Effect of Chemical Treatment on the Optical Properties of a Cadmium Telluride Photovoltaic Device Investigated by Spectroscopic Ellipsometry

2009 ◽  
Vol 131 (2) ◽  
Author(s):  
Sandeep Kohli ◽  
Venkatesan Manivannan ◽  
James N. Hilfiker ◽  
Patrick R. McCurdy ◽  
Robert A. Enzenroth ◽  
...  
Keyword(s):  
Refractive Index ◽  
Optical Properties ◽  
Solar Cell ◽  
Spectroscopic Ellipsometry ◽  
Cadmium Chloride ◽  
Cdte Layer ◽  
Photovoltaic Device ◽  
Band Gaps ◽  
Copper Treatment ◽  
Treated Layer

Spectroscopic ellipsometry has been successfully used to characterize the CdS/CdTe heterojunction solar cell deposited on TEC15 glass. The effects of copper treatment on the optical properties of a cadmium chloride treated photovoltaic device were investigated using ellipsometry. No changes in either the band gaps or critical points of CdTe layer were noticed as a result of copper treatment. The copper treated CdTe layer exhibited a higher refractive index in the visible and longer wavelengths (≤3 eV), as compared with the untreated layer. This was attributed to the increased disorder in the case of copper treated layer.

scholarly journals Optical Characterization of Ultra-Thin Films of Azo-Dye-Doped Polymers Using Ellipsometry and Surface Plasmon Resonance Spectroscopy

Photonics ◽  
2021 ◽  
Vol 8 (2) ◽  
pp. 41
Author(s):  
Najat Andam ◽  
Siham Refki ◽  
Hidekazu Ishitobi ◽  
Yasushi Inouye ◽  
Zouheir Sekkat
Keyword(s):  
Refractive Index ◽  
Optical Properties ◽  
Surface Plasmon Resonance ◽  
Surface Plasmon ◽  
Spectroscopic Ellipsometry ◽  
Plasmon Resonance ◽  
Complex Refractive Index ◽  
Resonance Spectroscopy ◽  
Doped Polymers

The determination of optical constants (i.e., real and imaginary parts of the complex refractive index (nc) and thickness (d)) of ultrathin films is often required in photonics. It may be done by using, for example, surface plasmon resonance (SPR) spectroscopy combined with either profilometry or atomic force microscopy (AFM). SPR yields the optical thickness (i.e., the product of nc and d) of the film, while profilometry and AFM yield its thickness, thereby allowing for the separate determination of nc and d. In this paper, we use SPR and profilometry to determine the complex refractive index of very thin (i.e., 58 nm) films of dye-doped polymers at different dye/polymer concentrations (a feature which constitutes the originality of this work), and we compare the SPR results with those obtained by using spectroscopic ellipsometry measurements performed on the same samples. To determine the optical properties of our film samples by ellipsometry, we used, for the theoretical fits to experimental data, Bruggeman’s effective medium model for the dye/polymer, assumed as a composite material, and the Lorentz model for dye absorption. We found an excellent agreement between the results obtained by SPR and ellipsometry, confirming that SPR is appropriate for measuring the optical properties of very thin coatings at a single light frequency, given that it is simpler in operation and data analysis than spectroscopic ellipsometry.

scholarly journals Effect Of Cobalt’s Chloride On The Optical Properties Of Poly (O-Toluidine) And Study Of It’s Organic/Inorganic Solar Cell

2016 ◽  
Vol 12 (3) ◽  
pp. 224
Author(s):  
R. K. Alfahed ◽  
K. I. Ajeel ◽  
A. K. Hassan
Keyword(s):  
Optical Properties ◽  
Solar Cell ◽  
Spin Coating ◽  
Cobalt Chloride ◽  
Photovoltaic Device ◽  
Spin Coating Method ◽  
Type Silicon ◽  
Energy Gaps ◽  
Coating Method ◽  
Ft Ir

Preparation of poly (o-toluidine) was doped by different volume ratios of cobalt chloride and characterized by (FT-IR, XRD and SEM). The results showed that the intensity of absorption increased while energy gaps of the prepared polymer decreased with respect to increasing ratio of the dopant where the direct and indirect energy gaps were calculated, in addition to edge of the absorption. Photovoltaic device was fabricated by deposit the prepared polymer on the n-type silicon by spin coating method, so the batter efficiency of the prepared devices was 3.02% which was tested under dark and illumination with intensity of 100mW/cm².

