KINEMATIC ANALYSIS TECHNIQUES AND THEIR APPLICATION IN BIOMECHANICS

2020 ◽

Vol 9 (3) ◽

pp. 3687-3695

Keyword(s):

Kinematic Analysis ◽

Slope Failure ◽

Anthropogenic Activities ◽

Hydropower Project ◽

Geotechnical Investigation ◽

Plane Failure ◽

Analysis Techniques ◽

Wedge Failure ◽

Work Done ◽

Joint Pattern

The present study assesses the slope stability at the most significant Baglihar Dam for slope failure and landslides occurrences. The study comprises of twelve sites which were selected for detailed geotechnical investigation for assessment of potential slope failures using basic Rock Mass Rating (RMRb), Slope Mass Rating (SMR) and kinematic analysis techniques. The results show that even though the rocks are of fair quality but other factors including joint pattern and density caused by tectonic and anthropogenic activities have rendered three sites completely unstable, 8 sites are unstable and one site is stable. Moreover Nine sites are susceptible to wedge failure, six to topple and two to plane failure. The RMRb value varies from 45 to 55 and SMR value varies from 11 to 44. The thorough results and interpretation of work done is presented in this paper.

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An example of spectrum imaging used for comparison of EELS quantitative analysis techniques on Al-Li

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s042482010008794x ◽

1991 ◽

Vol 49 ◽

pp. 726-727

Author(s):

John A. Hunt

Keyword(s):

Quantitative Analysis ◽

Large Data ◽

Difference Spectrum ◽

Large Data Sets ◽

Foil Thickness ◽

Data Sets ◽

Analysis Techniques ◽

Spectrum Imaging ◽

Normal Spectrum ◽

Electron Energy Loss

Spectrum-imaging is a useful technique for comparing different processing methods on very large data sets which are identical for each method. This paper is concerned with comparing methods of electron energy-loss spectroscopy (EELS) quantitative analysis on the Al-Li system. The spectrum-image analyzed here was obtained from an Al-10at%Li foil aged to produce δ' precipitates that can span the foil thickness. Two 1024 channel EELS spectra offset in energy by 1 eV were recorded and stored at each pixel in the 80x80 spectrum-image (25 Mbytes). An energy range of 39-89eV (20 channels/eV) are represented. During processing the spectra are either subtracted to create an artifact corrected difference spectrum, or the energy offset is numerically removed and the spectra are added to create a normal spectrum. The spectrum-images are processed into 2D floating-point images using methods and software described in [1].

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Dissociated Σ=27 boundaries in silicon

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100105187 ◽

1988 ◽

Vol 46 ◽

pp. 624-625

Author(s):

A. Garg ◽

W.A.T. Clark ◽

J.P. Hirth

Keyword(s):

Electron Diffraction ◽

Local Minimum ◽

Boundary Energy ◽

Coincidence Site Lattice ◽

Boundary Plane ◽

Low Energy ◽

Theoretical Understanding ◽

Site Lattice ◽

Kikuchi Pattern ◽

Analysis Techniques

In the last twenty years, a significant amount of work has been done in the theoretical understanding of grain boundaries. The various proposed grain boundary models suggest the existence of coincidence site lattice (CSL) boundaries at specific misorientations where a periodic structure representing a local minimum of energy exists between the two crystals. In general, the boundary energy depends not only upon the density of CSL sites but also upon the boundary plane, so that different facets of the same boundary have different energy. Here we describe TEM observations of the dissociation of a Σ=27 boundary in silicon in order to reduce its surface energy and attain a low energy configuration.The boundary was identified as near CSL Σ=27 {255} having a misorientation of (38.7±0.2)°/[011] by standard Kikuchi pattern, electron diffraction and trace analysis techniques. Although the boundary appeared planar, in the TEM it was found to be dissociated in some regions into a Σ=3 {111} and a Σ=9 {122} boundary, as shown in Fig. 1.

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Kinematic Approximations in TED and RHEED Analysis of Reconstructed Surfaces

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100135587 ◽

1990 ◽

Vol 48 (2) ◽

pp. 396-397

Author(s):

L. -M. Peng ◽

M. J. Whelan

Keyword(s):

Electron Diffraction ◽

Kinematic Analysis ◽

Incident Beam ◽

High Energy ◽

Energy Electron ◽

Great Success ◽

High Energy Electron ◽

Kinematic Approximation ◽

Reconstructed Surfaces

In recent years there has been a trend in the structure determination of reconstructed surfaces to use high energy electron diffraction techniques, and to employ a kinematic approximation in analyzing the intensities of surface superlattice reflections. Experimentally this is motivated by the great success of the determination of the dimer adatom stacking fault (DAS) structure of the Si(111) 7 × 7 reconstructed surface.While in the case of transmission electron diffraction (TED) the validity of the kinematic approximation has been examined by using multislice calculations for Si and certain incident beam directions, far less has been done in the reflection high energy electron diffraction (RHEED) case. In this paper we aim to provide a thorough Bloch wave analysis of the various diffraction processes involved, and to set criteria on the validity for the kinematic analysis of the intensities of the surface superlattice reflections.The validity of the kinematic analysis, being common to both the TED and RHEED case, relies primarily on two underlying observations, namely (l)the surface superlattice scattering in the selvedge is kinematically dominating, and (2)the superlattice diffracted beams are uncoupled from the fundamental diffracted beams within the bulk.

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Material analysis techniques using the ion mill

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100167639 ◽

1996 ◽

Vol 54 ◽

pp. 1034-1035

Author(s):

J. P. Benedict ◽

R. M. Anderson ◽

S. J. Klepeis

Keyword(s):

Polished Surface ◽

Surface Material ◽

Analysis Techniques ◽

Material Analysis ◽

Optical Inspection ◽

Electron Microscopy Analysis ◽

Microscopy Analysis ◽

Argon Ions ◽

The Impact ◽

Scanning Electron

Ion mills equipped with flood guns can perform two important functions in material analysis; they can either remove material or deposit material. The ion mill holder shown in Fig. 1 is used to remove material from the polished surface of a sample for further optical inspection or SEM ( Scanning Electron Microscopy ) analysis. The sample is attached to a pohshing stud type SEM mount and placed in the ion mill holder with the polished surface of the sample pointing straight up, as shown in Fig 2. As the holder is rotating in the ion mill, Argon ions from the flood gun are directed down at the top of the sample. The impact of Argon ions against the surface of the sample causes some of the surface material to leave the sample at a material dependent, nonuniform rate. As a result, the polished surface will begin to develop topography during milling as fast sputtering materials leave behind depressions in the polished surface.

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Developmental Sentence Scoring

Language Speech and Hearing Services in Schools ◽

10.1044/0161-1461.1503.154 ◽

1984 ◽

Vol 15 (3) ◽

pp. 154-168 ◽

Cited By ~ 9

Author(s):

Mary Ann Lively

Keyword(s):

Expressive Language ◽

Analysis Techniques ◽

Language Analysis ◽

Scoring Errors

Developmental Sentence Scoring (DSS) is a useful procedure for quantifying thegrammatic structure of children's expressive language. Like most language analysis techniques, however, DSS requires considerable study and practice to use it correctly and efficiently. Clinicians learning DSS tend to make many scoring errors at first and they display similar confusions and mistakes. This article identifies some of these common "problem" areas and provides scoring examples to assist clinicians in learning the DSS procedure.

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