Research on the Influence of Employee Responsibility on the Initiative Innovation Behavior of the New Generation of Employees

2021 ◽  
Author(s):  
Jiaojiao Yang ◽  
Zhihao Zhou
Keyword(s):  
New Generation ◽  
Employee Responsibility ◽  
Innovation Behavior

scholarly journals RESEARCH ON THE EVOLUTION OF INNOVATION BEHAVIOR OF NEW GENERATION ENTREPRENEURS IN DIFFERENT SCENARIOS

2020 ◽  
Vol 26 (5) ◽  
pp. 1098-1124
Author(s):  
Aiwu Zhao ◽  
Zhenzhen Sun ◽  
Hongjun Guan ◽  
Jingyuan Jia
Keyword(s):  
Negative Impact ◽  
Insurance Fund ◽  
Decision Making Process ◽  
Innovation Implementation ◽  
Continuous Innovation ◽  
Experiment Method ◽  
Different Types ◽  
Multi Agent ◽  
New Generation ◽  
Innovation Behavior

Innovation of new generation entrepreneurs is crucial to the development of a country. Empirical research method can analyze the history and current situation, but it is difficult to reflect the dynamic process and evolution trend under different scenarios. In this paper, we adopt computational experiment method to model the decision-making process of new generation entrepreneurs. Multi-agent evolution model is constructed to simulate individual behavior of different types of new generation entrepreneurs under different scenarios. By the comparison of different results, it analyses the evolutionary rules of innovation behaviors and explores guidance policies to promote entrepreneurs’ innovation behavior and achieve better innovation performance. The experimental results show that although internal elements such as individual’s innovative spirit, innovative ability and cognition of social capital determine the innovation intention, the capital, technology and talent conditions are also very important for innovation implementation. New generation entrepreneurs with different risk preferences should objectively evaluate and treat innovation risks according to their own characteristics. This helps to reduce the negative impact of innovation risk on continuous innovation. Meanwhile, government should pay attention to establishing risk guarantee mechanism such as innovation insurance fund to promote the innovation of new generation entrepreneurs.

scholarly journals Research on Innovation Behavior and Performance of New Generation Entrepreneur Based on Grounded Theory

2019 ◽  
Vol 11 (10) ◽  
pp. 2883 ◽  
Author(s):  
Hongjun Guan ◽  
Zhen Zhang ◽  
Aiwu Zhao ◽  
Jinyuan Jia ◽  
Shuang Guan
Keyword(s):  
Grounded Theory ◽  
Educational Background ◽  
Organization Performance ◽  
Innovative Behavior ◽  
Key Factors ◽  
Personal Traits ◽  
Open Coding ◽  
And Performance ◽  
New Generation ◽  
Innovation Behavior

In China, new generation entrepreneurs are gradually becoming the main force of intergenerational inheritance. New generation entrepreneurs have different educational background, growth experience and personality characteristics from the old generation entrepreneurs. They are endowed with the historical mission of an innovative generation. Therefore, it is of great significance to reveal the key factors influencing their innovative behavior and find out how to inspire their innovative behavior. Based on grounded theory and in-depth interviews, this study used NVivo 11 to deal with the recording materials. After a series of steps including open coding, spindle coding, selective coding and theoretical saturation test, it constructed a theoretical model of innovative behavior and innovative performance for new generation entrepreneurs. The purpose of this study was to improve the theory of entrepreneur innovation behavior and provide guidance for government to cultivate innovative spirit and innovative ability of new generation entrepreneurs. The research showed that: (1) New generation entrepreneurs’ personal traits and educational background affect their perceptions of innovation. (2) Risk awareness, understanding of innovation content and social capital would influence innovation behaviors. (3) Innovation behaviors further lead to changes in organization performance. Therefore, government should provide more opportunities for new generation entrepreneurs to widen their knowledge, social resources and innovation environment.

scholarly journals Intrinsic Motivation, Knowledge Sharing and Innovation Behavior of Knowledge-Based Employees in the Industrial New Generation

CONVERTER ◽  
2021 ◽  
pp. 75-87
Author(s):  
Xiaohua Yu, Xiulan Meng
Keyword(s):  
Intrinsic Motivation ◽  
Knowledge Sharing ◽  
Work Engagement ◽  
Mediating Effect ◽  
Self Determination ◽  
Mediating Role ◽  
Knowledge Based ◽  
New Generation ◽  
Innovation Behavior ◽  
Predictive Effect

By introducing knowledge sharing as an intermediary variable and using 375 questionnaires, this paper makes an empirical study on the intrinsic motivation, the main and mediating effects of knowledge sharing on individual innovation behavior. The results show that: (1) The intrinsic motivation has a positive predictive effect on individual innovation behavior, and the influence degree of each dimension on individual innovation behavior is beta interest > beta competency > beta curiosity > beta self-determination > beta work engagement. (2) The intrinsic motivation has a positive predictive effect on knowledge sharing. Besides self-determination, all dimensions of intrinsic motivation can actively promote knowledge sharing among employees, such as competency, work engagement, curiosity and interest. (3) Knowledge sharing has a partial mediating effect on the relationship between internal motivation and individual innovation behavior of knowledge-based employees in the industrial new generation. Knowledge sharing plays a mediating role in the influence of competency, work engagement, curiosity and interest on individual innovation behavior, but does not have a mediating effect on self-determination. The conclusions of this study can provide reference and suggestions for enterprises to effectively promote individual innovation of the industrial new generation of employees.

