Influence of Source/Drain Parasitic Resistance on Device Performance of Ultrathin Body III–V Channel Metal–Oxide–Semiconductor Field-Effect Transistors
2010 ◽
Vol 28
(1)
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pp. C1I12-C1I16
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1997 ◽
Vol 36
(Part 1, No. 7A)
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pp. 4225-4229
1998 ◽
Vol 145
(6)
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pp. 2131-2137
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2018 ◽
Vol 57
(6S1)
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pp. 06HD03
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Keyword(s):
2020 ◽
Vol 8
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pp. 9-14
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