Low frequency time-code time service method based on frequency sharing

2013 ◽  
Author(s):  
Ping Feng ◽  
Zhiyong Zhang ◽  
Guichen Wu ◽  
Yan Bai ◽  
Xiaofeng Ding
Keyword(s):  
Low Frequency ◽  
Time Code ◽  
Time Service

scholarly journals Variation of Low-Frequency Time-Code Signal Field Strength during the Annular Solar Eclipse on 21 June 2020: Observation and Analysis

Sensors ◽  
2021 ◽  
Vol 21 (4) ◽  
pp. 1216
Author(s):  
Xin Wang ◽  
Bo Li ◽  
Fan Zhao ◽  
Xinyu Luo ◽  
Luxi Huang ◽  
...  
Keyword(s):  
Field Strength ◽  
Solar Eclipse ◽  
Low Frequency ◽  
Signal Propagation ◽  
Normal Operation ◽  
Time Code ◽  
Long Distance ◽  
Time Service ◽  
Annular Solar Eclipse ◽  
Signal Field

Due to the occlusion of the moon, an annular solar eclipse will have an effect on the ionosphere above the earth. The change of the ionosphere, for the low-frequency time-code signal that relies on it as a reflection medium for long-distance propagation, the signal field strength, and other parameters will also produce corresponding changes, which will affect the normal operation of the low-frequency time-code time service system. This paper selects the solar eclipse that occurred in China on 21 June 2020, and uses the existing measurement equipment to carry out experimental research on the low-frequency time-code signal. We measured and analyzed the signal field strength from 20 June 2020 to 23 June 2020, and combined solar activity data, ionospheric data, and geomagnetic data, and attempted to explore the reasons and rules of the change of signal parameters. The results showed that the field strength of the low-frequency time-code signal changed dramatically within a short time period, the max growth value can reach up to 17 dBμV/m and the variation trend yielded ‘three mutations’. This change in signal field strength is probably due to the occurrence of a solar eclipse that has an effect on the ionosphere. When the signal propagation conditions change, the signal strength will also change accordingly.

Experimental Study on Low Frequency Time-Code Timing Signal Propagation in Forest Environment

2021 ◽  
Vol 55 (S1) ◽  
pp. 65-76
Author(s):  
Xin Wang ◽  
Luxi Huang ◽  
Shuanglin Li ◽  
Yingming Chen ◽  
Fan Zhao ◽  
...  
Keyword(s):  
Experimental Study ◽  
Low Frequency ◽  
Signal Propagation ◽  
Time Code ◽  
Forest Environment ◽  
Code Timing

Schumann Resonance Measurement Based on Nonlinear Interaction

2010 ◽  
Vol 439-440 ◽  
pp. 1294-1299
Author(s):  
Bing Xia Cao ◽  
Xiao Lin Qiao
Keyword(s):  
High Frequency ◽  
Electromagnetic Waves ◽  
Low Frequency ◽  
Middle Latitude ◽  
Schumann Resonance ◽  
Short Term ◽  
Time Service ◽  
Resonance Measurement ◽  
Modulation Model ◽  
Nonlinear Modulation

Schumann Resonance relates with global temperature variations, new geophysics phenomena in the low ionosphere and short-term earthquake prediction etc. In this paper based on the nonlinear modulation model of high frequency and extreme-low frequency electromagnetic waves in low ionosphere, the Schumann Resonance observing is researched. Taking the fair weather electric field in account, the cross modulation index was 4.2×10-4. At the first Schumann Resonance observatory of China, the first 4 peaks of Schumann Resonance respectively at 7, 14, 20, 26Hz were obtained in demodulation spectra of the high frequency time service signals. The parameter characteristics of Schumann Resonance in the low ionosphere were analyzed under the geographical condition of middle latitude area. The feasibility of Schumann Resonance measurement by demodulating the spectra of HF has been verified. The non-linearity between Schumann Resonance and very low frequency signals also was discussed.

A Study on the Fine Structure of the Lateral Line Organ of the Sea Eel

1973 ◽  
Vol 31 ◽  
pp. 648-649
Author(s):  
K. Hama
Keyword(s):  
Fine Structure ◽  
Electron Microscope ◽  
Lateral Line ◽  
Low Frequency ◽  
Sensory Cells ◽  
Apical Surface ◽  
Voltage Electron ◽  
Sensory Epithelia ◽  
Low Frequency Vibration ◽  
Transmission Electron

The lateral line organs of the sea eel consist of canal and pit organs which are different in function. The former is a low frequency vibration detector whereas the latter functions as an ion receptor as well as a mechano receptor.The fine structure of the sensory epithelia of both organs were studied by means of ordinary transmission electron microscope, high voltage electron microscope and of surface scanning electron microscope.The sensory cells of the canal organ are polarized in front-caudal direction and those of the pit organ are polarized in dorso-ventral direction. The sensory epithelia of both organs have thinner surface coats compared to the surrounding ordinary epithelial cells, which have very thick fuzzy coatings on the apical surface.