Finding the Right Problems: Some HREM Applications to Interfaces

1984 ◽  
Vol 42 ◽  
pp. 376-379
Author(s):  
D. Cherns
Keyword(s):  
Grain Boundaries ◽  
High Resolution Electron Microscopy ◽  
Boundary Structure ◽  
Atomic Structures ◽  
Grain Boundary Structure ◽  
Resolution Electron ◽  
Point To Point ◽  
The Right ◽  
New Generation ◽  
Better Than

The use of high resolution electron microscopy (HREM) to determine the atomic structure of grain boundaries and interfaces is a topic of great current interest. Grain boundary structure has been considered for many years as central to an understanding of the mechanical and transport properties of materials. Some more recent attention has focussed on the atomic structures of metalsemiconductor interfaces which are believed to control electrical properties of contacts. The atomic structures of interfaces in semiconductor or metal multilayers is an area of growing interest for understanding the unusual electrical or mechanical properties which these new materials possess. However, although the point-to-point resolutions of currently available HREMs, ∼2-3Å, appear sufficient to solve many of these problems, few atomic models of grain boundaries and interfaces have been derived. Moreover, with a new generation of 300-400kV instruments promising resolutions in the 1.6-2.0 Å range, and resolutions better than 1.5Å expected from specialist instruments, it is an appropriate time to consider the usefulness of HREM for interface studies.

Total etch dentin bonding systems: scanning electron microscopy of the resin-dentin hybrid layer

1992 ◽  
Vol 50 (2) ◽  
pp. 1092-1093
Author(s):  
Jorge Perdigao
Keyword(s):  
Composite Resin ◽  
Mechanical Interlocking ◽  
Hybrid Layer ◽  
Agent Based ◽  
Dentin Bonding ◽  
Acid Agent ◽  
Bond Strengths ◽  
Main Component ◽  
Bonding Systems ◽  
New Generation

In 1955, Buonocore introduced the etching of enamel with phosphoric acid. Bonding to enamel was created by mechanical interlocking of resin tags with enamel prisms. Enamel is an inert tissue whose main component is hydroxyapatite (98% by weight). Conversely, dentin is a wet living tissue crossed by tubules containing cellular extensions of the dental pulp. Dentin consists of 18% of organic material, primarily collagen. Several generations of dentin bonding systems (DBS) have been studied in the last 20 years. The dentin bond strengths associated with these DBS have been constantly lower than the enamel bond strengths. Recently, a new generation of DBS has been described. They are applied in three steps: an acid agent on enamel and dentin (total etch technique), two mixed primers and a bonding agent based on a methacrylate resin. They are supposed to bond composite resin to wet dentin through dentin organic component, forming a peculiar blended structure that is part tooth and part resin: the hybrid layer.

Low-voltage, high-resolution scanning electron microscopy of polymers

1987 ◽  
Vol 45 ◽  
pp. 466-467 ◽  
Author(s):  
S. J. Krause ◽  
W.W. Adams ◽  
S. Kumar ◽  
T. Reilly ◽  
T. Suziki
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Low Voltage ◽  
Chromatic Aberration ◽  
Image Resolution ◽  
Resolution Limit ◽  
Crossover Point ◽  
New Generation ◽  
Beam Damage ◽  
Scanning Electron

Scanning electron microscopy (SEM) of polymers at routine operating voltages of 15 to 25 keV can lead to beam damage and sample image distortion due to charging. Imaging polymer samples with low accelerating voltages (0.1 to 2.0 keV), at or near the “crossover point”, can reduce beam damage, eliminate charging, and improve contrast of surface detail. However, at low voltage, beam brightness is reduced and image resolution is degraded due to chromatic aberration. A new generation of instruments has improved brightness at low voltages, but a typical SEM with a tungsten hairpin filament will have a resolution limit of about 100nm at 1keV. Recently, a new field emission gun (FEG) SEM, the Hitachi S900, was introduced with a reported resolution of 0.8nm at 30keV and 5nm at 1keV. In this research we are reporting the results of imaging coated and uncoated polymer samples at accelerating voltages between 1keV and 30keV in a tungsten hairpin SEM and in the Hitachi S900 FEG SEM.

