RADIATION CHEMISTRY INVESTIGATION OF AQUEOUS SOLUTIONS USING P32 AND S35 AS INTERNAL SOURCES

1952 ◽  
Vol 30 (1) ◽  
pp. 39-46 ◽  
Author(s):  
T. J. Hardwick
Keyword(s):  
Accurate Determination ◽  
Chemical Change ◽  
Radiation Chemistry ◽  
X Rays ◽  
Γ Radiation ◽  
Unit Energy ◽  
Chemical Dosimetry ◽  
Ceric Ion ◽  
Internal Sources

The oxidation of ferrous ion and the reduction of ceric ion in 0.80  N sulphuric acid by electrons from dissolved P32 and S35 have been studied. The chemical yields (chemical change per unit energy absorbed) obtained agree well with those obtained using X or γ-radiation. The yield is independent of electron energy above about 5 kev. The results show that chemical dosimetry methods may be used for the accurate determination of energy absorption for electron energies as low as 45 kev. or X rays of 200 kev.

scholarly journals Multilayer Diffraction Reveals That Colloidal Superlattices Approach the Structural Perfection of Single Crystals

2020 ◽  
Author(s):  
Stefano Toso ◽  
Dmitry Baranov ◽  
Davide Altamura ◽  
Francesco Scattarella ◽  
Jakob Dahl ◽  
...  
Keyword(s):  
Structural Information ◽  
Accurate Determination ◽  
Diffraction Method ◽  
Atomic Displacement ◽  
Interparticle Spacing ◽  
X Rays ◽  
Structural Perfection ◽  
Fitting Algorithm ◽  
Atomic Displacement Parameters

Colloidal superlattices are fascinating materials made of ordered nanocrystals, yet they are rarely called “atomically precise.” That is unsurprising, given how challenging it is to quantify the degree of structural order in these materials. However, once that order crosses a certain threshold, constructive interference of X-rays diffracted by the nanocrystals dominates the diffraction pattern, offering a wealth of structural information. By treating nanocrystals as scattering sources forming a self-probing interferometer, we developed a multilayer diffraction method that enabled the accurate determination of nanocrystal size, interparticle spacing, and their fluctuations for samples of self-assembled CsPbBr<sub>3</sub> and PbS nanomaterials. The average nanocrystal displacement of 0.32-1.4 Å in the studied superlattices provides a figure of merit for their structural perfection and approaches the atomic displacement parameters found in traditional crystals. The method requires a laboratory-grade diffractometer and an open-source fitting algorithm for data analysis, providing a competitive alternative to resource-intensive synchrotron experiments.

Oxford HEXameter: Laboratory High Energy X-Ray Diffractometer for Bulk Residual Stress Analysis

2006 ◽  
Vol 524-525 ◽  
pp. 743-748 ◽  
Author(s):  
Alexander M. Korsunsky ◽  
Shu Yan Zhang ◽  
Daniele Dini ◽  
Willem J.J. Vorster ◽  
Jian Liu
Keyword(s):  
Accurate Determination ◽  
High Energy ◽  
Energy Dispersive ◽  
Detector Response ◽  
X Rays ◽  
X Ray Diffraction ◽  
X Ray ◽  
New Instrument ◽  
Synchrotron Beamlines

Diffraction of penetrating radiation such as neutrons or high energy X-rays provides a powerful non-destructive method for the evaluation of residual stresses in engineering components. In particular, strain scanning using synchrotron energy-dispersive X-ray diffraction has been shown to offer a fast and highly spatially resolving measurement technique. Synchrotron beamlines provide best available instruments in terms of flux and low beam divergence, and hence spatial and measurement resolution and data collection rate. However, despite the rapidly growing number of facilities becoming available in Europe and across the world, access to synchrotron beamlines for routine industrial and research use remains regulated, comparatively slow and expensive. A laboratory high energy X-ray diffractometer for bulk residual strain evaluation (HEXameter) has been developed and built at Oxford University. It uses a twin-detector setup first proposed by one of the authors in the energy dispersive X-ray diffraction mode and allows simultaneous determination of macroscopic and microscopic strains in two mutually orthogonal directions that lie approximately within the plane normal to the incident beam. A careful procedure for detector response calibration is used in order to facilitate accurate determination of lattice parameters by pattern refinement. The results of HEXameter measurements are compared with synchrotron X-ray data for several samples e.g. made from a titanium alloy and a particulate composite with an aluminium alloy matrix. Experimental results are found to be consistent with synchrotron measurements and strain resolution close to 2×10-4 is routinely achieved by the new instrument.