scholarly journals First principles study of structure, electronic and optical properties of Y3Fe5O12 in cubic and trigonal phases

2015 ◽  
Vol 33 (1) ◽  
pp. 169-174 ◽  
Author(s):  
Shen Tao ◽  
Hu Chao ◽  
Dai Hailong ◽  
Yang Wenlong ◽  
Liu Hongchen ◽  
...  
Keyword(s):  
Refractive Index ◽  
Optical Properties ◽  
Energy Loss ◽  
First Principles ◽  
Structural Parameters ◽  
Band Gaps ◽  
First Principles Calculations ◽  
Electronic And Optical Properties ◽  
Direct Band ◽  
Experimental Values

AbstractFirst principles calculations have been performed to investigate the structure, electronic and optical properties of Y3Fe5O12. Both the cubic and trigonal phases have been considered in our calculation. The calculated structural parameters are slightly larger than the experimental values. The band structures show that Y3Fe5O12 in cubic and trigonal phases have direct band gaps of 0.65 and 0.17 eV. The calculations of dielectric function, absorption, extinction coefficient, refractive index, energy loss function and reflectivity are presented.

Effect of Material Parameters on the Optical Properties of Dye-Sensitized Solar Cell Photoanode

2013 ◽  
Vol 771 ◽  
pp. 115-119
Author(s):  
Amrik Singh ◽  
Devendra Mohan ◽  
Dharamvir Singh Ahlawat ◽  
Divya Jyoti
Keyword(s):  
Refractive Index ◽  
Optical Properties ◽  
Solar Cell ◽  
Absorption Index ◽  
Dye Sensitized Solar Cell ◽  
Semiconductor Film ◽  
Dispersive Transport ◽  
Material Parameters ◽  
Dye Sensitized ◽  
Simulation Task

The presented theoretical analysis predicts the behaviour of optical properties of film with regards to materialistic parameters of the photoanode of dye-sensitized solar cell using the theory of dispersive transport. The porous nature of photoanode is considered for the simulation task. The variations in refractive index and absorption index of the semiconductor film with change in the values of thickness and porosity are studied by using finite element method. The theoretically demonstrates that refractive index increases with the increase in thickness and decreases with increase in porosity but absorption index shows a monotonic behaviour.

Spectroscopic Ellipsometry Studies of Tb-doped SiO2 Thin Films

2007 ◽  
Vol 997 ◽  
Author(s):  
Zhe Chuan Feng ◽  
Zhe Chuan Feng ◽  
Yia Chung Chang ◽  
Ting Kai Li
Keyword(s):  
Thin Films ◽  
Refractive Index ◽  
Optical Properties ◽  
Layer Thickness ◽  
Wavelength Range ◽  
Spectroscopic Ellipsometry ◽  
Thickness Variation ◽  
Multi Wavelength

AbstractThe optical properties of Tb-doped SiO2 films have been studied from multi-wavelength spectroscopic ellipsometry (SE) measurements performed over the 250–1100 nm wavelength range. The SE modeling carried out with care to adhere as much to the ellipsometric fitting qualities. The refractive index dispersions, the layer thickness, and the lateral thickness variation of the films are given and discussed regarding the optical constitution of these films and the ellipsometric validity of these parameters

scholarly journals Electronic structure and optical properties of (BeTe)n/(ZnSe)m superlattices

2016 ◽  
Vol 34 (1) ◽  
pp. 115-125 ◽  
Author(s):  
M. Caid ◽  
H. Rached ◽  
D. Rached ◽  
R. Khenata ◽  
S. Bin Omran ◽  
...  
Keyword(s):  
Refractive Index ◽  
Optical Properties ◽  
Electronic Structure ◽  
Ground State ◽  
Optical Constants ◽  
Local Density ◽  
Band Gaps ◽  
Full Potential ◽  
Density Approximation ◽  
Binary Compounds

AbstractThe structural, electronic and optical properties of (BeTe)n/(ZnSe)m superlattices have been computationally evaluated for different configurations with m = n and m≠n using the full-potential linear muffin-tin method. The exchange and correlation potentials are treated by the local density approximation (LDA). The ground state properties of (BeTe)n/(ZnSe)m binary compounds are determined and compared with the available data. It is found that the superlattice band gaps vary depending on the layers used. The optical constants, including the dielectric function ε(ω), the refractive index n(ω) and the refractivity R(ω), are calculated for radiation energies up to 35 eV.

