scholarly journals Reduced Precision Redundancy for Satellite Telecommand Receiver Module on FPGA

2013 ◽  
Vol 2013 ◽  
pp. 1-8
Author(s):  
Salman Sadruddin ◽  
Arshad Aziz
Keyword(s):  
Hybrid Approach ◽  
Timing Recovery ◽  
Radiation Environment ◽  
Single Event ◽  
Efficient Design ◽  
Recovery Algorithm ◽  
Single Event Upsets ◽  
Costas Loop ◽  
Modular Redundancy ◽  
Radiation Tolerant

A novel and highly efficient design of a software defined radiation tolerant baseband module for a LEO satellite telecommand receiver using FPGA is presented. FPGAs in space are subject to single event upsets (SEUs) due to high radiation environment. Traditionally, triple modular redundancy (TMR) is used for mitigating Single Event Upsets (SEUs). The drawback of using TMR is that it consumes a lot of hardware resources and requires more power. Reduced precision redundancy (RPR) can be a viable alternative of TMR in digital systems for arithmetic operations. This paper uses the combination of RPR and TMR for mitigating SEUs. The designed module consumes less resources on FPGA and has bit error rate (BER) identical to theoretical results, apart from degradation due to implementation losses. An improved Costas loop and timing recovery algorithm are implemented for achieving carrier recovery and bit synchronization. The hybrid approach mitigates SEUs while consuming 26% less resources than a customary TMR protected receiver.

scholarly journals Study of single event upsets (SEUS) a survey and analysis

2021 ◽  
Author(s):  
Sheldon Mark Foulds
Keyword(s):  
Error Control ◽  
Hamming Code ◽  
Single Event ◽  
Electronic Circuits ◽  
Error Control Coding ◽  
Computing Systems ◽  
Single Event Upsets ◽  
Triple Modular Redundancy ◽  
Radiation Induced ◽  
Modular Redundancy

Over the last few years evolution in electronics technology has led to the shrinkage of electronic circuits. While this has led to the emergence of more powerful computing systems it has also caused a dramatic increase in the occurrence of soft errors and a steady climb in failure in time (FIT) rates. This problem is most prevalent in FPGA based systems which are highly susceptible to radiation induced errors. Depending upon the severity of the problem a number of methods exist to counter these effects including Triple Modular Redundancy (TMR), Error Control Coding (ECC), scrubbing systems etc. The following project presents a simulation of an FPGA based system that employs one of the popular error control code techniques called the Hamming Code. A resulting analysis shows that Hamming Code is able to mitigate the effects of single event upsets (SEUs) but suffers due to a number of limitations.

New Approach to Salve Single Event Upsets Faults in Satellite Communications

2011 ◽  
Vol 110-116 ◽  
pp. 4161-4165
Author(s):  
Mahoomd Ghodratian ◽  
Ashkan Masoomi ◽  
Roozbeh Hamzehyan ◽  
Najmeh Cheraghi Shirazi
Keyword(s):  
Detailed Analysis ◽  
Error Correcting Code ◽  
Satellite Communications ◽  
Radiation Environment ◽  
Single Event ◽  
Imaging Data ◽  
Single Event Upsets ◽  
Ground Station ◽  
Hamming Error Correcting Code ◽  
The Impact

The encrypted satellite data can get corrupted before reaching the ground station due to various faults. One major source of faults is the harsh radiation environment. Single Even Upset (SEU) faults can occur on-board during encryption due to radiation. This paper presents a novel model to detect and correct Single Event Upsets in on-board implementations of the AES algorithm, which is based on Hamming error correcting code. From five modes of AES, CRT mode seems to be the best mode to encrypt satellite video and image links. A detailed analysis of the effect of SEUs on the imaging data during on-board encryption using the modes of AES is carried out. In this paper the impact of these faults on the data is discussed and compared for all the five modes of AES. A detailed analysis of the effect of SEUs on the imaging data during on-board encryption using the modes of AES is carried out.

