Compositional variation within some sedimentary chlorites and some comments on their origin

1985 ◽  
Vol 49 (352) ◽  
pp. 375-386 ◽  
Author(s):  
C. D. Curtis ◽  
C. R. Hughes ◽  
J. A. Whiteman ◽  
C. K. Whittle
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Diffraction ◽  
Single Crystal ◽  
Compositional Variation ◽  
Analytical Transmission Electron Microscopy ◽  
Decomposition Reactions ◽  
Transmission Electron ◽  
Diffraction Patterns ◽  
Crystal Electron

AbstractA range of authigenic sedimentary chlorites from sandstones has been studied by analytical transmission electron microscopy. Selected area (single crystal) electron diffraction patterns are of the Ib (β = 90°) polytype confirming the earlier observations of Hayes (1970).TEM analyses show all samples to be relatively rich in both Al and Fe. In the general formula (Mg,Fe,Al)n [Si8−xAlxO20](OH)16, x varies between 1.5 and 2.6; Fe/(Fe + Mg) between 0.47 and 0.83 and n between 10.80 and 11.54. Octahedral Al is close to 3 in this formulation and Fe2+ predominates over Fe3+. Swelling chlorites have significantly different compositions which are consistent with smectite/chlorite interstratifications.The Ib (β = 90°) polytype appears to be stable under conditions of moderate to deep burial. It replaces berthierine and swelling chlorites formed at lower temperatures. As commonly seen in grain coatings, however, it precipitates from porewater; solutes probably being contributed from several mineral decomposition reactions.

Hydrothermal Synthesis of PbS Hollow Spheres with Single Crystal-Like Electron Diffraction Patterns

2008 ◽  
Vol 8 (1) ◽  
pp. 379-385
Author(s):  
Pingtang Zhao ◽  
Jinmin Wang ◽  
Guoe Chen ◽  
Zhou Xiao ◽  
Jing Zhou ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Diffraction ◽  
Single Crystal ◽  
Sodium Citrate ◽  
Near Infrared ◽  
Hydrothermal Process ◽  
Hollow Spheres ◽  
Transmission Electron ◽  
Diffraction Patterns

PbS hollow spheres were successfully prepared by a sodium citrate-assisted hydrothermal process at 120 °C for 12 h, employing lead acetate trihydrate, thiourea and sodium citrate as precursors. The diameter of PbS hollow spheres is 200–400 nm, which is composed of about 50–80 nm nanoparticles. The synthesized product was characterized by powder X-ray diffraction (XRD), field emission scanning electron microscopy (FESEM), transmission electron microscopy (TEM), high-resolution transmission electron microscopy (HRTEM), electron diffraction (ED), Fourier transform-infrared (FT-IR) spectroscopy, ultraviolet-visible spectrometer (UV-vis) and near-infrared absorption spectrometer (NIR). The effects of the reaction conditions on morphologies of PbS structures were investigated. Star-shaped and flat PbS crystals were obtained by changing some experiment conditions. The results show that temperature, sodium citrate concentration, sulfur sources and solvent play key roles on the final morphologies formation of PbS crystals. Especially, ED result indicates that PbS hollow spheres hold single crystal-like electron diffraction patterns. And the possible formation mechanism of hollow spheres was proposed.

Characterization of submicrometer fluid Inclusions in minerals by Analytical/Transmission Electron Microscopy and electron diffraction

1990 ◽  
Vol 48 (4) ◽  
pp. 424-424
Author(s):  
George Guthrie ◽  
David Veblen
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
Electron Diffraction ◽  
Light Microscopy ◽  
Fluid Inclusions ◽  
Energy Dispersive Spectrometer ◽  
Analytical Transmission Electron Microscopy ◽  
Transmission Electron

The nature of a geologic fluid can often be inferred from fluid-filled cavities (generally <100 μm in size) that are trapped during the growth of a mineral. A variety of techniques enables the fluids and daughter crystals (any solid precipitated from the trapped fluid) to be identified from cavities greater than a few micrometers. Many minerals, however, contain fluid inclusions smaller than a micrometer. Though inclusions this small are difficult or impossible to study by conventional techniques, they are ideally suited for study by analytical/ transmission electron microscopy (A/TEM) and electron diffraction. We have used this technique to study fluid inclusions and daughter crystals in diamond and feldspar.Inclusion-rich samples of diamond and feldspar were ion-thinned to electron transparency and examined with a Philips 420T electron microscope (120 keV) equipped with an EDAX beryllium-windowed energy dispersive spectrometer. Thin edges of the sample were perforated in areas that appeared in light microscopy to be populated densely with inclusions. In a few cases, the perforations were bound polygonal sides to which crystals (structurally and compositionally different from the host mineral) were attached (Figure 1).

