Titanium Dioxide/Multi-Walled Carbon Nanotube Heterostructure Containing Single One Carbon Nanotube and Its Electromagnetic Properties

NANO ◽  
2015 ◽  
Vol 10 (07) ◽  
pp. 1550102 ◽  
Author(s):  
Xu Huang ◽  
Kun Jia ◽  
Xiaobo Liu
Keyword(s):  
Electron Microscope ◽  
Carbon Nanotube ◽  
Anatase Phase ◽  
Xrd Analysis ◽  
Electromagnetic Properties ◽  
X Ray ◽  
Broadband Absorption ◽  
Resonance Behavior ◽  
Transmission Electron ◽  
Multi Walled Carbon Nanotube

TiO 2@MWCNT heterostructure containing single one carbon nanotube has been successfully prepared via solvothermal method. X-ray diffration (XRD) analysis shows that TiO 2 nanocrystals only contain highly crystallized tetragonal anatase phase. Interestingly, scanning electron microscope (SEM) and transmission electron microscope (TEM) results show that most of the TiO 2 nanocrystals are perpendicular to the surface of multi-walled carbon nanotube (MWCNT) and only single one carbon nanotube is coated by TiO 2 crystals. The electromagnetic (EM) characteristics are investigated at 0.5–18.0 GHz range. The EM properties show that both the permittivity and the permeability present a typical resonance behavior at 11.0 GHz and 12.0 GHz, respectively. Besides, the TiO 2@MWCNT heterostructures exhibit a broadband absorption throughout the whole Ku wave bands (12.0–18.0 GHz). Interestingly, the reflection loss (RL) of the TiO 2@MWCNT heterostructures change slightly as the thickness of the heterostructures increase from 3.0 mm to 5.0 mm in the 8.0–13.0 GHz range.

Three-Dimensional Evaluation of a Multi-Walled Carbon Nanotube Probe by Using High-Resolution Transmission Electron Microscope

2010 ◽  
Vol 16 (S2) ◽  
pp. 1844-1845
Author(s):  
T Tanigaki ◽  
Y Nagakubo ◽  
K Hidaka
Keyword(s):  
Electron Microscope ◽  
Carbon Nanotube ◽  
High Resolution ◽  
Transmission Electron Microscope ◽  
Three Dimensional ◽  
Transmission Electron ◽  
Multi Walled Carbon Nanotube

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Nanobundles

1994 ◽  
Vol 359 ◽  
Author(s):  
Kiyoshi Yase ◽  
Nobutaka Tanigaki ◽  
Mutsumasa Kyotani ◽  
Motoo Yumura ◽  
Kunio Uchida ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Carbon Nanotube ◽  
Transmission Electron Microscope ◽  
Small Angle ◽  
X Ray ◽  
Transmission Electron

ABSTRACTFine molecular straw, carbon nanotube (NT) is aligned to form a bundle. The purified NTs are mixed with a plastic polymer (polypropylene: PP) and extruded from a small die with a diameter of 2 mm kept at 200°C. The threads of NT/PP blend are characterized by small angle X-ray diffractometry and transmission electron microscope to confirm the existence of nanobundle of NTs, which orient along the spinning direction.

XRD Analysis of Cu-Al Interconnect Intermetallic Compound in an Annealed Micro-Chip

2012 ◽  
Vol 620 ◽  
pp. 166-172 ◽  
Author(s):  
Kok Yau Chua ◽  
May Ting Hng ◽  
Cher Chia Lee ◽  
T. Joseph Sahaya Anand
Keyword(s):  
Electron Microscope ◽  
Intermetallic Compound ◽  
Transmission Electron Microscope ◽  
Xrd Analysis ◽  
Peak Detection ◽  
Energy Dispersive ◽  
Powder Form ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron

Cu-Al intermetallic compound (IMC) in Cu wire-Al bond pad interconnect interface is drawing attention of researches. However, due to thin IMC thickness, the characterizations of the IMC are limited to expensive and time consuming techniques. An evaluation is performed to use common X-Ray Diffraction (XRD) technique to identify the IMC in the Cu wired micro-chip samples in powder form. Existence of mixture of CuAl and CuAl2 was first confirmed by transmission electron microscope (TEM) and energy dispersive X-ray (EDX). In XRD analysis, peak correspond to CuAl phase is identified from measurement with slower scan configuration. The difficulty for IMC peak detection in diffractogram is due to low composition ratio of IMC relative to other materials available in the sample. KOH treatment for enhancing IMC peaks intensity does not work as expected as it etches the IMC as well.

X-ray microanalysis of thin specimens in the transmission electron microscope at voltages up to 1000 Kv.

