A NOVEL NANOFABRICATION USING MICRO DROPLET JETTING SYSTEM

2006 ◽  
Vol 05 (06) ◽  
pp. 809-813
Author(s):  
XIAORAN LI ◽  
JUN XU ◽  
LEI ZHAO ◽  
XIAO GUO ◽  
WEI HUANG
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
High Stability ◽  
High Reliability ◽  
Low Cost ◽  
Luminescent Materials ◽  
Patterned Surface ◽  
Characteristic Wavelength ◽  
Micro Topography ◽  
Scanning Electron

This study briefly reports a newly developed nanopatterning technology utilizing a so-called micro droplet jetting system, which can be used in various applications such as nanofabrication. Compared with the conventional methods, this technology has the advantages as follows: it can be manipulated easily and patterned freely as the user requires; furthermore, it shows high-reliability and high-stability with very low cost. The typical specs of the micro droplet jetting system for fabricating nanodevice show as follows: (1) nanoparticle size: 50–60 nm; (2) characteristic wavelength: 400–450 nm; (3) volume of droplet: 6 ppl; (4) size of pixel: 70 μm. In this article, the nanopatterning technology adopting the micro droplet jetting system has been demonstrated to be useful for nanopatterning the pixels which consist of nanoparticles, organic luminescent materials. In addition, the micro topography and the luminescent property of the patterned surface have been characterized by using Scanning Electron Microscope (SEM) and fluorescence microscope, respectively. Finally, the fluorescence of the patterned nanoparticles was observed.

Failure Analysis With the Scanning Electron Microscope

1972 ◽  
Vol 30 ◽  
pp. 482-483
Author(s):  
John R. Devaney
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Integrated Circuits ◽  
Failure Analysis ◽  
High Reliability ◽  
Military Applications ◽  
Small Structure ◽  
Useful Life ◽  
Insight Into ◽  
Scanning Electron

Occasionally in history, an event may occur which has a profound influence on a technology. Such an event occurred when the scanning electron microscope became commercially available to industry in the mid 60's. Semiconductors were being increasingly used in high-reliability space and military applications both because of their small volume but, also, because of their inherent reliability. However, they did fail, both early in life and sometimes in middle or old age. Why they failed and how to prevent failure or prolong “useful life” was a worry which resulted in a blossoming of sophisticated failure analysis laboratories across the country. By 1966, the ability to build small structure integrated circuits was forging well ahead of techniques available to dissect and analyze these same failures. The arrival of the scanning electron microscope gave these analysts a new insight into failure mechanisms.

Effect of Kaolin Particle Size Towards Preparation of Kaolin Ceramic Membrane

2021 ◽  
Vol 02 (01) ◽  
Author(s):  
Siti Khadijah Hubadillah ◽  
◽  
Norsiah Hami ◽  
Nurul Azita Salleh ◽  
Mohd Riduan Jamalludin ◽  
...  
Keyword(s):  
Particle Size ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Field Emission ◽  
Preliminary Data ◽  
Membrane Structure ◽  
Ceramic Membrane ◽  
Low Cost ◽  
Dense Structure ◽  
Scanning Electron

The purpose of this work is to study the effect of kaolin particle size for the preparation of low cost ceramic membrane suspension and ceramic membrane structure. Kaolin particle size is categorized into two categories; i) ≤ 1µm and ii) ≥ 1 µm. The suspension is prepared via stirring technique under 1000 rpm at 60°C. The particle size of kaolin is characterized using field emission scanning electron microscope (FESEM) and the prepared suspension is characterized in term of its viscosity. Results indicate that the particle size gave significant effect to the viscosity of ceramic membrane suspension. Preliminary data showed that kaolin with particle size ≤ 1µm resulted ceramic membrane with dense structure.

scholarly journals A secondary stage design for the preparation of microfossils for the SEM

