Effect of Applied Current Density on Anodic Oxidation Behavior of AZ31 Mg Alloy in NaOH Solution

2019 ◽  
Vol 19 (7) ◽  
pp. 4103-4108
Author(s):  
Yeajin Kim ◽  
Heon-Cheol Shin ◽  
Sungmo Moon
2018 ◽  
Vol 42 (18) ◽  
pp. 14876-14882 ◽  
Author(s):  
Mahnaz Sharafi-Kolkeshvandi ◽  
Davood Nematollahi ◽  
Firozeh Pouladi ◽  
Pouria Patoghi

Green syntheses of two different series of new benzofuran derivatives were carried out by anodic oxidation of 4,4′-biphenol (4BP) in the presence of some CH-acid compounds (malononitrile, methyl cyanoacetate and ethyl cyanoacetate) as nucleophiles by controlling the potential during electrolysis.


Molecules ◽  
2020 ◽  
Vol 25 (24) ◽  
pp. 5893
Author(s):  
Faléstine Souiad ◽  
Ana Sofia Rodrigues ◽  
Ana Lopes ◽  
Lurdes Ciríaco ◽  
Maria José Pacheco ◽  
...  

This paper studies the degradation of methiocarb, a highly hazardous pesticide found in waters and wastewaters, through an electro-Fenton process, using a boron-doped diamond anode and a carbon felt cathode; and evaluates its potential to reduce toxicity towards the model organism Daphnia magna. The influence of applied current density and type and concentration of added iron source, Fe2(SO4)3·5H2O or FeCl3·6H2O, is assessed in the degradation experiments of methiocarb aqueous solutions. The experimental results show that electro-Fenton can be successfully used to degrade methiocarb and to reduce its high toxicity towards D. magna. Total methiocarb removal is achieved at the applied electric charge of 90 C, and a 450× reduction in the acute toxicity towards D. magna, on average, from approximately 900 toxic units to 2 toxic units, is observed at the end of the experiments. No significant differences are found between the two iron sources studied. At the lowest applied anodic current density, 12.5 A m−2, an increase in iron concentration led to lower methiocarb removal rates, but the opposite is found at the highest applied current densities. The highest organic carbon removal is obtained at the lowest applied current density and added iron concentration.


2011 ◽  
Vol 181-182 ◽  
pp. 434-438
Author(s):  
Ming Meng ◽  
Yuan Ming Huang

Electrochemical deposition of copper from copper chloride aqueous electrolyte on porous silicon (PS) substrate was investigated in the current density range of 5 mA/cm2to 35 mA/cm2. Scanning electron microscopy (SEM) was utilized to characterize the surface morphology of as-electrodeposited PS. SEM images illustrate that the applied current density has a profound influence on the shape of copper crystal electrodeposited on the top surface of PS films. When the applied current density was fixed at 5mA/cm2, most of the copper crystals are in the shape of cube along with a small number of cuboid-shape. With the increasing current density, cuboid-shaped copper crystals gradually vanished. When the current density is up to the 35mA/cm2, we surprisingly observe that the cube shape predominates simultaneously with the emergence of truncated tetrahedron. A tentative explanation for the growth mechanism of copper crystal having various shapes is explored.


2015 ◽  
Vol 17 (15) ◽  
pp. 9936-9941 ◽  
Author(s):  
Chunyu Shang ◽  
Jinxian Zhao ◽  
Xiuqin Wang ◽  
Hongyang Xia ◽  
Hui Kang

With the increase of applied current density in low voltage cathodoluminescence, the exciting power tends to saturate, causing the saturation of electron–hole generation rate in the phosphor layer.


2005 ◽  
Vol 483-485 ◽  
pp. 989-992 ◽  
Author(s):  
S.I. Maximenko ◽  
Stanislav I. Soloviev ◽  
A.E. Grekov ◽  
A.V. Bolotnikov ◽  
Ying Gao ◽  
...  

The degradation of diffused SiC PIN diodes during forward-biased operation was studied by first fabricating PIN diodes by diffusion of aluminum or boron into 4H-SiC substrates with n-type 10-15 µm thick epilayers doped by nitrogen up to 5x1015cm-3. The formed diodes were subjected to degradation testing under an applied current density of 200A/cm2 at room temperature. The majority of the Al diffused diodes demonstrated a voltage drift, ΔVf, of more than 2 V, while B-doped diodes showed no significant change in forward voltage. The EBIC mode of SEM was employed to monitor nucleation and expansion of stacking faults.


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