Large-area high-definition cockpit displays

1995 ◽  
Author(s):  
Darrel G. Hopper ◽  
Robert B. Blanton ◽  
Daniel N. Marticello, Jr.
Keyword(s):  
High Definition ◽  
Large Area ◽  
Cockpit Displays

The XFM beamline at the Australian Synchrotron

2020 ◽  
Vol 27 (5) ◽  
pp. 1447-1458 ◽  
Author(s):  
Daryl L. Howard ◽  
Martin D. de Jonge ◽  
Nader Afshar ◽  
Chris G. Ryan ◽  
Robin Kirkham ◽  
...  
Keyword(s):  
Materials Science ◽  
Energy Detection ◽  
Array Detector ◽  
X Rays ◽  
X Ray Diffraction ◽  
High Definition ◽  
Large Area ◽  
X Ray ◽  
Diffraction Microscopy ◽  
System Time

The X-ray fluorescence microscopy (XFM) beamline is an in-vacuum undulator-based X-ray fluorescence (XRF) microprobe beamline at the 3 GeV Australian Synchrotron. The beamline delivers hard X-rays in the 4–27 keV energy range, permitting K emission to Cd and L and M emission for all other heavier elements. With a practical low-energy detection cut-off of approximately 1.5 keV, low-Z detection is constrained to Si, with Al detectable under favourable circumstances. The beamline has two scanning stations: a Kirkpatrick–Baez mirror microprobe, which produces a focal spot of 2 µm × 2 µm FWHM, and a large-area scanning `milliprobe', which has the beam size defined by slits. Energy-dispersive detector systems include the Maia 384, Vortex-EM and Vortex-ME3 for XRF measurement, and the EIGER2 X 1 Mpixel array detector for scanning X-ray diffraction microscopy measurements. The beamline uses event-mode data acquisition that eliminates detector system time overheads, and motion control overheads are significantly reduced through the application of an efficient raster scanning algorithm. The minimal overheads, in conjunction with short dwell times per pixel, have allowed XFM to establish techniques such as full spectroscopic XANES fluorescence imaging, XRF tomography, fly scanning ptychography and high-definition XRF imaging over large areas. XFM provides diverse analysis capabilities in the fields of medicine, biology, geology, materials science and cultural heritage. This paper discusses the beamline status, scientific showcases and future upgrades.

a-Si:H TFT: Potential Suitabilities for Gate and Source-Drain Self-Aligned Structure

1984 ◽  
Vol 33 ◽  
Author(s):  
B. Diem ◽  
A. Chenevas-Paule
Keyword(s):  
Channel Length ◽  
The Self ◽  
Mis Structure ◽  
High Definition ◽  
Large Area ◽  
Short Channel ◽  
Near Future ◽  
Matrix Arrays

Performances of a-Si:H TFT's are partly restricted by the parasitic capacitances due to the source-drain/gate overlapping and the channel length. These capacitances are inherent to the conventional photolithographic process [1] and to the MIS structure.The use of the self-aligned a-Si:H TFT technology should allow the manufacture of short channel TFT's (L < 5 μm) where the overlapping length becomes negligible, on a large area as well as in high definition matrices. Such transistors could constitute in the near future the solution for high performances matrix arrays as well as their peripheral electronics.

Inkjet Printing Technology: A Novel Bottom-up Approach For Multilayer Ceramic Components and High Definition Printed Electronic Devices

2012 ◽  
Vol 2012 (CICMT) ◽  
pp. 000055-000066 ◽  
Author(s):  
C. DOSSOU-YOVO ◽  
M. MOUGENOT ◽  
E. BEAUDROUET ◽  
M. BESSAUDOU ◽  
N. BERNARDIN ◽  
...  
Keyword(s):  
Inkjet Printing ◽  
High Definition ◽  
Large Area ◽  
Droplet Spreading ◽  
Component Design ◽  
Ceramic Capacitor ◽  
Ceramic Components ◽  
Multilayer Ceramic ◽  
Design Characteristics ◽  
Printing Parameters