1993 ◽  
Vol 12 (2) ◽  
pp. 154-154
Author(s):  
Stephen Tatman
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Low Cost ◽  
Sample Tube ◽  
Stage Design ◽  
Single Carrier ◽  
Secondary Stage ◽  
Scanning Electron ◽  
Made In

Abstract. The preparation of microfossil specimens for study with the scanning electron microscope involves the transfer of material from slides to stubs. Specimens must then be oriented and mounted securely. To do this accurately the slide and stub should both be viewed through a stereomicroscope. However due to differences in shape and height, both surfaces are not usually in the plane of focus at the same time. Many micropalaeontologists routinely use small boxes or sample tube lids to hold the stub and refocus before finally mounting the specimens. The risk of dropping specimens is reduced by using a single carrier, securely holding both the slide and stub. The design illustrated below (fig.1) was developed from a prototype constructed from cardboard and plastic. The metal unit can easily be made in a workshop at a very low cost or cardboard versions made in the laboratory.The stage is based on the principle that both slide and stub should be held securely, close together and in the same plane of focus. The slide holders should be secure but not too tight otherwise the stub may be jarred as slides are changed. The number of slides which can be held on one unit may be varied. The presence of two holders has proved useful, any more could make the unit cumbersome. If the microscope to be used does not have a wide stage then it may prove more practical to have only one holder.The stub holders allow the stub to be clamped to . . .

scholarly journals Gesture-Based Control of the Scanning Electron Microscope Using a Low-Cost Webcam Sensor

2018 ◽  
Vol 24 (S1) ◽  
pp. 496-497
Author(s):  
B Wong ◽  
BC Breton ◽  
DM Holburn ◽  
NHM Caldwell
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Low Cost ◽  
Scanning Electron

OSL diagnostics of luminescent materials in a scanning electron microscope

2014 ◽  
Vol 50 (12) ◽  
pp. 736-740
Author(s):  
A. S. Vokhmintsev ◽  
I. A. Weinstein ◽  
M. S. Karabanalov ◽  
Ya. G. Smorodinskii
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Luminescent Materials ◽  
Scanning Electron

Co(OH)2 ELECTROCATALYST DECORATED ON TiO2 FILM FOR ENHANCED PHOTOELECTROCATALYTIC WATER OXIDATION

2020 ◽  
Vol 27 (11) ◽  
pp. 2050003
Author(s):  
HONGXIA LI ◽  
CHAO YANG ◽  
JIAN ZHANG ◽  
XIANGUO LIU ◽  
XUEFENG ZHANG
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Water Splitting ◽  
Transmission Electron Microscope ◽  
Photoelectron Spectroscopy ◽  
Water Oxidation ◽  
Low Cost ◽  
X Ray ◽  
Transmission Electron ◽  
Scanning Electron

Recently, Co(OH)2 has gained much attention as a promising electrocatalyst. Herein, we synthesized Co(OH)2-decorated TiO2 film for electrocatalytic water splitting by a facile and low-cost electrochemistry method, which possessed enhanced performance for oxygen evolution reaction. The results of X-ray diffractometry, transmission electron microscope, scanning electron microscope and X-ray photoelectron spectroscopy verify the successful decoration of Co(OH)2 electrocatalysts onto the surface of TiO2. Moreover, photoelectrocatalytic measurements illustrate that the Co(OH)2-decorated TiO2 shows higher current density than pure TiO2 sample. The results obtained in this work give deep insights into the development of photoelectrochemical water splitting.

Key Fabrication Technology Research of Exploding Foil Initiator

2013 ◽  
Vol 347-350 ◽  
pp. 1207-1210
Author(s):  
Jun Jun Lv ◽  
Qing Xuan Zeng ◽  
Ming Yu Li ◽  
Qing Xia Yu
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Magnetron Sputtering ◽  
Production Process ◽  
Low Cost ◽  
Wet Etching ◽  
Technology Research ◽  
Fabrication Technology ◽  
Manufacturing Method ◽  
Scanning Electron

In order to realize consistency and low cost in the production process of the exploding foil initiator, the manufacturing method of exploding foil initiator was studied using micro processing technology. Microcrystalline glass was used as substrate, and magnetron sputtering,photolithography and wet etching technology were utilized to product the metal bridge foil on the surface of the substrate. SU-8 photoresist was used as the barrel material and scanning electron microscope was exploited to characterize structure of the initiator. Through the electrical tests, the flyer was successfully generated and after the barrel had a good integrity.

