The special training needs of the first-time microcomputer user

1987 ◽  
Author(s):  
Lisa Hines
Keyword(s):  
Training Needs ◽  
Special Training ◽  
First Time

scholarly journals Development of Training Needs Analysis in Organization

2017 ◽  
Vol 9 (4) ◽  
pp. 140
Author(s):  
Rachmat Hartoyo ◽  
Hady Efendy
Keyword(s):  
Human Resource Development ◽  
Descriptive Analysis ◽  
Training Needs ◽  
Training System ◽  
Continuous Training ◽  
Analysis Technique ◽  
Training Professionals ◽  
The Right ◽  
Training Need ◽  
First Time

Competition encourages the organization to always improve its performance, so as to achieve competitive advantage. One of the steps taken is to conduct extensive and continuous training and employee development. A training need assessment is a strategic step to find out the right training program for the organization and employees. In addition, to produce effective training, training professionals need to emphasize doing the right things the first time. The type of data used in this study is qualitative, and the source of data in this study is the source of literature. Data analysis technique used in this research is descriptive analysis technique to describe and describe object to be studied. The purpose of this descriptive is to make the description, description or painting systematically, factually and accurately about the facts, properties and relationships between the phenomena investigated. The study consists of evaluating the components of the training system and planning of training needs based on competence. The evaluation is aimed to find out the training system and human resource development within an organization that includes the components of the training system.

scholarly journals Court Interpreter Training in the Language Laboratory

2019 ◽  
Vol 18 (2) ◽  
pp. 6-20
Author(s):  
Wayne H. Stromberg ◽  
Gerald L. Head
Keyword(s):  
Training Program ◽  
Skills Training ◽  
Training Needs ◽  
Federal Courts ◽  
English Court ◽  
Language Laboratory ◽  
Training Techniques ◽  
Special Training ◽  
Survey Results ◽  
Interpreter Training

Demographic studies and statistics from state and federal courts indicate agrowing need for Spanish-English court interpreters with special training in consecutiveand simultaneous court interpretation. The authors conducted a survey of 466 ofCalifornia's Spanish-English court interpreters to determine what the Spanish-Englishcourt interpreter's strongest skills needs are. Survey results are reported in this article,and the five strongest skills training needs are identified. The authors indicate how thelanguage laboratory may efficiently be used to develop and enhance these five skillsand how it may best serve a court interpreter training program. Emphasis is onapplying the work of G.A. Miller and the training techniques of Robert Ingram toSpanish-English court interpreter training.

scholarly journals TRAINING NEEDS IN THE FIELD OF AUTISM BY CONTEMPORARY POLISH TEACHERS IN THE CONTEXT OF INTERNATIONAL ASD-EAST PROJECT

2019 ◽  
Vol 1 (9) ◽  
pp. 82
Author(s):  
Joanna Monika Kossewska ◽  
David Preece Preece ◽  
Natalija Lisak ◽  
Anna Bombińska-Domżał ◽  
Tamara Cierpiałowska ◽  
...  
Keyword(s):  
Qualitative Methods ◽  
Training Needs ◽  
International Survey ◽  
Educational Approach ◽  
School Settings ◽  
Special Training ◽  
Treatment Research ◽  
Quantitative And Qualitative Methods

<p class="Abstract">The paper presents results of the part of international survey on teachers’ opinion on autism characteristics and specific educational approach and treatment. Research was undertaken in Poland under the auspicies of ASD-EAST project using quantitative and qualitative methods. The results showed the significant differences in teachers’ perception on autism regarding to the school settings they worked in. The strong need for special training in the field of ASD was also expressed by teachers.</p>

scholarly journals Young workers: Their special training needs

1963 ◽  
Author(s):  
Lloyd Feldman ◽  
Michael R. Peevey
Keyword(s):  
Training Needs ◽  
Young Workers ◽  
Special Training

Annulate lamellae in the Sertoli cells of guinea pig testis after unilateral torsion of the spermatic cord

1984 ◽  
Vol 42 ◽  
pp. 196-197
Author(s):  
J. Chakraborty ◽  
A. P. Sinha Hikim ◽  
J. S. Jhunjhunwala
Keyword(s):  
Sertoli Cells ◽  
Guinea Pigs ◽  
Spermatic Cord ◽  
Present Report ◽  
Cell Types ◽  
Annulate Lamellae ◽  
Spermatogenic Cells ◽  
Electron Microscopic ◽  
Structural Details ◽  
First Time

Although the presence of annulate lamellae was noted in many cell types, including the rat spermatogenic cells, this structure was never reported in the Sertoli cells of any rodent species. The present report is based on a part of our project on the effect of torsion of the spermatic cord to the contralateral testis. This paper describes for the first time, the fine structural details of the annulate lamellae in the Sertoli cells of damaged testis from guinea pigs.One side of the spermatic cord of each of six Hartly strain adult guinea pigs was surgically twisted (540°) under pentobarbital anesthesia (1). Four months after induction of torsion, animals were sacrificed, testes were excised and processed for the light and electron microscopic investigations. In the damaged testis, the majority of seminiferous tubule contained a layer of Sertoli cells with occasional spermatogonia (Fig. 1). Nuclei of these Sertoli cells were highly pleomorphic and contained small chromatinic clumps adjacent to the inner aspect of the nuclear envelope (Fig. 2).

