Nanoscale Investigation of Localized Corrosion on Metal Surfaces by In Situ Electrochemical Scanning Probe Microscopy

2010 ◽  
Keyword(s):  
Scanning Probe Microscopy ◽  
Metal Surfaces ◽  
Scanning Probe ◽  
Localized Corrosion ◽  
Probe Microscopy

Direct Observation of Corrosive Wear by In Situ Scanning Probe Microscopy

2020 ◽  
Vol 12 (20) ◽  
pp. 23543-23553
Author(s):  
J. Michael Shockley ◽  
Christopher R. So ◽  
Matthew J. Strom ◽  
Raymond C.Y. Auyeung ◽  
Derek J. Horton ◽  
...  
Keyword(s):  
Direct Observation ◽  
Scanning Probe Microscopy ◽  
Corrosive Wear ◽  
Scanning Probe ◽  
Probe Microscopy

Developments in Using Scanning Probe Microscopy To Study Molecules on Surfaces — From Thin Films and Single-Molecule Conductivity to Drug–Living Cell Interactions

2006 ◽  
Vol 59 (6) ◽  
pp. 359 ◽  
Author(s):  
Pall Thordarson ◽  
Rob Atkin ◽  
Wouter H. J. Kalle ◽  
Gregory G. Warr ◽  
Filip Braet
Keyword(s):  
Single Molecule ◽  
Scanning Probe Microscopy ◽  
Cell Interactions ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Tunnelling Microscopy ◽  
Molecule Surface

Scanning probe microscopy (SPM) techniques, including atomic force microscopy (AFM) and scanning tunnelling microscopy (STM), have revolutionized our understanding of molecule–surface interactions. The high resolution and versatility of SPM techniques have helped elucidate the morphology of adsorbed surfactant layers, facilitated the study of electronically conductive single molecules and biomolecules connected to metal substrates, and allowed direct observation of real-time processes such as in situ DNA hybridization and drug–cell interactions. These examples illustrate the power that SPM possesses to study (bio)molecules on surfaces and will be discussed in depth in this review.

In situ surface reduction of a NiO-YSZ-alumina composite using scanning probe microscopy

2014 ◽  
Vol 18 (7) ◽  
pp. 1869-1878 ◽  
Author(s):  
Karin Vels Hansen ◽  
Torben Jacobsen ◽  
Karl Thyden ◽  
Yuehua Wu ◽  
Mogens B. Mogensen
Keyword(s):  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Surface Reduction ◽  
Alumina Composite

A versatile instrument for in situ combination of scanning probe microscopy and time-of-flight mass spectrometry

2005 ◽  
Vol 76 (10) ◽  
pp. 103701 ◽  
Author(s):  
A. Wetzel ◽  
A. Socoliuc ◽  
E. Meyer ◽  
R. Bennewitz ◽  
E. Gnecco ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Scanning Probe Microscopy ◽  
Time Of Flight ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Flight Mass Spectrometry
Sign in / Sign up

Export Citation Format

Share Document