Interfacing a Personal Computer to an Analog Scanning Electron Microscope for Storing Images on Optical Disks

1990 ◽  
Vol 48 (2) ◽  
pp. 84-85
Author(s):  
Mark H. Ransick ◽  
Chadwick D. Barklay
Keyword(s):  
Image Analysis ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Low Cost ◽  
Hard Copy ◽  
Analog To Digital ◽  
Optical Disks ◽  
Electron Microscopes ◽  
Scanning Electron Microscopes ◽  
Scanning Electron

Most manufacturers of scanning electron microscopes (SEM) now offer models that display an image digitally. This holds many advantages, including the ability to store the image on a disk and perform image analysis on the sample. Most SEMs in service, however, produce only an analog video output; they do not have the ability to digitize the image. Film is the only method of storing images.Consequentially, film is a significant portion of every microscopy laboratory’s budget. Completely eliminating the use of film from use is not practical. There will always be the need to examine a hard copy of the image; many programs require duplicate copies of each image generated; and it is sound practice to keep a copy of each image on file. By archiving digital images to an inexpensive media, the amount of film used or the time devoted to processing negatives can be greatly reduced.By using personal computers (PCs)s, with a digitizing board and analog to digital (A/D) board, it is possible to construct a relatively low cost digitizing system for any SEM.

Bevel Etching: A Low Cost Alternative to FIB

2007 ◽  
Author(s):  
B. Seidl ◽  
J. Walter ◽  
M. Kirchberger
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Failure Analysis ◽  
Electronic Packaging ◽  
Low Cost ◽  
Ion Beam ◽  
Preparation Technique ◽  
Industrial Manufacturing ◽  
Cost Efficient ◽  
Scanning Electron

Abstract Microstructural diagnostic for electronic packaging development and failure analysis under industrial manufacturing conditions require fast but reliable preparation routines. The aim of the presented poster is to introduce a time and cost efficient preparation technique for FESEM (field emission scanning electron microscope) investigations with focus on typical issues in electronic packaging development and failure analysis. The new ion beam based technique acts as a low cost alternative to FIB, able to prepare much wider section areas, combined in a tool, which can also be used for standard ion beam polishing processes.

scholarly journals Low-cost virtual instrumentation system of an energy-dispersive X-ray spectrometer for a scanning electron microscope

2002 ◽  
Vol 24 (4) ◽  
pp. 121-125 ◽  
Author(s):  
Junfeng Lei ◽  
Libo Zeng ◽  
Ronggui Liu ◽  
Juntang Liu ◽  
Zelan Zhang ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Virtual Instrument ◽  
Low Cost ◽  
Energy Dispersive ◽  
Distribution Analysis ◽  
X Ray ◽  
Human Interface ◽  
Program Language ◽  
Scanning Electron

The paper describes an energy-dispersive X-ray spectrometer for a scanning electron microscope (SEM-EDXS). It was constructed using the new architecture of a virtual instrument (VI), which is low-cost, space-saving, fast and flexible way to develop the instrument. Computer-aided teaching (CAT) was used to develop the instrument and operation rather than a traditional instrument technique. The VI was designed using the object-oriented program language C++ and compact programmable logical devices (CPLD). These include spectra collection and processing, quantitative analysis and X-ray-intensity distribution analysis. The procedure is described in detail. The VI system gives an e¡ective and user-friendly human interface for the whole analytical task. Some examples are described.

Sign in / Sign up

Export Citation Format

Share Document