Electron spectroscopic imaging and diffraction

1991 ◽  
Vol 49 ◽  
pp. 706-707
Author(s):  
M. Rühle ◽  
J. Mayer ◽  
J.C.H. Spence ◽  
J. Bihr ◽  
W. Probst ◽  
...  
Keyword(s):  
Materials Science ◽  
Electron Spectroscopic Imaging ◽  
Magnetic Filter ◽  
Magnetic Imaging ◽  
Illumination System ◽  
Probe Size ◽  
Diffraction Patterns ◽  
Fritz Haber ◽  
Koehler Illumination ◽  
First Time

A new Zeiss TEM with an imaging Omega filter is a fully digitized, side-entry, 120 kV TEM/STEM instrument for materials science. The machine possesses an Omega magnetic imaging energy filter (see Fig. 1) placed between the third and fourth projector lens. Lanio designed the filter and a prototype was built at the Fritz-Haber-Institut in Berlin, Germany. The imaging magnetic filter allows energy-filtered images or diffraction patterns to be recorded without scanning using efficient area detection. The energy dispersion at the exit slit (Fig. 1) results in ∼ 1.5 μm/eV which allows imaging with energy windows of ≤ 10 eV. The smallest probe size of the microscope is 1.6 nm and the Koehler illumination system is used for the first time in a TEM. Serial recording of EELS spectra with a resolution < 1 eV is possible. The digital control allows X,Y,Z coordinates and tilt settings to be stored and later recalled.

A Novel TEM Technique for Characterizing As-Grown CVD Diamond Films

1991 ◽  
Vol 49 ◽  
pp. 956-957 ◽  
Author(s):  
Z.L. Wang ◽  
J. Bentley ◽  
R.E. Clausing ◽  
L. Heatherly ◽  
L.L. Horton
Keyword(s):  
Diamond Films ◽  
Chemical Vapor ◽  
Growth Direction ◽  
Dark Field ◽  
Growth Surface ◽  
Specimen Preparation ◽  
Transmission Electron ◽  
Diffraction Patterns ◽  
First Time ◽  
Microstructural Studies

Microstructural studies by transmission electron microscopy (TEM) of diamond films grown by chemical vapor deposition (CVD) usually involve tedious specimen preparation. This process has been avoided with a technique that is described in this paper. For the first time, thick as-grown diamond films have been examined directly in a conventional TEM without thinning. With this technique, the important microstructures near the growth surface have been characterized. An as-grown diamond film was fractured on a plane containing the growth direction. It took about 5 min to prepare a sample. For TEM examination, the film was tilted about 30-45° (see Fig. 1). Microstructures of the diamond grains on the top edge of the growth face can be characterized directly by transmitted electron bright-field (BF) and dark-field (DF) images and diffraction patterns.

A microscopic marker experiment study on high temperature oxidation of Ni-Al alloy

1986 ◽  
Vol 44 ◽  
pp. 514-515
Author(s):  
Shou-kong Fan
Keyword(s):  
Transport Mechanism ◽  
High Temperature Oxidation ◽  
Transverse Section ◽  
Al Alloy ◽  
Metal Interface ◽  
Electron Microscopic ◽  
Temperature Oxidation ◽  
Analytical Electron ◽  
Microscopic Studies ◽  
First Time

Transmission and analytical electron microscopic studies of scale microstructures and microscopic marker experiments have been carried out in order to determine the transport mechanism in the oxidation of Ni-Al alloy. According to the classical theory, the oxidation of nickel takes place by transport of Ni cations across the scale forming new oxide at the scale/gas interface. Any markers deposited on the Ni surface are expected to remain at the scale/metal interface after oxidation. This investigation using TEM transverse section techniques and deposited microscopic markers shows a different result,which indicates that a considerable amount of oxygen was transported inward. This is the first time that such fine-scale markers have been coupled with high resolution characterization instruments such as TEM/STEM to provide detailed information about evolution of oxide scale microstructure.

Direct imaging of charge transfer

1996 ◽  
Vol 54 ◽  
pp. 680-681
Author(s):  
Yimei Zhu ◽  
J. Tafto
Keyword(s):  
Charge Transfer ◽  
Electron Diffraction ◽  
Scattering Amplitude ◽  
High Temperature Superconductors ◽  
Charge Carriers ◽  
Image Charge ◽  
Net Charge ◽  
Long Time ◽  
Electron Holes ◽  
First Time

The electron holes confined to the CuO2-plane are the charge carriers in high-temperature superconductors, and thus, the distribution of charge plays a key role in determining their superconducting properties. While it has been known for a long time that in principle, electron diffraction at low angles is very sensitive to charge transfer, we, for the first time, show that under a proper TEM imaging condition, it is possible to directly image charge in crystals with a large unit cell. We apply this new way of studying charge distribution to the technologically important Bi2Sr2Ca1Cu2O8+δ superconductors.Charged particles interact with the electrostatic potential, and thus, for small scattering angles, the incident particle sees a nuclei that is screened by the electron cloud. Hence, the scattering amplitude mainly is determined by the net charge of the ion. Comparing with the high Z neutral Bi atom, we note that the scattering amplitude of the hole or an electron is larger at small scattering angles. This is in stark contrast to the displacements which contribute negligibly to the electron diffraction pattern at small angles because of the short g-vectors.

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