The Dodecagonal Quasicrystalline Telluride (Ta, V)1.6Te And Its Crystalline Approximant (TaV)97Te60

1998 ◽  
Vol 553 ◽  
Author(s):  
C. Reich ◽  
M. Conrad ◽  
F. Krumeich ◽  
B. Harbrecht
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Electron Diffraction ◽  
Single Crystal ◽  
Edge Length ◽  
X Ray ◽  
Transmission Electron ◽  
The Impact

AbstractThe dodecagonal (dd) quasicrystalline tantalum telluride dd Ta1.6Te and the crystalline approximant Ta97Te60 have been modified by partly replacing tantalum by vanadium. The impact of the substitution on the structures has been studied by X-ray and electron diffraction and by high-resolution transmission electron microscopy. The layered-type approximant structure of Ta83V14Te60 was determined by single crystal X-ray means. The partitioning of vanadium on 21 out of 29 crystallographically inequivalent metal sites is referred to, but not controlled by the Dirichlet domain volume available at the sites. A HRTEM projection of dd (Ta, V)1.6Te onto the dodecagonal plane is analysed with respect to the arrangement of (Ta, V)151Te74 clusters on the vertices of an irregular aperiodic square-triangle tiling, the edge length of which corresponds to the distance between the centres of two such clusters. The clusters comprise about 1 nm thick corrugated lamellae which are periodically stacked by weak Te-Te interactions.

Design of 2D-nanocrystals in water: preparation, structure and functionalization

2018 ◽  
Vol 90 (5) ◽  
pp. 833-844
Author(s):  
Leonid Aslanov ◽  
Valery Zakharov ◽  
Ksenia Paseshnichenko ◽  
Aleksandr Yatsenko ◽  
Andrey Orekhov ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Chemical Composition ◽  
High Resolution ◽  
Electron Diffraction ◽  
Single Crystal ◽  
Room Temperature ◽  
Energy Dispersive ◽  
X Ray ◽  
Transmission Electron

AbstractA new method for synthesis of 2D nanocrystals in water was proposed. The use of perfluorothiophenolate ions as surfactant allowed us to produce 2D single-crystal nanosheets of CaS at pH=9 and flat nanocrystals of PbS at pH=9 at room temperature. Mesocrystalline nanobelts of CdS and mesocrystals of PbS were obtained at pH=3–5 and pH=10–12, respectively. Morphology, structure and chemical composition of nanoparticles were characterized by high-resolution transmission electron microscopy, electron diffraction and energy dispersive X-ray spectroscopy. A mechanism of nanoparticles formation was discussed.

Evaporated Titanium Films on Rocksalt

1967 ◽  
Vol 25 ◽  
pp. 296-297
Author(s):  
Frank E. Wawner ◽  
Kenneth R. Lawless
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Diffraction ◽  
Single Crystal ◽  
High Purity ◽  
Early Stages ◽  
Transmission Electron ◽  
Single Crystal Films ◽  
Crystal Films ◽  
Purity Titanium

Thin single crystal films of high purity titanium were needed in our laboratory for investigations of the early stages of the oxidation of titanium. Experiments were carried out to determine the feasibility of preparing single crystal titanium films of different orientations by evaporation onto the (100), (110) and (111) surfaces of rocksalt. The structures of these films were investigated by transmission electron microscopy and electron diffraction.

scholarly journals Odd electron diffraction patterns in silicon nanowires and silicon thin films explained by microtwins and nanotwins

2009 ◽  
Vol 42 (2) ◽  
pp. 242-252 ◽  
Author(s):  
Cyril Cayron ◽  
Martien Den Hertog ◽  
Laurence Latu-Romain ◽  
Céline Mouchet ◽  
Christopher Secouard ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Electron Diffraction ◽  
Silicon Nanowires ◽  
Si Nanowires ◽  
Silicon Thin Films ◽  
Transmission Electron ◽  
Diffraction Patterns

