scholarly journals Corrosion and Leaching Behaviours of Sn-0.7Cu-0.05Ni Lead-Free Solder in 3.5 wt.% NaCl Solution

2018 ◽  
Vol 2018 ◽  
pp. 1-11 ◽  
Author(s):  
Jan-Ervin C. Guerrero ◽  
Drexel H. Camacho ◽  
Omid Mokhtari ◽  
Hiroshi Nishikawa
Keyword(s):  
Corrosion Rate ◽  
Solder Joint ◽  
Potentiodynamic Polarization ◽  
Galvanic Corrosion ◽  
Lead Free ◽  
Lead Free Solder ◽  
Nacl Solution ◽  
Passivation Film ◽  
Leaching Behaviour ◽  
Free Solder

The corrosion and leaching behaviour of a new ternary Sn-0.7Cu-0.05Ni alloy in 3.5 wt.% NaCl solution is reported herein. Potentiodynamic polarization measurements show that Sn-0.7Cu-0.05Ni has the highest corrosion rate. Results of the 30-day Sn leaching measurement show that Sn-Cu-Ni joint has slight decrease attributed to the formation of thin passivation film after 15 days. The leaching amounts of Sn are observed to be higher in solder joint than in solder alloy due to the galvanic corrosion happening on the surface. EDS and XRD results of the corroded surface confirm that the corroded product is made up of oxides of tin.

Impact reliability estimation of lead free solder joint with IMC layer

2009 ◽  
Vol 517 (14) ◽  
pp. 4255-4259 ◽  
Author(s):  
Jong-Min Kim ◽  
Seung-Wan Woo ◽  
Yoon-Suk Chang ◽  
Young-Jin Kim ◽  
Jae-Boong Choi ◽  
...  
Keyword(s):  
Solder Joint ◽  
Reliability Estimation ◽  
Lead Free ◽  
Lead Free Solder ◽  
Free Solder ◽  
Impact Reliability

Root Cause Investigation of Lead-Free Solder Joint Interfacial Failures After Multiple Reflows

2016 ◽  
Vol 46 (3) ◽  
pp. 1674-1682 ◽  
Author(s):  
Yan Li ◽  
Olen Hatch ◽  
Pilin Liu ◽  
Deepak Goyal
Keyword(s):  
Solder Joint ◽  
Lead Free ◽  
Lead Free Solder ◽  
Root Cause ◽  
Free Solder

Study on High Reliability of Lead-Free Solder Joint on Metal Substrate

2011 ◽  
Author(s):  
Kanji Takagi ◽  
Masaki Wakabayashi ◽  
Junichi Inoue ◽  
Qiang Yu ◽  
Takahiro Akutsu
Keyword(s):  
Thermal Conductivity ◽  
Solder Joint ◽  
Rupture Life ◽  
Metal Substrate ◽  
Lead Free ◽  
Lead Free Solder ◽  
Insulating Layer ◽  
Heating Device ◽  
Propagation Analysis ◽  
Free Solder

This paper proposes the high reliable design method for lead-free solder joint on metal substrate on chip component. First, the crack propagation analysis method for estimating rupture life of solder joint was constructed. And then, the effect of material properties of insulating layer on metal substrate and solder joint shape for rupture life of solder joint was evaluated using crack propagation analysis. As the result, the relation between young’s modulus of insulating layer and rupture life was indicated quantitatively. Also, the relation of filet length for rupture life of solder joint was evaluated. Secondary, evaluation method of heat dissipation for metal substrate was proposed. Because thermal conductivity of insulating layer affects temperature rise of heating device. And, the relation between thermal conductivity of insulating layer and temperature rise of heating device was indicated.

Vibration Fatigue Reliability of Lead and Lead-Free Solder Joint by FORM/SORM

2007 ◽  
Vol 345-346 ◽  
pp. 1393-1396
Author(s):  
Ouk Sub Lee ◽  
Man Jae Hur ◽  
Yeon Chang Park ◽  
Dong Hyeok Kim
Keyword(s):  
Solder Joint ◽  
Failure Probability ◽  
Lead Free ◽  
Lead Free Solder ◽  
Fatigue Reliability ◽  
Probability Models ◽  
First Order ◽  
Reliability Method ◽  
Vibration Fatigue ◽  
Free Solder

It is well-known that the vibration significantly affect the life of solder joint. In this paper, the effects of the vibration on the failure probability of the solder joint are studied by using the failure probability models such as the First Order Reliability Method (FORM) and the Second Order Reliability Method (SORM). The accuracies of the results are estimated by a help of the Monte Carlo Simulation (MCS). The reliability of the lead and the lead-free solder joint was also evaluated. The reliability of lead-free solder joint is found to be higher than that of lead solder joint.

