EXPLOITING CHAOTIC DYNAMICS FOR A-D CONVERTER TESTING

2010 ◽  
Vol 20 (04) ◽  
pp. 1099-1118 ◽  
Author(s):  
TOMMASO ADDABBO ◽  
ADA FORT ◽  
SANTINA ROCCHI ◽  
VALERIO VIGNOLI
Keyword(s):  
Statistical Characterization ◽  
Analog To Digital ◽  
Generator Circuit ◽  
Chaotic Signals ◽  
Circuit Output ◽  
Probability Density Function Pdf ◽  
Theoretical Results ◽  
Code Density ◽  
Converter Testing ◽  
The Ideal

In this paper we discuss the possible use of chaotic signals for testing Analog-to-Digital Converters (ADCs), with particular reference to the well-known Code Density Test (CDT, also called Histogram Test). In detail, we discuss the implementation of a chaos-based discrete-time noise generator circuit, providing the theoretical analysis of its statistical characterization. The implementation of the chaos-based device is discussed with reference to a generic hardware architecture, taking into account the nonidealities introduced by the presence of noise and the variability of the circuit parameters. Based on this device, we propose a method for generating noisy samples that are distributed, over a target subinterval of the circuit output range, according to a probability density function (pdf) that can be made arbitrarily close to the ideal uniform pdf, in exchange for an acceptable reduction of the uniform-distributed samples generation rate. Theoretical results, also supported by two experiments, confirm the reliability of the proposed solution, showing that chaotic systems can represent an alternative with respect to traditional methods for the generation of signals to be used in the Code Density Test of ADCs.

Analog-to-digital converter testing—new proposals

2004 ◽  
Vol 26 (1) ◽  
pp. 3-13 ◽  
Author(s):  
A. Cruz Serra ◽  
F. Alegria ◽  
R. Martins ◽  
M. Fonseca da Silva
Keyword(s):  
Analog To Digital Converter ◽  
Digital Converter ◽  
Analog To Digital ◽  
Converter Testing

Electronic Structures of β-SiC(001) Surfaces and Al/β-SiC(001) Interface

1994 ◽  
Vol 339 ◽  
Author(s):  
Xiao Hu ◽  
Hong Yan ◽  
Fumio S. Ohuchi
Keyword(s):  
Density Of States ◽  
Electronic Structures ◽  
Surface Density ◽  
Tight Binding ◽  
Bonded Interface ◽  
Surface Reconstructions ◽  
Tight Binding Method ◽  
Theoretical Results ◽  
Good Agreement ◽  
The Ideal

ABSTRACTSurface electronic structures of β-SiC reconstructed (001) surfaces and the Al/β-SiC(001) interface have been investigated by employing a tight-binding method. Distinct surface electronic characteristics corresponding to different surface reconstructions are discussed based on the interpretation of surface density of states. The calculations of the Al/β-SiC (001) interface indicate that aluminum deposition on β-SiC(001) surface may induce the substrate to return to the ideal unreconstructed surface and that Al-C interaction is stronger than Al-Si interaction. Al deposition on C-rich surfaces may form a better bonded interface than that on the Si-rich surfaces. Our findings are in good agreement with available experimental and theoretical results.

Radiation-Tolerant Code-Density Calibration of Nyquist-Rate Analog-to-Digital Converters

2013 ◽  
Vol 60 (2) ◽  
pp. 1303-1310
Author(s):  
C. R. Grace ◽  
P. Denes ◽  
D. Gnani ◽  
H. von der Lippe ◽  
J. Walder
Keyword(s):  
Analog To Digital Converters ◽  
Analog To Digital ◽  
Nyquist Rate ◽  
Radiation Tolerant ◽  
Code Density

scholarly journals Identification of dominant error parameters in spectrum measured by TDEMI system

ACTA IMEKO ◽  
2015 ◽  
Vol 4 (1) ◽  
pp. 61
Author(s):  
Miroslav Kamenský ◽  
Karol Kovác
Keyword(s):  
Experimental Data ◽  
Mathematical Model ◽  
Time Domain ◽  
Electromagnetic Interference ◽  
Dynamic Range ◽  
Measuring Systems ◽  
Analog To Digital ◽  
Time Domain Electromagnetic ◽  
Parallel Input ◽  
Theoretical Results