Odd electron diffraction patterns (EDPs) have been obtained by transmission electron microscopy (TEM) on silicon nanowires grownviathe vapour–liquid–solid method and on silicon thin films deposited by electron beam evaporation. Many explanations have been given in the past, without consensus among the scientific community: size artifacts, twinning artifacts or, more widely accepted, the existence of new hexagonal Si phases. In order to resolve this issue, the microstructures of Si nanowires and Si thin films have been characterized by TEM, high-resolution transmission electron microscopy (HRTEM) and high-resolution scanning transmission electron microscopy. Despite the differences in the geometries and elaboration processes, the EDPs of the materials show great similarities. The different hypotheses reported in the literature have been investigated. It was found that the positions of the diffraction spots in the EDPs could be reproduced by simulating a hexagonal structure withc/a= 12(2/3)1/2, but the intensities in many EDPs remained unexplained. Finally, it was established that all the experimental data,i.e.EDPs and HRTEM images, agree with a classical cubic silicon structure containing two microstructural defects: (i) overlapping Σ3 microtwins which induce extra spots by double diffraction, and (ii) nanotwins which induce extra spots as a result of streaking effects. It is concluded that there is no hexagonal phase in the Si nanowires and the Si thin films presented in this work.

Orthorhombic Splitting and Chemical Etching of Ba2Ycu3O7-δ Crystal Surfaces

1989 ◽  
Vol 169 ◽  
Author(s):  
D. J. Werder ◽  
C. H. Chen ◽  
M. Gurvitch ◽  
B. Miller ◽  
L. F. Schneemeyer ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Diffraction ◽  
Single Crystal ◽  
Chemical Etching ◽  
Poor Quality ◽  
Crystal Surfaces ◽  
Surface Layers ◽  
The Poor ◽  
Transmission Electron

AbstractWe find by transmission electron diffraction (TED) that the orthorhombic splitting of the upper surface layers (< 1 μm) of single crystal Ba2YCu3O7-δ(YBCO) is reduced, differing by 10 to 30 percent from the bulk value. We also find by transmission electron microscopy (TEM) that in general the surfaces are of inferior quality, and thus, not representative of the bulk. These results have important consequences for those experiments that probe only the upper surface layers. By etching with either Br/ethanol or HClO4/NaClO4 the poor quality surfaces can be removed.

Investigations of Defective β-NiAl by Transmission Electron Microscopy

1981 ◽  
Vol 39 ◽  
pp. 58-59 ◽  
Author(s):  
H. C. Liu ◽  
E. Chang ◽  
T. E. Mitchell
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Diffraction ◽  
Defect Structures ◽  
Transmission Electron ◽  
Nial Phase ◽  
Wide Range ◽  
Diffraction Patterns ◽  
B2 Structure

The β-NiAl phase, which is an ordered B2 structure, covers a wide range of compositions extending from ∼46 at.% Ni to ∼60 at.% Ni. For non-stoichiometric β-NiAl, studies (1,2) have shown that, for compositions below 50 at.% Ni, structural vacancies are introduced on the Ni sublattice (denoted as VNi), but for compositions above 50 at.% Ni,excess Ni atoms replace A1 atoms on the A1 sublattice (denoted as NiAl). In this work, defect structures in compositions of 45, 45.5, 46, 47, 50, 55, 58 and 60 at.% Ni were studied by electron diffraction techniques in a Siemens 102 TEM.Figs. 1 and 2 show selected area diffraction patterns at the exact [011] and [001] zone axes respectively.

Authigenic chlorites: problems with chemical analysis and structural formula calculations

Clay Minerals ◽  
1984 ◽  
Vol 19 (3) ◽  
pp. 471-481 ◽  
Author(s):  
C. D. Curtis ◽  
B. J. Ireland ◽  
J. A. Whiteman ◽  
R. Mulvaney ◽  
C. K. Whittle
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Structural Formula ◽  
Compositional Variation ◽  
Analytical Transmission Electron Microscopy ◽  
Fine Grained ◽  
Single Section ◽  
Transmission Electron ◽  
Structural Formulae ◽  
Very High

AbstractAnalytical transmission electron microscopy was applied to some authigenic chlorites occurring as grain coatings in sandstones. Compositional variation proved to be relatively slight: all were magnesian chamosites. The coating chlorites were often intimately mixed with extremely fine-grained (0·01–0·2 µm) hematite but analytical ‘contamination’ was avoided because of the very high resolution of both observation (spot location) and analysis. One example of a water-sensitive (‘swelling chlorite’) coating was also studied. This proved to have a very much more variable composition even within a single section. The coating appeared to include both chloritic and vermiculitic components. The effect of this on structural formulae is discussed and a model proposed in which the ‘talc’ layer may be common to both components.

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