1978 ◽  
Vol 36 (1) ◽  
pp. 540-541
Author(s):  
G. Cliff ◽  
M.J. Nasir ◽  
G.W. Lorimer ◽  
N. Ridley
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Weight Fraction ◽  
Present Series ◽  
Constant Independent ◽  
X Ray ◽  
Transmission Electron ◽  
Series Of Experiments ◽  
Image Position ◽  
X Ray Absorption

In a specimen which is transmission thin to 100 kV electrons - a sample in which X-ray absorption is so insignificant that it can be neglected and where fluorescence effects can generally be ignored (1,2) - a ratio of characteristic X-ray intensities, I1/I2 can be converted into a weight fraction ratio, C1/C2, using the equationwhere k12 is, at a given voltage, a constant independent of composition or thickness, k12 values can be determined experimentally from thin standards (3) or calculated (4,6). Both experimental and calculated k12 values have been obtained for K(11<Z>19),kα(Z>19) and some Lα radiation (3,6) at 100 kV. The object of the present series of experiments was to experimentally determine k12 values at voltages between 200 and 1000 kV and to compare these with calculated values.The experiments were carried out on an AEI-EM7 HVEM fitted with an energy dispersive X-ray detector.

Aspects of microanalysis in a transmission electron microscope

1978 ◽  
Vol 36 (1) ◽  
pp. 510-511
Author(s):  
R. Sinclair ◽  
B.E. Jacobson
Keyword(s):  
Grain Size ◽  
Electron Beam ◽  
Electron Microscope ◽  
Chemical Analysis ◽  
Transmission Electron Microscope ◽  
Vapor Deposition ◽  
Critical Currents ◽  
X Ray ◽  
Fine Grain ◽  
Transmission Electron

INTRODUCTIONThe prospect of performing chemical analysis of thin specimens at any desired level of resolution is particularly appealing to the materials scientist. Commercial TEM-based systems are now available which virtually provide this capability. The purpose of this contribution is to illustrate its application to problems which would have been intractable until recently, pointing out some current limitations.X-RAY ANALYSISIn an attempt to fabricate superconducting materials with high critical currents and temperature, thin Nb3Sn films have been prepared by electron beam vapor deposition [1]. Fine-grain size material is desirable which may be achieved by codeposition with small amounts of Al2O3 . Figure 1 shows the STEM microstructure, with large (∽ 200 Å dia) voids present at the grain boundaries. Higher quality TEM micrographs (e.g. fig. 2) reveal the presence of small voids within the grains which are absent in pure Nb3Sn prepared under identical conditions. The X-ray spectrum from large (∽ lμ dia) or small (∽100 Ǻ dia) areas within the grains indicates only small amounts of A1 (fig.3).

Thickness and composition determinations from T.E.M. specimens using both x-ray and backscattered electron data

1984 ◽  
Vol 42 ◽  
pp. 576-577
Author(s):  
M.D. Ball ◽  
H. Lagace ◽  
M.C. Thornton
Keyword(s):  
Electron Microscope ◽  
Atomic Number ◽  
Transmission Electron Microscope ◽  
Convenient Method ◽  
Flow Chart ◽  
X Ray ◽  
Intensity Measurements ◽  
Transmission Electron ◽  
Electron Intensity ◽  
Backscattered Electron

The backscattered electron coefficient η for transmission electron microscope specimens depends on both the atomic number Z and the thickness t. Hence for specimens of known atomic number, the thickness can be determined from backscattered electron coefficient measurements. This work describes a simple and convenient method of estimating the thickness and the corrected composition of areas of uncertain atomic number by combining x-ray microanalysis and backscattered electron intensity measurements.The method is best described in terms of the flow chart shown In Figure 1. Having selected a feature of interest, x-ray microanalysis data is recorded and used to estimate the composition. At this stage thickness corrections for absorption and fluorescence are not performed.

High Spatial Resolution Compositional Analysis at Interfaces

1980 ◽  
Vol 38 ◽  
pp. 356-359
Author(s):  
John B. Vander Sande ◽  
Thomas F. Kelly ◽  
Douglas Imeson
Keyword(s):  
Electron Microscope ◽  
High Spatial Resolution ◽  
Compositional Analysis ◽  
Scanning Transmission Electron Microscope ◽  
Thin Specimen ◽  
X Ray ◽  
Volume Of Interest ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Electron Energy Loss

In the scanning transmission electron microscope (STEM) a fine probe of electrons is scanned across the thin specimen, or the probe is stationarily placed on a volume of interest, and various products of the electron-specimen interaction are then collected and used for image formation or microanalysis. The microanalysis modes usually employed in STEM include, but are not restricted to, energy dispersive X-ray analysis, electron energy loss spectroscopy, and microdiffraction.

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