Lectin Binding to Human Breast Tumor Cells

1976 ◽  
Vol 34 ◽  
pp. 34-35
Author(s):  
Robert E. Nordquist ◽  
J. Hill Anglin ◽  
Michael P. Lerner
Keyword(s):  
Carcinoma Cell ◽  
Ricinus Communis ◽  
Lectin Binding ◽  
Low Frequency ◽  
Breast Carcinoma Cell Line ◽  
Human Breast ◽  
Human Breast Tumor ◽  
Duct Carcinoma ◽  
Specific Antigens ◽  
Ricin Agglutinin

A human breast carcinoma cell line (BOT-2) was derived from an infiltrating duct carcinoma (1). These cells were shown to have antigens that selectively bound antibodies from breast cancer patient sera (2). Furthermore, these tumor specific antigens could be removed from the living cells by low frequency sonication and have been partially characterized (3). These proteins have been shown to be around 100,000 MW and contain approximately 6% hexose and hexosamines. However, only the hexosamines appear to be available for lectin binding. This study was designed to use Concanavalin A (Con A) and Ricinus Communis (Ricin) agglutinin for the topagraphical localization of D-mannopyranosyl or glucopyranosyl and D-galactopyranosyl or DN- acetyl glactopyranosyl configurations on BOT-2 cell surfaces.

Practical High Resolution Microscopy

1968 ◽  
Vol 26 ◽  
pp. 302-303
Author(s):  
P. A. Marsh ◽  
T. Mullens ◽  
D. Price
Keyword(s):  
High Resolution ◽  
Magnetic Fields ◽  
Low Frequency ◽  
Resolving Power ◽  
Careful Attention ◽  
Electron Microscopes ◽  
The Relationship ◽  
High Resolution Microscopy ◽  
New Facilities

It is possible to exceed the guaranteed resolution on most electron microscopes by careful attention to microscope parameters essential for high resolution work. While our experience is related to a Philips EM-200, we hope that some of these comments will apply to all electron microscopes.The first considerations are vibration and magnetic fields. These are usually measured at the pre-installation survey and must be within specifications. It has been our experience, however, that these factors can be greatly influenced by the new facilities and therefore must be rechecked after the installation is completed. The relationship between the resolving power of an EM-200 and the maximum tolerable low frequency interference fields in milli-Oerstedt is 10 Å - 1.9, 8 Å - 1.4, 6 Å - 0.8.

Simulations of high-resolution images of amorphous silicon films

1986 ◽  
Vol 44 ◽  
pp. 544-545
Author(s):  
G. Y. Fan ◽  
J. M. Cowley
Keyword(s):  
Electron Microscope ◽  
High Frequency ◽  
Fourier Transformation ◽  
Amorphous Materials ◽  
Low Frequency ◽  
Chromatic Aberration ◽  
Structure Information ◽  
Frequency Components ◽  
High Resolution Images ◽  
Spatial Frequency Spectrum

It is well known that the structure information on the specimen is not always faithfully transferred through the electron microscope. Firstly, the spatial frequency spectrum is modulated by the transfer function (TF) at the focal plane. Secondly, the spectrum suffers high frequency cut-off by the aperture (or effectively damping terms such as chromatic aberration). While these do not have essential effect on imaging crystal periodicity as long as the low order Bragg spots are inside the aperture, although the contrast may be reversed, they may change the appearance of images of amorphous materials completely. Because the spectrum of amorphous materials is continuous, modulation of it emphasizes some components while weakening others. Especially the cut-off of high frequency components, which contribute to amorphous image just as strongly as low frequency components can have a fundamental effect. This can be illustrated through computer simulation. Imaging of a whitenoise object with an electron microscope without TF limitation gives Fig. 1a, which is obtained by Fourier transformation of a constant amplitude combined with random phases generated by computer.

SEM image sharpness analysis

1996 ◽  
Vol 54 ◽  
pp. 142-143
Author(s):  
M. T. Postek ◽  
A. E. Vladar
Keyword(s):  
High Frequency ◽  
Low Frequency ◽  
Quantitative Information ◽  
Primary Electron ◽  
Image Sharpness ◽  
Critical Dimensions ◽  
Sem Image ◽  
Frequency Changes ◽  
Electron Microscopes ◽  
Scanning Electron

Fully automated or semi-automated scanning electron microscopes (SEM) are now commonly used in semiconductor production and other forms of manufacturing. The industry requires that an automated instrument must be routinely capable of 5 nm resolution (or better) at 1.0 kV accelerating voltage for the measurement of nominal 0.25-0.35 micrometer semiconductor critical dimensions. Testing and proving that the instrument is performing at this level on a day-by-day basis is an industry need and concern which has been the object of a study at NIST and the fundamentals and results are discussed in this paper.In scanning electron microscopy, two of the most important instrument parameters are the size and shape of the primary electron beam and any image taken in a scanning electron microscope is the result of the sample and electron probe interaction. The low frequency changes in the video signal, collected from the sample, contains information about the larger features and the high frequency changes carry information of finer details. The sharper the image, the larger the number of high frequency components making up that image. Fast Fourier Transform (FFT) analysis of an SEM image can be employed to provide qualitiative and ultimately quantitative information regarding the SEM image quality.

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