Multiresolution analog-to-digital converters (MRADC) are usually used in Time Domain ElectroMagnetic Interference (TDEMI) measuring systems for very fast signal sampling with a sufficient dynamic range. The properties of the spectrum measured by the TDEMI system influenced by imperfections in the MRADC are analyzed in this paper. Errors are caused by imperfect matching of the offset and gain and phase of the circuits used in parallel input channels typical for the MRADC. For deep analyses of MRADC behavior, a precise mathematical model has been created using the concept of additive error pulses. Furthermore, a dedicated process of the identification of discrepancy parameters from experimental data is proposed. Identified parameters enter the expressions of the model and enable side to side comparison of experimental and theoretical results.

A comparison of mechanical properties between Al and Al3Mg

2016 ◽  
Vol 30 (01) ◽  
pp. 1550243 ◽  
Author(s):  
Rong Yang ◽  
Bin Tang ◽  
Tao Gao
Keyword(s):  
Elastic Properties ◽  
Failure Modes ◽  
Md Simulations ◽  
First Principles Calculations ◽  
Stress Strain ◽  
Hardening Mechanisms ◽  
Experimental Values ◽  
The Individual ◽  
Theoretical Results ◽  
The Ideal

On the basis of first principles calculations, we have calculated the elastic properties, stress–strain relations, ideal tensile strengths, ideal shear strengths, and the ideal compressed strengths of Al and Al3Mg. The stress–strain relations of Al3Mg are strikingly similar to those of Al, indicating that the crystal structure appears to be more important than the identity of the individual atoms during uniaxial deformation. Al3Mg is found to have larger moduli and higher strengths than Al but less ductile than Al. So Al3Mg is expected to be a harder material, consistent with its exploitation in Al precipitate-hardening mechanisms. The calculated elastic properties, tensile strengths and shear strengths of Al are consistent with experimental values or previous theoretical results. We also use another method (molecular dynamics (MD) simulations) to recalculate elastic constants, ideal tensile and compressed strength of Al3Mg for checking and comparing. We find that the results obtained by the two methods agree well with each other. The failure modes under uniaxial [Formula: see text] tension are also explored for Al and Al3Mg. Our calculations confirm that Al fail by shear and predict that Al3Mg also fail by shear.

Positive and Negative Feedback for Linearity Improvement and PVT Compensation of the Ramp Generator

2018 ◽  
Vol 28 (02) ◽  
pp. 1950028 ◽  
Author(s):  
Mohsen Padash ◽  
Mostafa Yargholi
Keyword(s):  
Low Power ◽  
Negative Feedback ◽  
Power Dissipation ◽  
Total Power ◽  
Portable Devices ◽  
Analog To Digital ◽  
Ramp Generator ◽  
Generator Circuit ◽  
Positive Feedback Circuit ◽  
Linearity Improvement

Linearity of ramp signals is one of the most important aspects for many applications such as single-slope analog to digital converters (ADCs); another important aspect is the total power dissipation. Applications like high-resolution single-slope ADCs that can be used in portable devices demanded accurate ramp generator with low power dissipation. This paper presents a low power ramp generator with linearity improvement that achieved by a positive feedback circuit and negative feedback for compensation of the variations in process, voltage and temperature. Derived equations of the proposed ramp generator circuit show that linearity of the output ramp, with proper choosing of device sizes, can be enhanced significantly. Also, for proving of linearity enhancement, the circuit design and post-layout simulations were done in TSMC 0.18[Formula: see text][Formula: see text]m and 90[Formula: see text]nm CMOS technologies. Simulation results show that linearity of the circuit improved by a factor of 8 and total ramp resolution improved about 3 bit, whereas power dissipation of the circuit is about 8[Formula: see text][Formula: see text]W and entire layout core area is near 800[Formula: see text][Formula: see text]m2.

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