Chinese Fiction as a ‘Signal Bell of the Revolution’ and the Transregional Birth of an Author

2019 ◽  
Vol 9 (2) ◽  
pp. 125-150
Author(s):  
William C. Hedberg

Abstract This essay examines late nineteenth- and early twentieth-century interest in Shi Nai’an, the putative author of the traditional Chinese novel, The Water Margin. Despite the paucity of reliable evidence attesting to Shi Nai’an’s composition of The Water Margin, Japanese writers of the Meiji period were keenly interested in Shi on the basis of his alleged stature as a pioneering author of Oriental or East Asian (Tōyō) fiction. This characterization of Shi Nai’an was a byproduct of the recently established academic discipline of literary history in Japan, and the concomitant desire by Meiji-period historians to locate a literary text that could compete with Western works in terms of narrative and structural complexity. When late Qing-period Chinese authors became aware of Japanese writing on Shi Nai’an, they built on this budding biographical tradition by emphasizing Shi’s identification with an incipient Chinese nationalism, evidenced by his alleged resistance to the Mongol regime during the Yuan dynasty. The case study of Shi Nai’an thus illustrates the nexus between the construction of authorial personae and the pursuit of various ideological goals, as well as demonstrates the centrality of transregional literary contact in the formation of emergent concepts of authorship and canonization in modern East Asia.

2019 ◽  
Vol 31 (4) ◽  
pp. 775-804 ◽  
Author(s):  
Daniel Sinykin ◽  
Richard Jean So ◽  
Jessica Young

Abstract How has the language of economics, as codified by economics as a discipline, entered the US novel in the postwar period? Have economists influenced novelists at the level of language, and if so, how and how much? We begin with the belief, inferred from current scholarship on economics and culture, but never before empirically tested, that economic language became more prevalent around 1980, especially among white men—a belief that we strive to complicate and give nuance. Readers may detect an irony in the relationship between our method and case study. No academic discipline has valorized the use of quantification for social analysis more than economics. As a discipline, its language has become saturated with the language of modeling. Cultural and literary critics have long argued that economics has even harmed society by creating false accounts of how humans behave and think. Can we take their tools, however, and make them ours as a way to critique economics itself?


Author(s):  
D. L. Callahan

Modern polishing, precision machining and microindentation techniques allow the processing and mechanical characterization of ceramics at nanometric scales and within entirely plastic deformation regimes. The mechanical response of most ceramics to such highly constrained contact is not predictable from macroscopic properties and the microstructural deformation patterns have proven difficult to characterize by the application of any individual technique. In this study, TEM techniques of contrast analysis and CBED are combined with stereographic analysis to construct a three-dimensional microstructure deformation map of the surface of a perfectly plastic microindentation on macroscopically brittle aluminum nitride.The bright field image in Figure 1 shows a lg Vickers microindentation contained within a single AlN grain far from any boundaries. High densities of dislocations are evident, particularly near facet edges but are not individually resolvable. The prominent bend contours also indicate the severity of plastic deformation. Figure 2 is a selected area diffraction pattern covering the entire indentation area.


2018 ◽  
Vol 4 (1) ◽  
pp. 295-313 ◽  
Author(s):  
Karley A Riffe

Faculty work now includes market-like behaviors that create research, teaching, and service opportunities. This study employs an embedded case study design to evaluate the extent to which faculty members interact with external organizations to mitigate financial constraints and how those relationships vary by academic discipline. The findings show a similar number of ties among faculty members in high- and low-resource disciplines, reciprocity between faculty members and external organizations, and an expanded conceptualization of faculty work.


2011 ◽  
Author(s):  
Giorgio Rocco Cavanna ◽  
Ernesto Caselgrandi ◽  
Elisa Corti ◽  
Alessandro Amato del Monte ◽  
Massimo Fervari ◽  
...  

Author(s):  
Amy Poe ◽  
Steve Brockett ◽  
Tony Rubalcava

Abstract The intent of this work is to demonstrate the importance of charged device model (CDM) ESD testing and characterization by presenting a case study of a situation in which CDM testing proved invaluable in establishing the reliability of a GaAs radio frequency integrated circuit (RFIC). The problem originated when a sample of passing devices was retested to the final production test. Nine of the 200 sampled devices failed the retest, thus placing the reliability of all of the devices in question. The subsequent failure analysis indicated that the devices failed due to a short on one of two capacitors, bringing into question the reliability of the dielectric. Previous ESD characterization of the part had shown that a certain resistor was likely to fail at thresholds well below the level at which any capacitors were damaged. This paper will discuss the failure analysis techniques which were used and the testing performed to verify the failures were actually due to ESD, and not caused by weak capacitors.


Author(s):  
Sweta Pendyala ◽  
Dave Albert ◽  
Katherine Hawkins ◽  
Michael Tenney

Abstract Resistive gate defects are unusual and difficult to detect with conventional techniques [1] especially on advanced devices manufactured with deep submicron SOI technologies. An advanced localization technique such as Scanning Capacitance Imaging is essential for localizing these defects, which can be followed by DC probing, dC/dV, CV (Capacitance-Voltage) measurements to completely characterize the defect. This paper presents a case study demonstrating this work flow of characterization techniques.


Author(s):  
Martin Versen ◽  
Dorina Diaconescu ◽  
Jerome Touzel

Abstract The characterization of failure modes of DRAM is often straight forward if array related hard failures with specific addresses for localization are concerned. The paper presents a case study of a bitline oriented failure mode connected to a redundancy evaluation in the DRAM periphery. The failure mode analysis and fault modeling focus both on the root-cause and on the test aspects of the problem.


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