An SEU Hardened FIR Filter Based on Triple Modular Redundancy

2011 ◽  
Vol 219-220 ◽  
pp. 265-270
Author(s):  
Wen Hui Yang ◽  
Jing Wang ◽  
Lian Fen Huang
Keyword(s):  
Impulse Response ◽  
Finite Impulse Response ◽  
Radiation Environment ◽  
Fir Filters ◽  
Single Event Upset ◽  
Single Event ◽  
Triple Modular Redundancy ◽  
Traditional Technique ◽  
Modular Redundancy ◽  
Space Radiation Environment

The finite impulse response (FIR) filters in the space radiation environment probably face the single event upset (SEU), making unexpected results. To avoid that situation, the traditional triple module redundancy (TMR) technology is usually applied. At the same time, however, it brings high cost of area and power. For this reason, an improved TMR (ITMR) structure for FIR filters is proposed in this paper. Simulation shows that the design can achieve the same performance with much less resources. Based on traditional technique TMR, the design reports an improved TMR (ITMR) structure by simplify the two redundancy modules, the advantage that it has the same performance but costs less resources can be reflect by the simulation and synthesis clearly.

scholarly journals Study of single event upsets (SEUS) a survey and analysis

2021 ◽  
Author(s):  
Sheldon Mark Foulds
Keyword(s):  
Error Control ◽  
Hamming Code ◽  
Single Event ◽  
Electronic Circuits ◽  
Error Control Coding ◽  
Computing Systems ◽  
Single Event Upsets ◽  
Triple Modular Redundancy ◽  
Radiation Induced ◽  
Modular Redundancy

Over the last few years evolution in electronics technology has led to the shrinkage of electronic circuits. While this has led to the emergence of more powerful computing systems it has also caused a dramatic increase in the occurrence of soft errors and a steady climb in failure in time (FIT) rates. This problem is most prevalent in FPGA based systems which are highly susceptible to radiation induced errors. Depending upon the severity of the problem a number of methods exist to counter these effects including Triple Modular Redundancy (TMR), Error Control Coding (ECC), scrubbing systems etc. The following project presents a simulation of an FPGA based system that employs one of the popular error control code techniques called the Hamming Code. A resulting analysis shows that Hamming Code is able to mitigate the effects of single event upsets (SEUs) but suffers due to a number of limitations.

scholarly journals Heavy-Ion Induced Single Event Upsets in Advanced 65 nm Radiation Hardened FPGAs

Electronics ◽  
2019 ◽  
Vol 8 (3) ◽  
pp. 323 ◽  
Author(s):  
Chang Cai ◽  
Xue Fan ◽  
Jie Liu ◽  
Dongqing Li ◽  
Tianqi Liu ◽  
...  
Keyword(s):  
Ion Irradiation ◽  
Random Access ◽  
Heavy Ion ◽  
Radiation Environment ◽  
Single Event Upsets ◽  
Irradiation Test ◽  
Field Programmable ◽  
Radiation Hardened ◽  
Modular Redundancy ◽  
High Linear Energy Transfer

The 65 nm Static Random Access Memory (SRAM) based Field Programmable Gate Array (FPGA) was designed and manufactured, which employed tradeoff radiation hardening techniques in Configuration RAMs (CRAMs), Embedded RAMs (EBRAMs) and flip-flops. This radiation hardened circuits include large-spacing interlock CRAM cells, area saving debugging logics, the redundant flip-flops cells, and error mitigated 6-T EBRAMs. Heavy ion irradiation test result indicates that the hardened CRAMs had a high linear energy transfer threshold of upset ∼18 MeV/(mg/cm 2 ) with an extremely low saturation cross-section of 6.5 × 10 − 13 cm 2 /bit, and 71% of the upsets were single-bit upsets. The combinational use of triple modular redundancy and check code could decline ∼86.5% upset errors. Creme tools were used to predict the CRAM upset rate, which was merely 8.46 × 10 − 15 /bit/day for the worst radiation environment. The effectiveness of radiation tolerance has been verified by the irradiation and prediction results.

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