Effect of Epitaxial Layer Crystal Quality on DC and RF Characteristics of AlGaN/GaN Short-Gate High-Electron-Mobility Transistors on Sapphire Substrates

2005 ◽  
Vol 44 (12) ◽  
pp. 8435-8440 ◽  
Author(s):  
Kenji Shiojima ◽  
Takashi Makimura ◽  
Tetsuya Suemitsu ◽  
Naoteru Shigekawa
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