Spectroscopic ellipsometry and x-ray photoelectron spectroscopy of La2O3 thin films deposited by reactive magnetron sputtering

A series of TiN coatings were deposited by reactive magnetron sputtering with different target powers and different N2flows. The microstructure and oxidation resistance of TiN coatings were characterized by X-ray diffraction (XRD). The hardness of the thin films was characterized respectively with the nanoindentor. The effect of target powers and the N2flows on the microstructure, the hardness and oxidation resistance was studied. It was found that TiN coating deposited at different target powers and different N2flows exhibits a cubic structure with (1 1 1) preferred orientations, and the hardness of TiN coatings is 1200. The oxidation resistance of the TiN coatings is approximately 500°C.

Download Full-text

W-Doped Vanadium Oxide Thin Films Prepared by Reactive Magnetron Sputtering

Advanced Materials Research ◽

10.4028/www.scientific.net/amr.652-654.1747 ◽

2013 ◽

Vol 652-654 ◽

pp. 1747-1750

Author(s):

Shuang Chen ◽

Li Fang Zhang ◽

Cui Zhi Dong ◽

Kuai Zhang ◽

Xiudong Zhu

Keyword(s):

Thin Films ◽

Magnetron Sputtering ◽

Vanadium Oxide ◽

Reactive Magnetron Sputtering ◽

Reactive Magnetron ◽

Oxide Thin Films ◽

X Ray ◽

Force Microscopy ◽

Atomic Force ◽

Vanadium Oxide Thin Films

W-doped Vanadium oxide thin films were prepared on the substrates of glass and Si (100) by reactive magnetron sputtering after annealing in vacuum. The structure and morphology were characterized by X-ray diffractometer and atomic force microscopy(AFM), respectively. The results show that,when the oxygen volume percent (Po2) increasing from 15% to 25%, the films on the Si(100) were vanadium oxides with high-valences. After vacuum annealing at 500°C for 2h, the major phase of W doped films on glass is VO2. The surface roughness of the film increase for the longer time annealing.

Download Full-text

The Influences of Oxygen Content on Microstructures and Optical Properties of Al2O3 Films Deposited by Oxygen Ion Beam Assisted Pulse Reactive Magnetron Sputtering

Advanced Materials Research ◽

10.4028/www.scientific.net/amr.750-752.1891 ◽

2013 ◽

Vol 750-752 ◽

pp. 1891-1896

Author(s):

Jin Xiao Wang ◽

Zhi Min Wang ◽

Yi Wang ◽

Kai Zhao ◽

Xiao Mei Su ◽

...

Keyword(s):

Optical Properties ◽

Magnetron Sputtering ◽

Oxygen Content ◽

Photoelectron Spectroscopy ◽

Ion Beam ◽

Amorphous Structure ◽

Reactive Magnetron Sputtering ◽

Reactive Magnetron ◽

X Ray ◽

Oxygen Ion

Al2O3films have been deposited at room temperature on polyimide substrates using oxygen ion beam assisted pulse reactive magnetron sputtering system in which aluminium sputtering is simultaneous with oxygen ion beam irradiation. A set of samples were prepared at different oxygen content and film characterizations have been carried out using X-ray diffraction (XRD) for film crystallization, atomic force microscopy (AFM) for surface morphology, and X-ray photoelectron spectroscopy (XPS) for elemental composition measurements and chemical bonding states. The films are smoother and near stoichiometric aluminum oxide as oxygen content increases up to 86%. All films are kept in amorphous structure. The optical properties of the films showed sensitive with oxygen content. Transparent films of refractive index 1.63 are obtained with a deposition rate as high as 70.3 nm/min by 86% oxygen ion beam assisted, which is about 5 times than the films by conventional reactive magnetron sputtering.

Download Full-text

STRUCTURAL PROPERTIES OF AlN FILMS WITH OXYGEN CONTENT DEPOSITED BY REACTIVE MAGNETRON SPUTTERING: XRD AND XPS CHARACTERIZATION

Surface Review and Letters ◽

10.1142/s0218625x1101445x ◽

2011 ◽

Vol 18 (01n02) ◽

pp. 23-31 ◽

Cited By ~ 10

Author(s):

MANUEL GARCÍA-MÉNDEZ ◽

SANTOS MORALES-RODRÍGUEZ ◽

SADASIVAN SHAJI ◽

BINDU KRISHNAN ◽

PASCUAL BARTOLO-PÉREZ

Keyword(s):

Magnetron Sputtering ◽

Structural Properties ◽

Photoelectron Spectroscopy ◽

Reactive Magnetron Sputtering ◽

Reactive Magnetron ◽

X Ray Diffraction ◽

Preferential Growth ◽

X Ray ◽

Xps Characterization ◽

Oxide Phases

A set of aluminium nitride ( AlN ) and oxidized AlN ( AlNO ) thin films were grown with the technique of direct current (dc) reactive magnetron sputtering. The main purpose of this investigation is to explore the influence of the oxygen on the structural properties of AlN and AlNO films. The crystalline properties and chemical identification of phases were studied by X-ray diffraction (XRD) and X-ray photoelectron spectroscopy (XPS), respectively. Electrical properties were analyzed from I-V measurements. It was found that films crystallized under the AlN würzite structure and presented a polycrystalline preferential growth along [0001] direction, perpendicular to substrate. Small amounts of secondary aluminium oxide phases were detected too. The oxide phases can induce defects, which can alter crystallinity of films.

Download Full-text

Structure and Oxidation Behavior CrN Thin Films Deposited Using DC Reactive Magnetron Sputtering

Key Engineering Materials ◽

10.4028/www.scientific.net/kem.798.122 ◽

2019 ◽

Vol 798 ◽

pp. 122-127

Author(s):

Adisorn Buranawong ◽

Nirun Witit-Anun

Keyword(s):

Thin Films ◽

Magnetron Sputtering ◽

Oxidation Behavior ◽

Reactive Magnetron Sputtering ◽

Reactive Magnetron ◽

X Ray Diffraction ◽

X Ray ◽

Ceramic Thin Films ◽

Dc Reactive Magnetron Sputtering ◽

Wafer Substrate

The CrN ceramic thin films were deposited using DC reactive magnetron sputtering system on silicon wafer substrate. Oxidation behavior was carried out in air at evaluated temperatures ranging from 500 °C up to 900 °C for 2 h. The structure and element composition of the films at different thermal annealing temperatures ranging were investigated by X-ray diffraction (XRD), Field Emission Scanning Electron Microscopy (SEM) and Energy Dispersive X-ray Spectroscopy (EDS), respectively. The oxidation activation energies of the films were calculated using Arrhenius equation. The changes in the crystal structure from CrN to Cr2O3 phase were investigated from XRD results. The accumulation of grains on surface was confirmed by FESEM micrographs. The cross-section analysis showed an apparent columnar feature with dense structure for the film annealed at low temperature, and becomes porous when increasing the annealing temperature. The thickness was increased from 1.43 to 2.67 μm. The EDS studies indicated the existence of Cr, N and O with different elements compositions on the deposited thin films. The oxidation activation energy for the CrN thin films is 124.4 kJ/mol.

Download Full-text