This paper describes the methodology of thick film and Multilayer Ceramic Capacitor (MLCC) components manufacturing by inkjet printing. The printing unit is a CERADROP 3D multimaterial inkjet printer. Aqueous conductive and dielectric inks were formulated according to the printheads specifications in terms of viscosity, surface tension, particles size and sedimentation. Jetting behavior was controlled and optimized to reach the best droplets characteristics with regard to the design. Numerical processing simulation tool helps to control the printing job and to identify beneficial potential issues during the processing. Therefore printing parameters (droplet spreading, layer thickness, filling strategy, layer drying, etc.) were optimized according to material and component design characteristics. By this way, high definition and thin conductive tracks were achieved on alumina substrate with good electrical properties. Moreover, two printheads were used to build successively 3D multimaterial MLCC components with thin dielectric and conductive layers (i) with a good margins precision compared to traditional processes and (ii) with very high complex configurations thanks to the flexibility of the inkjet printing process. For both applications, large area components were accessible in a single batch.

Heat Transfer and Phase Transformations in Laser Annealing of Thin Si Films

2001 ◽  
Vol 124 (2) ◽  
pp. 253-264 ◽  
Author(s):  
Seung-Jae Moon ◽  
Minghong Lee ◽  
Costas P. Grigoropoulos
Keyword(s):  
Crystal Growth ◽  
Phase Transformations ◽  
Laser Annealing ◽  
Temperature History ◽  
High Definition ◽  
Large Area ◽  
Active Matrix ◽  
Si Films ◽  
Matrix Liquid

Recrystallization of thin amorphous silicon (a-Si) films can yield polysilicon (p-Si) material with functional properties suitable for fabrication of electronic devices, including high definition large area active matrix liquid crystal displays. Pulsed laser-effected melting and recrystallization is exceptionally effective since it avoids damage to the underlying insulator structure. The ensuing phase transformations and ultimately the quality of the produced p-Si material strongly depend on the temperature history. This article presents a review of research aiming to understand the complex nucleation, resolidification and crystal growth phenomena that evolve under severely non-equilibrium conditions. It is shown that elucidation of the fundamental thermodynamic processes enables conception of novel practical thin film crystal growth techniques.

scholarly journals Quantification of green areas

2021 ◽  
Vol 9 (74) ◽  
Author(s):  
Ramon Octaviano de Castro Matoso ◽  
Lucas do Vale Souza ◽  
Cézar Henrique Barra Rocha
Keyword(s):  
Aerial Images ◽  
Likelihood Method ◽  
Landsat 8 ◽  
High Definition ◽  
Large Area ◽  
Aerial Photos ◽  
Small Areas ◽  
Accuracy And Precision ◽  
Green Areas ◽  
Remote Sensing Techniques

The monitoring of green areas has been researched and analyzed by several surveys, however it is not trivial to find data with reliable accuracy and precision. There are well-defined and widely used methodologies for the classification of large area images, but in the case of small areas some authors recommend the analog analysis of aerial photos for classification. However, the acquisition of high definition aerial images is not inexpensive. In addition to being a fully manual and labor intensive classification. The present work proposes a methodology for the collection of a quantitative historical database using remote sensing techniques and Digital images, using the NDVI as a comparison criterion. In this work, free images of the Landsat-5, Landsat-8 and Sentinel-2 satellites were used to verify if it is possible to extract reliable information from areas considered small to use the classification supervised by the maximum likelihood method using the ENVI 5.1 software.

scholarly journals Method and application of using unmanned aerial vehicle for emergency investigation of single geo-hazard

2017 ◽  
Author(s):  
Haifeng Huang ◽  
Jingjing Long ◽  
Wu Yi ◽  
Qinglin Yi ◽  
Guodong Zhang ◽  
...  
Keyword(s):  
Unmanned Aerial Vehicle ◽  
Route Planning ◽  
Implementation Process ◽  
Site Investigation ◽  
Three Gorges Reservoir Area ◽  
High Definition ◽  
Large Area ◽  
Fast Processing ◽  
Aerial Vehicle ◽  
Time Strength