Optical and Electron-Beam Recording of Surface Relief’s Using Ge5As37S58–Se Nanomultilayers as Registering Media

2016 ◽  
Vol 39 ◽  
pp. 96-104 ◽  
Author(s):  
Alexander Stronski ◽  
Elena Achimova ◽  
Oleksandr Paiuk ◽  
Alexei Meshalkin ◽  
Vladimir Abashkin ◽  
...  
Keyword(s):  
Refractive Index ◽  
Optical Properties ◽  
Surface Relief ◽  
Band Gaps ◽  
Holographic Recording ◽  
Multilayer Nanostructures ◽  
Optical Band Gaps ◽  
Single Oscillator Model ◽  
Recording Process ◽  
Single Oscillator

Processes of e-beam and holographic recording of surface-relief structures using Ge5As37S58–Se multilayer nanostructures as registering media were studied in this paper. Optical properties of Ge5As37S58, Se layers and Ge5As37S58–Se multilayer nanostructures were investigated. Spectral dependencies of refractive index were analyzed within the frames of single-oscillator model. Values of optical band gaps for Ge5As37S58, Se layers and Ge5As37S58–Se multilayer nanostructures were obtained from Tauc dependencies. Holographic recording process depends on the polarization of the recording beams. Using e-beam and holographic recording diffraction gratings and other elements were recorded in Ge5As37S58–Se multilayer nanostructures.

CdTe Solar Cell from Sputtering Method

2012 ◽  
Vol 1447 ◽  
Author(s):  
Tara P. Dhakal ◽  
Lakshmi K. Ganta ◽  
Dino Ferizovic ◽  
Surya Rajendran ◽  
Daniel Vanhart ◽  
...  
Keyword(s):  
Grain Size ◽  
Solar Cell ◽  
Cadmium Chloride ◽  
Cdte Layer ◽  
Drying Process ◽  
Type Layer ◽  
Average Grain Size ◽  
Cdte Films ◽  
P Type ◽  
Clear Increase

ABSTRACTWe report CdTe/CdS solar cell with CdTe layer grown by sputtering method. A controlled etch and anneal process on the sputter-grown CdTe films was performed to increase the average grain size of the film. The process involved dipping the CdTe films in a saturated solution of cadmium chloride (CdCl2) in methanol (2.08 gram in 100 ml) followed by a 30 minute annealing at 400 °C. We performed various experiments on this process by varying the dipping times, drying process and annealing times and analyzed the resultant films using Scanning Electron Microscopy (SEM). We could see a clear increase in grain size from 200 nm to 5 μm after CdCl2 treatment. The process also increased the overall roughness of the sample so that more light is absorbed than reflected. We prepared solar cells using CdTe as p-type layer and CdS as n-type layer. The efficiency of the cell improved from 1.1% to 4.2% after air annealing. The effect of air-annealing is studied by means of quantum efficiency measurement.

scholarly journals Exploring optical properties of solar cells by programming and modeling

2020 ◽  
Vol 5 (1) ◽  
pp. 032-038
Author(s):  
Jasurbek Gulomov ◽  
Rayimjon Aliev ◽  
Murodjon Abduvoxidov ◽  
Avazbek Mirzaalimov ◽  
Navruzbek Mirzaalimov
Keyword(s):  
Refractive Index ◽  
Optical Properties ◽  
Solar Cells ◽  
Solar Cell ◽  
Incident Light ◽  
C Programming Language ◽  
Reflective Layer ◽  
Reflected Light ◽  
C Programming ◽  
Main Factors

One of the main factors influencing the efficiency of solar cells is their optical properties. So, most light is reflecting back and transmit through solar cell. This leads to a decrease in the efficiency. We know that the refractive index of silicon is 3-4 depending on the wavelength of light, and the refractive index of air is about 1. This causes to reflect 34 percentages of the incident light. To reduce the amount of reflected light, the surface of the solar cell should be covered with an anti-reflection layer. It is important to determine the conditions of the types and thicknesses of the material covering the surface of the solar cell. Semiconductor devices modeling has become very popular. Because the results obtained through modeling are very close to the experimental results. In this study, we also modeled the solar cell with and without an anti-reflective layer using the Sentaurus TCAD software package and presented the results obtained. A new program was developed using the C # programming language, and a library was developed to help new researchers study the optical properties of solar cells directly for that program, and a number of results were obtained.

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