3-Dimensional immunolabeling and in situ hybridization detection using fluorescence photooxidation and intermediate-voltage Electron Microscopy

1994 ◽  
Vol 52 ◽  
pp. 164-165
Author(s):  
Thomas J. Deerinck ◽  
Maryann E. Martone ◽  
Varda Lev-Ram ◽  
David P. L. Green ◽  
Roger Y. Tsien ◽  
...  
Keyword(s):  
Laser Scanning ◽  
Reactive Oxygen ◽  
Confocal Laser Scanning Microscope ◽  
Fluorescent Dye ◽  
Confocal Laser ◽  
3 Dimensional ◽  
Voltage Electron ◽  
Dimensional Distribution ◽  
Electron Microscopes ◽  
New Generation

The confocal laser scanning microscope has become a powerful tool in the study of the 3-dimensional distribution of proteins and specific nucleic acid sequences in cells and tissues. This is also proving to be true for a new generation of high contrast intermediate voltage electron microscopes (IVEM). Until recently, the number of labeling techniques that could be employed to allow examination of the same sample with both confocal and IVEM was rather limited. One method that can be used to take full advantage of these two technologies is fluorescence photooxidation. Specimens are labeled by a fluorescent dye and viewed with confocal microscopy followed by fluorescence photooxidation of diaminobenzidine (DAB). In this technique, a fluorescent dye is used to photooxidize DAB into an osmiophilic reaction product that can be subsequently visualized with the electron microscope. The precise reaction mechanism by which the photooxidation occurs is not known but evidence suggests that the radiationless transfer of energy from the excited-state dye molecule undergoing the phenomenon of intersystem crossing leads to the formation of reactive oxygen species such as singlet oxygen. It is this reactive oxygen that is likely crucial in the photooxidation of DAB.

Recent developments in low-voltage SEM of polymers

1993 ◽  
Vol 51 ◽  
pp. 866-867
Author(s):  
S.J. Krause ◽  
W.W. Adams
Keyword(s):  
Low Voltage ◽  
Chromatic Aberration ◽  
Thermal Electron ◽  
Analytical Technique ◽  
Recent Developments ◽  
Beam Currents ◽  
New Generation ◽  
First Time ◽  
Voltage Scanning ◽  
Beam Damage

Over the past decade low voltage scanning electron microscopy (LVSEM) of polymers has evolved from an interesting curiosity to a powerful analytical technique. This development has been driven by improved instrumentation and in particular, reliable field emission gun (FEG) SEMs. The usefulness of LVSEM has also grown because of an improved theoretical and experimental understanding of sample-beam interactions and by advances in sample preparation and operating techniques. This paper will review progress in polymer LVSEM and present recent results and developments in the field.In the early 1980s a new generation of SEMs produced beam currents that were sufficient to allow imaging at low voltages from 5keV to 0.5 keV. Thus, for the first time, it became possible to routinely image uncoated polymers at voltages below their negative charging threshold, the "second crossover", E2 (Fig. 1). LVSEM also improved contrast and reduced beam damage in sputter metal coated polymers. Unfortunately, resolution was limited to a few tenths of a micron due to the low brightness and chromatic aberration of thermal electron emission sources.

The Contribution of Intermediate-Voltage, High-Resolution Electron Microscopy In Materials Science: An Appraisal

1990 ◽  
Vol 48 (1) ◽  
pp. 478-479
Author(s):  
John L. Hutchison
Keyword(s):  
High Resolution ◽  
Materials Science ◽  
High Resolution Electron Microscopy ◽  
Optical Diffraction ◽  
The Past ◽  
Resolution Electron ◽  
Extreme Sensitivity ◽  
Electron Microscopes ◽  
New Generation ◽  
Small Metal Particles

Over the past five years or so the development of a new generation of high resolution electron microscopes operating routinely in the 300-400 kilovolt range has produced a dramatic increase in resolution, to around 1.6 Å for “structure resolution” and approaching 1.2 Å for information limits. With a large number of such instruments now in operation it is timely to assess their impact in the various areas of materials science where they are now being used. Are they falling short of the early expectations? Generally, the manufacturers’ claims regarding resolution are being met, but one unexpected factor which has emerged is the extreme sensitivity of these instruments to both floor-borne and acoustic vibrations. Successful measures to counteract these disturbances may require the use of special anti-vibration blocks, or even simple oil-filled dampers together with springs, with heavy curtaining around the microscope room to reduce noise levels. In assessing performance levels, optical diffraction analysis is becoming the accepted method, with rotational averaging useful for obtaining a good measure of information limits. It is worth noting here that microscope alignment becomes very critical for the highest resolution.In attempting an appraisal of the contributions of intermediate voltage HREMs to materials science we will outline a few of the areas where they are most widely used. These include semiconductors, oxides, and small metal particles, in addition to metals and minerals.

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