Application of Microtexture Measurements in the SEM to Grain Boundary Parameters
1993 ◽
Vol 20
(1-4)
◽
pp. 231-242
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Keyword(s):
This paper discusses how microtexture data, i.e. individual orientations which are measured on a grain and environmentally specific basis, are applied to grain boundary geometrical parameters. Three main areas are addressed: the “interface-plane” scheme for specifying the five degress of freedom of a boundary, comparisons of experimental techniques for data collection, and representation of grain boundary misorientations in Rodrigues-Frank space. Particular attention is paid to electron back-scatter diffraction as a method of probing grain boundary misorientation and the crystallographic orientation of the grain boundary plane.
2005 ◽
Vol 475-479
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pp. 305-308
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2017 ◽
Keyword(s):
1997 ◽
Vol 3
(3)
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pp. 224-233
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1988 ◽
Vol 46
◽
pp. 606-607
Keyword(s):
1995 ◽
Vol 5
(2)
◽
pp. 1631-1634
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Keyword(s):