests. During impact in drop test, the deformation of PCB due to bending and mechanical shocks can cause solder joint crack. While this is a well-known issue, observing the solder joint responses during the test execution can be a challenge. Therefore, in this work, a simulation model approach has been developed to investigate the stress and strain of the solder joint during the drop test. In this research, the JEDEC Condition B drop test was simulated, characterized by 1500G peak acceleration and 0.5 ms duration. The drop test simulation model was successful in predicting the solder joint fatigue life with different solder joint materials, such as SAC105 and SAC1205N, while also facilitating result comparison to identify the most optimal structure.

Gull-Wing Solder Joint Fatigue Life Sensitivity Evaluation

1997 ◽  
Vol 119 (3) ◽  
pp. 171-176 ◽  
Author(s):  
T. E. Wong ◽  
L. A. Kachatorian ◽  
B. D. Tierney
Keyword(s):  
Finite Element ◽  
Fatigue Life ◽  
Solder Joint ◽  
Sensitivity Evaluation ◽  
Minimum Number ◽  
Parametric Studies ◽  
Solder Joint Fatigue ◽  
The Impact ◽  
Joint Assembly

A Taguchi design of experiment approach was applied to thermostructural analyses of a gull-wing solder joint assembly. This approach uses a minimum number of finite element analyses to evaluate the impact of solder joint assembly parameters on fatigue life of the assembly. To avoid costly complex modeling efforts for each parametric case study, a commercially available program, MSC/PATRAN’s PATRAN Command Language, was used to automatically create finite element models of a two-dimensional gull-wing solder joint assembly based on nine parameters. Modeling time was dramatically reduced from days to a few minutes for each detailed lead/solder model. Two sets of parametric studies were conducted to evaluate the impact of variation of the six parameters. The analysis results indicate that lead ankle radius is the most critical parameter affecting solder joint total fatigue life, and lead and minimum solder thicknesses are the next most critical ones. Therefore, to effectively improve the solder joint fatigue life margin, it is recommended to: (1) increase the minimum solder thickness; (2) use thinner lead; and (3) use a larger lead ankle radius, even though this may require reducing lead shin length. By implementing only the last recommendation to modify the current solder joint assembly, the fatigue life margin in this design could, in general, be improved by 27 percent or more.

Creep Behavior of a Solder Paste With Bi Addition

2017 ◽  
Author(s):  
Pedro E. Ribeiro ◽  
Delfim F. Soares ◽  
Maria F. Cerqueira ◽  
Senhorinha F. Teixeira ◽  
Daniel A. Barros ◽  
...  
Keyword(s):  
Fatigue Life ◽  
Solder Joint ◽  
Mechanical Performance ◽  
Creep Behaviour ◽  
Real Life ◽  
Production Costs ◽  
Solder Paste ◽  
Creep Tests ◽  
Pcb Assembly ◽  
Solder Joint Fatigue

A common failure mode of electronic PCB’s is the appearance of cold solder joints between the component and PCB, during product life. This phenomenon is related to solder joint fatigue and is attributed mainly to the mismatch of the coefficients of thermal expansion (CTE) of component-solder-PCB assembly. Although some experiments show that newer lead-free tin-silver-copper (Sn-Ag-Cu, or SAC) solders perform better than the older SnPb ones, with today’s solder joint thickness decreasing and increasing working temperatures, among others, the stresses and strains due to temperature changes are growing, leading to limited fatigue life of the products. As fatigue life decreases with increasing plastic strain, creep occurrence should have significant impact, especially during thermal cycles. In order to improve mechanical properties, but also as an attempt to reduce maximum reflow cycle temperatures due to component damage and production costs, various SAC solder alloying additives are being considered to use in industrial production facilities. Solder paste producers are proposing new products based on new solder paste formulations, but the real life effects on thermo-mechanical performance aren’t well known at the moment. In this paper a dynamic mechanical analyser (DMA) is used to study the influence of Bismuth (Bi) addition, up to 5 wt %, on SAC405 solder paste, in terms of creep behaviour. Creep tests were made on three-point-bending configuration, isothermally at 30 °C, 50 °C and 75 °C, and three different stresses of 3, 5 and 9 MPa. The results shown not only a significant Bi concentration influence on creep behaviour but also a noticeable temperature dependence.

Influence of the Applied Load on the Creep Behaviour of Tin-Silver-Copper Solder

2019 ◽  
Author(s):  
Delfim F. Soares ◽  
Pedro E. Ribeiro ◽  
Pauline Capela ◽  
Daniel A. Barros ◽  
Maria F. Cerqueira ◽  
...  
Keyword(s):  
Fatigue Life ◽  
Solder Joint ◽  
Applied Load ◽  
Printed Circuit Boards ◽  
Creep Behaviour ◽  
Creep Tests ◽  
Dislocation Glide ◽  
Pcb Assembly ◽  
Creep Mechanisms ◽  
Solder Joint Fatigue

Abstract During the life cycle of an electronic printed circuit boards (PCBs), the cold solder joints formation between the component and PCB are a failure mode that happen commonly. This phenomenon is related to solder joint fatigue and is attributed mainly to the mismatch of the coefficients of thermal expansion (CTE) of component-solder-PCB assembly. With today’s solder joint thickness decreasing and increasing working temperatures, among others, the stresses and strains due to temperature changes are growing, leading to limited fatigue life of the products. In this way, once as fatigue life decreases with increasing plastic strain, it is important to study creep occurrence, especially during thermal cycles. In this work, a dynamic mechanical analyser (DMA) was used to study the influence of different applied load and temperature on the creep behaviour of the solder during a sequence of cycles. For these tests, different SAC405 alloy samples were produced, all in the same processing conditions. Creep tests were made on three-point-bending clamp configuration, isothermally at 303, 323 and 348 K, under three separate applied load of 3, 5 and 9 MPa. The results show that creep rate has an important decrease from the 1st to the following applied creep cycles. This behaviour occurs for all the tested loads and temperatures. Results, also, show that the main creep mechanisms changes, from a diffusion base type, for low load and different temperatures, to a dislocation glide-climb type for an applied load of 9 MPa and temperatures from 303 to 348 K. Experimental determined n exponent for the tested conditions allows the correlation between creep mechanisms and experimental parameters (applied load and temperature).

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