Abstract. In recent years, the unmanned aerial vehicle (UAV) began to be widely used in the emergency investigation of major natural hazards in a large area, but less for the single geo-hazard. Based on a number of successful practices in the Three Gorges Reservoir Area, China, a complete UAV-based emergency investigation method of single geo-hazard is concluded. Firstly, a customized UAV system consisting of multi-rotor UAV subsystem, aerial photography subsystem, ground control subsystem and ground surveillance subsystem is described in detail. Then, the implementation process which includes four steps, i.e., indoor preparation, site investigation, site fast processing and applying, and indoor comprehensive processing and applying is elaborated, and two investigation schemes including automatic and manual in the site investigation step are put forward. Moreover, some key techniques and methods, e.g., the ground controls points (GCPs) layout and measurement, the route planning, the flight and shooting process control, and the Structure from Motion (SfM) photogrammetry processing are explained. Finally, three applications are given. Practice shows that, using the UAV for emergency survey of single geo-hazard can not only greatly reduce the time, strength and risks of the on-site work, but also provide high-accuracy, high-definition valuable information to well support the emergency treatment.

Inkjet Printing Technology: A Novel Bottom-up Approach for Multilayer Ceramic Components and High Definition Printed Electronic Devices

2012 ◽  
Vol 9 (4) ◽  
pp. 187-198
Author(s):  
C. Dossou-Yovo ◽  
M. Mougenot ◽  
E. Beaudrouet ◽  
M. Bessaudou ◽  
N. Bernardin ◽  
...  
Keyword(s):  
Inkjet Printing ◽  
Good Precision ◽  
High Definition ◽  
Large Area ◽  
Droplet Spreading ◽  
Component Design ◽  
Ceramic Components ◽  
Multilayer Ceramic ◽  
Design Characteristics ◽  
Component Manufacturing

This paper describes the methodology of thick film and multilayer ceramic capacitor (MLCC) component manufacturing by inkjet printing. The printing unit is a CeraDrop 3D multimaterial inkjet printer. Aqueous conductive and dielectric inks were formulated according to the printhead specifications in terms of viscosity, surface tension, particle size, and sedimentation. Jetting behavior was controlled and optimized to reach the best droplet characteristics with regard to the design. The numerical processing simulation tool helps to control the printing job and to identify potential beneficial issues during the processing. Therefore, printing parameters (droplet spreading, layer thickness, filling strategy, layer drying, etc.) were optimized according to material and component design characteristics. In this way, high definition and thin conductive tracks were achieved on an alumina substrate with good electrical properties. Moreover, two printheads were used to successively build 3D multimaterial MLCC components with thin dielectric and conductive layers (i) with good precision of margins compared with traditional processes, and (ii) with very high complex configurations thanks to the flexibility of the inkjet printing process. For both applications, large area components were accessible in a single batch.

Convergent Beam Electron Diffraction

1978 ◽  
Vol 36 (3) ◽  
pp. 304-315
Author(s):  
G. Lehmpfuhl
Keyword(s):  
Electron Diffraction ◽  
Diffraction Pattern ◽  
Crystal Surface ◽  
Diffraction Spot ◽  
Crystal Thickness ◽  
Large Area ◽  
Electron Microscopic ◽  
Additional Information ◽  
Microscopic Investigations

Introduction In electron microscopic investigations of crystalline specimens the direct observation of the electron diffraction pattern gives additional information about the specimen. The quality of this information depends on the quality of the crystals or the crystal area contributing to the diffraction pattern. By selected area diffraction in a conventional electron microscope, specimen areas as small as 1 µ in diameter can be investigated. It is well known that crystal areas of that size which must be thin enough (in the order of 1000 Å) for electron microscopic investigations are normally somewhat distorted by bending, or they are not homogeneous. Furthermore, the crystal surface is not well defined over such a large area. These are facts which cause reduction of information in the diffraction pattern. The intensity of a diffraction spot, for example, depends on the crystal thickness. If the thickness is not uniform over the investigated area, one observes an averaged intensity, so that the intensity distribution in the diffraction pattern cannot be used for an analysis unless additional information is available.

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