Single Crystalline Nature of para-Sexiphenyl Crystallites Grown on KCl(100)

2006 ◽  
Vol 6 (3) ◽  
pp. 698-703 ◽  
Author(s):  
T. Haber ◽  
M. Oehzelt ◽  
R. Resel ◽  
A. Andreev ◽  
A. Thierry ◽  
...  

This work focuses on studies of the single crystal nature of para-sexiphenyl structures grown on freshly cleaved KCl(100) surfaces. Two different kinds of morphologies, namely terrace like structures and needle like structures, are found by atomic force microscopy as well as by electron microscopy. Regardless of the morphology the individual crystallites show highly regular shapes. The crystalline alignment and the degree of order of the crystallites on the surface are determined by X-ray diffraction. Several epitaxial alignments of para-sexiphenyl on KCl(100) are observed and all of them are perfectly aligned on the surface. The rocking curve widths of the organic crystallites do not exceed 800″ which is approximately only the four fold of the substrates' ones. The single crystalline nature of para-sexiphenyl crystallites is proven by transmission electron microscopy, diffraction patterns, dark field imaging and high resolution techniques. Single crystalline terraced mounds reach diameters of several microns and heights of 50 nm. Single crystal needles show heights and breadths of more than 100 nm and lengths of several microns.

Author(s):  
Akira Tanaka ◽  
David F. Harling

In the previous paper, the author reported on a technique for preparing vapor-deposited single crystal films as high resolution standards for electron microscopy. The present paper is intended to describe the preparation of several high resolution standards for dark field microscopy and also to mention some results obtained from these studies. Three preparations were used initially: 1.) Graphitized carbon black, 2.) Epitaxially grown particles of different metals prepared by vapor deposition, and 3.) Particles grown epitaxially on the edge of micro-holes formed in a gold single crystal film.The authors successfully obtained dark field micrographs demonstrating the 3.4Å lattice spacing of graphitized carbon black and the Au single crystal (111) lattice of 2.35Å. The latter spacing is especially suitable for dark field imaging because of its preparation, as in 3.), above. After the deposited film of Au (001) orientation is prepared at 400°C the substrate temperature is raised, resulting in the formation of many square micro-holes caused by partial evaporation of the Au film.


2009 ◽  
Vol 15 (S2) ◽  
pp. 1082-1083
Author(s):  
D Masiel ◽  
B Reed ◽  
T LaGrange ◽  
ND Browning

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009


1987 ◽  
Vol 103 ◽  
Author(s):  
W. M. Stobbs

ABSTRACTT.E.M. methods are described for the quantitative characterisation of the compositional and structural changes at interfaces and in homo- and hetero-phase multilayer structures. Many of the newer approaches described including the Fresnel and Centre Stop Dark Field Imaging Methods were developed specifically for such characterisations. The range of applications of each of the techniques is assessed as is the importance of delineating the limiting effects of inelastic and inelastic/elastic multiple scattering.


1994 ◽  
Vol 332 ◽  
Author(s):  
Sean Hillyard ◽  
John Silcox

ABSTRACTAnnular dark field scanning transmission electron microscopy (ADF STEM) is chemically sensitive at high spatial resolution (e.g., 1.8ë at 100keV). Images can be digitally acquired and recorded, permitting quantitative analysis. It is particularly powerful when used in combination with complementary analysis modes such as x-ray microanalysis and transmission electron energy loss spectroscopy. Critical to the interpretation of these data is an understanding and determination of the electron probe intensity, shape and propagation characteristics inside the specimen. Quantitative measurements of diffraction patterns and images in comparison with computer-based simulations (including phonon scattering) provide a basis for developing that information. Results of a series of studies are reviewed that address questions such as defocus and other instrumental factors, and also the formation of channeling peaks that appear on the atomic columns along zone axes. For example, along Si(100) a peak forms and penetrates over 500ë whereas along Ge(100) it developes rapidly but disappears in less than 200ë. In higher atomic number elements, the penetration is even less (e.g. 1 O0ë for In).


1985 ◽  
Vol 49 (352) ◽  
pp. 375-386 ◽  
Author(s):  
C. D. Curtis ◽  
C. R. Hughes ◽  
J. A. Whiteman ◽  
C. K. Whittle

AbstractA range of authigenic sedimentary chlorites from sandstones has been studied by analytical transmission electron microscopy. Selected area (single crystal) electron diffraction patterns are of the Ib (β = 90°) polytype confirming the earlier observations of Hayes (1970).TEM analyses show all samples to be relatively rich in both Al and Fe. In the general formula (Mg,Fe,Al)n [Si8−xAlxO20](OH)16, x varies between 1.5 and 2.6; Fe/(Fe + Mg) between 0.47 and 0.83 and n between 10.80 and 11.54. Octahedral Al is close to 3 in this formulation and Fe2+ predominates over Fe3+. Swelling chlorites have significantly different compositions which are consistent with smectite/chlorite interstratifications.The Ib (β = 90°) polytype appears to be stable under conditions of moderate to deep burial. It replaces berthierine and swelling chlorites formed at lower temperatures. As commonly seen in grain coatings, however, it precipitates from porewater; solutes probably being contributed from several mineral decomposition reactions.


Author(s):  
P. E. Højlund Nielsen ◽  
J. M. Cowley

Reflection electron microscopy was widely used before 1960 for the study of surfaces. For the imaging diffuse scattered electrons was applied. For avoiding a severe foreshortening the surface was illuminated and viewed at fairly large angles. That resulted in a large energy spread of the scattered electrons so the resolution was limited to about 500Å due to chromatic aberration. Since such a resolution could be achieved more readily in scanning microscopes, the method was abandoned. However for single crystal surfaces the situation is entirely different. If the surface can be maintained reasonably clean, strong diffraction spots can be obtained and the energy spread in the diffracted beam is usually small; thus the imaging of the surface can be performed in a manner similar to the dark field imaging of a thin crystalline specimen.


1997 ◽  
Vol 04 (04) ◽  
pp. 687-694 ◽  
Author(s):  
KUNIO TAKAYANAGI ◽  
YOSHITAKA NAITOH ◽  
YOSHIFUMI OSHIMA ◽  
MASANORI MITOME

Surface transmission electron microscopy (TEM) has been used to reveal surface steps and structures by bright and dark field imaging, and high resolution plan view and/or profile view imaging. Dynamic processes on surfaces, such as step motion, surface phase transitions and film growths, are visualized by a TV system attached to the electron microscope. Atom positions can precisely be detected by convergent beam illumination (CBI) of high resolution surface TEM. Imaging of the atomic positions of surfaces with truncation is briefly reviewed in this paper, with recent development of a TEM–STM (scanning tunneling microscope) system.


2013 ◽  
Vol 592-593 ◽  
pp. 483-488
Author(s):  
Jozef Janovec ◽  
Ivona Černičková ◽  
Pavol Priputen

The recent findings related to binary and ternary structurally complex phases in selected complex metallic alloys coming under Al-Pd-Co, Al-Cu-Co, and Al-Mn-Fe systems are presented. The phases were characterized by scanning electron microscopy, transmission electron microscopy, energy-dispersive X-ray spectroscopy, high-angle annular dark-field imaging, X-ray diffraction, and differential thermal analysis. There are highlighted some unusual features of phases D, U, T, and ε-family from both structural and compositional points of view.


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