Energy-Dispersive X-Ray Techniques for Accurate Heavy Element Assay

1986 ◽  
Vol 30 ◽  
pp. 285-292 ◽  
Author(s):  
H. Ottmar ◽  
H. Eberle ◽  
P. Matussek ◽  
I. Michel-Piper
Keyword(s):  
Absorption Edge ◽  
Heavy Element ◽  
Accurate Determination ◽  
Energy Dispersive ◽  
X Rays ◽  
Specific Absorption ◽  
X Ray ◽  
Xrf Analysis ◽  
Analysis Technique

Energy-dispersive X-ray techniques can be employed in two different ways for the accurate determination of element concentrations in specimens: (1) spectrometry of fluoresced characteristic X-rays as widely applied in the various modes of the traditional XRF analysis technique, and (2) spectrometry of the energy-differential transmittance of an X-ray continuum at the element-specific absorption-edge energies.

scholarly journals Accuracy and precision of the RABBIT technique

2019 ◽  
Vol 377 (2145) ◽  
pp. 20170475 ◽  
Author(s):  
M. Isinger ◽  
D. Busto ◽  
S. Mikaelsson ◽  
S. Zhong ◽  
C. Guo ◽  
...  
Keyword(s):  
Time Delays ◽  
Accurate Determination ◽  
X Rays ◽  
Experimental Procedure ◽  
Temporal Precision ◽  
Two Photon ◽  
Temporal Properties ◽  
Accuracy And Precision

One of the most ubiquitous techniques within attosecond science is the so-called reconstruction of attosecond beating by interference of two-photon transitions (RABBIT). Originally proposed for the characterization of attosecond pulses, it has been successfully applied to the accurate determination of time delays in photoemission. Here, we examine in detail, using numerical simulations, the effect of the spatial and temporal properties of the light fields and of the experimental procedure on the accuracy of the method. This allows us to identify the necessary conditions to achieve the best temporal precision in RABBIT measurements. This article is part of the theme issue ‘Measurement of ultrafast electronic and structural dynamics with X-rays’.

The study of atomic inner shell transitions using solid state X-ray spectrometers

1989 ◽  
Vol 67 (8) ◽  
pp. 806-812
Author(s):  
J. L. Campbell
Keyword(s):  
Solid State ◽  
Final State Interaction ◽  
Accurate Determination ◽  
X Rays ◽  
Final State ◽  
X Ray ◽  
Experimental Resolution ◽  
Counting Statistics ◽  
Nonradiative Processes

The classical measurements of relative X-ray intensities from inner-shell transitions were accomplished with crystal spectrometers. Here we describe more recent work using solid state energy-dispersive detectors, which have much poorer resolution but offer the possibilities of very high counting statistics and very accurate determination of the experimental resolution function. Results for K X-rays agree well with theory, except in the atomic number region where the 3d shell is only partly filled. X-ray techniques can also be used in indirect but rather precise measurements of nonradiative processes. Our data for the L2–L3 Coster–Kronig vacancy transfer probability indicate a systematic departure from theory, likely due to the neglect of the final state interaction effects in the single-particle treatment when an electron is ejected during vacancy de-excitation.

scholarly journals Multilayer Diffraction Reveals That Colloidal Superlattices Approach the Structural Perfection of Single Crystals

2020 ◽  
Author(s):  
Stefano Toso ◽  
Dmitry Baranov ◽  
Davide Altamura ◽  
Francesco Scattarella ◽  
Jakob Dahl ◽  
...  
Keyword(s):  
Structural Information ◽  
Accurate Determination ◽  
Diffraction Method ◽  
Atomic Displacement ◽  
Interparticle Spacing ◽  
X Rays ◽  
Structural Perfection ◽  
Fitting Algorithm ◽  
Atomic Displacement Parameters

Colloidal superlattices are fascinating materials made of ordered nanocrystals, yet they are rarely called “atomically precise.” That is unsurprising, given how challenging it is to quantify the degree of structural order in these materials. However, once that order crosses a certain threshold, constructive interference of X-rays diffracted by the nanocrystals dominates the diffraction pattern, offering a wealth of structural information. By treating nanocrystals as scattering sources forming a self-probing interferometer, we developed a multilayer diffraction method that enabled the accurate determination of nanocrystal size, interparticle spacing, and their fluctuations for samples of self-assembled CsPbBr<sub>3</sub> and PbS nanomaterials. The average nanocrystal displacement of 0.32-1.4 Å in the studied superlattices provides a figure of merit for their structural perfection and approaches the atomic displacement parameters found in traditional crystals. The method requires a laboratory-grade diffractometer and an open-source fitting algorithm for data analysis, providing a competitive alternative to resource-intensive synchrotron experiments.