Solder Joint Reliability of Sn-Cu and Sn-Ag-Cu Lead-Free Solder Alloys Solidified on Copper Substrates with Different Surface Roughnesses

2015 ◽  
Vol 830-831 ◽  
pp. 265-269
Author(s):  
Satyanarayan ◽  
K.N. Prabhu
Keyword(s):  
Solder Joint ◽  
Solder Matrix ◽  
Lead Free ◽  
Lead Free Solder ◽  
Solder Alloys ◽  
Cu Substrate ◽  
Cu Substrates ◽  
Free Solder ◽  
Substrate Surfaces ◽  
Lead Free Solders

In the present work, the bond strength of Sn-0.7Cu, Sn-0.3Ag-0.7Cu, Sn-2.5Ag-0.5Cu and Sn-3Ag-0.5Cu lead free solders solidified on Cu substrates was experimentally determined. The bond shear test was used to assess the integrity of Sn–Cu and Sn–Ag–Cu lead-free solder alloy drops solidified on smooth and rough Cu substrate surfaces. The increase in the surface roughness of Cu substrates improved the wettability of solders. The wettability was not affected by the Ag content of solders. Solder bonds on smooth surfaces yielded higher shear strength compared to rough surfaces. Fractured surfaces revealed the occurrence of ductile mode of failure on smooth Cu surfaces and a transition ridge on rough Cu surfaces. Though rough Cu substrate improved the wettability of solder alloys, solder bonds were sheared at a lower force leading to decreased shear energy density compared to the smooth Cu surface. A smooth surface finish and the presence of minor amounts of Ag in the alloy improved the integrity of the solder joint. Smoother surface is preferable as it favors failure in the solder matrix.

Loading Mixity on the Interfacial Failure Mode in Lead-Free Solder Joint

2011 ◽  
pp. 121-121-18
Author(s):  
Feng Gao ◽  
Jianping Jing ◽  
Frank Z. Liang ◽  
Richard L. Williams ◽  
Jianmin Qu
Keyword(s):  
Solder Joint ◽  
Failure Mode ◽  
Lead Free ◽  
Lead Free Solder ◽  
Interfacial Failure ◽  
Free Solder

The Effects of Electromigration to the Solder Joint Formation: A Comparison Between 99.3Sn-0.7Cu and 96.5Sn-3.0Ag-0.5Cu Lead Free Solder

2012 ◽  
Vol 622-623 ◽  
pp. 195-199 ◽  
Author(s):  
M.A.A. Mohd Salleh ◽  
A.R. Nik Nurhidayatul Suhada ◽  
Flora Somidin ◽  
Rafezi Ahmad Khairel ◽  
C.S. Lee ◽  
...  
Keyword(s):  
Solder Joint ◽  
Room Temperature ◽  
Solder Joints ◽  
Research Work ◽  
Cathode Region ◽  
Lead Free ◽  
Lead Free Solder ◽  
Joint Formation ◽  
Current Stress ◽  
Free Solder

Electromigration effects on the solder joint formation of 99.3Sn-0.7Cu and 96.5Sn-3.0Ag-0.5Cu lead-free solder with Cu electroplated Ni layer wire were investigated. The electromigration effects on the solder joints were studied after current density stressing at 1 x 103 A/cm2 in room temperature for 0 h, 120 h, and 240 h. The research work found that intermetallic compound (IMC) formation on the joint is increases for both solders with longer period of current stress applied. Higher IMC thickness growth in 99.3Sn-0.7Cu solder joint compared to 99.3Sn-0.7Cu is detected and both anode regions of the solder joints show higher IMC thickness growth compared to cathode region. Experimental results show 99.3Sn-0.7Cu solder joint is more prone to failure under current stress compared to 96.5Sn-3.0Ag-0.5Cu solder joint with thicker IMC which translates to higher brittleness.

scholarly journals Influence of an Immersion Gold Plating Layer on Reliability of a Lead-Free Solder Joint

2005 ◽  
Vol 46 (12) ◽  
pp. 2725-2729 ◽  
Author(s):  
Ikuo Shohji ◽  
Hiroki Goto ◽  
Kiyotomo Nakamura ◽  
Toshikazu Ookubo
Keyword(s):  
Solder Joint ◽  
Lead Free ◽  
Lead Free Solder ◽  
Gold Plating ◽  
Free Solder ◽  
Plating Layer
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