Electrical Characterization of Al/SiNx:H/n and p-In0.53Ga0.47As Structures by Deep-Level Transient Spectroscopy and Conductance Transient Techniques
2001 ◽
Vol 40
(Part 1, No. 7)
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pp. 4479-4484
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2004 ◽
Vol 241
(12)
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pp. 2811-2815
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1999 ◽
Vol 28
(8)
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pp. L13-L16
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2018 ◽
Vol 924
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pp. 253-256
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2011 ◽
Vol 679-680
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pp. 253-256
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2004 ◽
Vol 43
(6B)
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pp. 3825-3827
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