Proposals for exact-point transmission-electron microscopy using focused ion beam specimen-preparation technique
1998 ◽
Vol 16
(4)
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pp. 2532
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1995 ◽
Vol 13
(3)
◽
pp. 962
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1993 ◽
Vol 11
(6)
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pp. 2016
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2007 ◽
Vol 13
(2)
◽
pp. 80-86
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1998 ◽
Vol 16
(3)
◽
pp. 1127-1130
◽
2017 ◽
Vol 23
(5)
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pp. 1055-1060
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2004 ◽
Vol 53
(5)
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pp. 497-500
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1992 ◽
Vol 10
(2)
◽
pp. 575
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