A quantitative approach to inner shell losses

1978 ◽  
Vol 36 (1) ◽  
pp. 526-527 ◽  
Author(s):  
R.D. Leapman ◽  
P. Rez ◽  
D.F. Mayers
Keyword(s):  
Energy Transfer ◽  
Cross Section ◽  
Cross Sections ◽  
Accurate Determination ◽  
Background Intensity ◽  
Core Excitation ◽  
Quantitative Basis ◽  
Cross Section Differential ◽  
Bound Electrons

Microanalysis by EELS has been developing rapidly and though the general form of the spectrum is now understood there is a need to put the technique on a more quantitative basis (1,2). Certain aspects important for microanalysis include: (i) accurate determination of the partial cross sections, σx(α,ΔE) for core excitation when scattering lies inside collection angle a and energy range ΔE above the edge, (ii) behavior of the background intensity due to excitation of less strongly bound electrons, necessary for extrapolation beneath the signal of interest, (iii) departures from the simple hydrogenic K-edge seen in L and M losses, effecting σx and complicating microanalysis. Such problems might be approached empirically but here we describe how computation can elucidate the spectrum shape.The inelastic cross section differential with respect to energy transfer E and momentum transfer q for electrons of energy E0 and velocity v can be written as

Problems in Thin-Film X-ray Quantification

1990 ◽  
Vol 48 (2) ◽  
pp. 458-459
Author(s):  
J N Chapman ◽  
W A P Nicholson
Keyword(s):  
Thin Film ◽  
Specimen Thickness ◽  
X Rays ◽  
Characteristic Peak ◽  
Local Composition ◽  
X Ray ◽  
Measured Ratio ◽  
Path Lengths ◽  
Composition Changes

Energy dispersive x-ray microanalysis (EDX) is widely used for the quantitative determination of local composition in thin film specimens. Extraction of quantitative data is usually accomplished by relating the ratio of the number of atoms of two species A and B in the volume excited by the electron beam (nA/nB) to the corresponding ratio of detected characteristic photons (NA/NB) through the use of a k-factor. This leads to an expression of the form nA/nB = kAB NA/NB where kAB is a measure of the relative efficiency with which x-rays are generated and detected from the two species.Errors in thin film x-ray quantification can arise from uncertainties in both NA/NB and kAB. In addition to the inevitable statistical errors, particularly severe problems arise in accurately determining the former if (i) mass loss occurs during spectrum acquisition so that the composition changes as irradiation proceeds, (ii) the characteristic peak from one of the minority components of interest is overlapped by the much larger peak from a majority component, (iii) the measured ratio varies significantly with specimen thickness as a result of electron channeling, or (iv) varying absorption corrections are required due to photons generated at different points having to traverse different path lengths through specimens of irregular and unknown topography on their way to the detector.

Fast calibration of CBED patterns for quantitative analysis

1993 ◽  
Vol 51 ◽  
pp. 674-675
Author(s):  
M.A. Gribelyuk ◽  
M. Rühle
Keyword(s):  
Reciprocal Lattice ◽  
Accurate Determination ◽  
Incident Beam ◽  
Crystal Thickness ◽  
Structure Model ◽  
Beam Direction ◽  
Transmitted Beam ◽  
Reciprocal Vector ◽  
On Line

A new method is suggested for the accurate determination of the incident beam direction K, crystal thickness t and the coordinates of the basic reciprocal lattice vectors V1 and V2 (Fig. 1) of the ZOLZ plans in pixels of the digitized 2-D CBED pattern. For a given structure model and some estimated values Vest and Kest of some point O in the CBED pattern a set of line scans AkBk is chosen so that all the scans are located within CBED disks.The points on line scans AkBk are conjugate to those on A0B0 since they are shifted by the reciprocal vector gk with respect to each other. As many conjugate scans are considered as CBED disks fall into the energy filtered region of the experimental pattern. Electron intensities of the transmitted beam I0 and diffracted beams Igk for all points on conjugate scans are found as a function of crystal thickness t on the basis of the full dynamical calculation.

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