scholarly journals Phosphorus diffusion gettering process of multicrystalline silicon using a sacrificial porous silicon layer

2012 ◽  
Vol 7 (1) ◽  
Author(s):  
Derbali Lotfi ◽  
Ezzaouia Hatem
Keyword(s):  
Porous Silicon ◽  
Silicon Layer ◽  
Porous Silicon Layer ◽  
Multicrystalline Silicon ◽  
Phosphorus Diffusion

Optimization of DLC/PS Antireflection Coating Properties for Multicrystalline Silicon Solar Cells

2009 ◽  
Vol 609 ◽  
pp. 179-182 ◽  
Author(s):  
Kahina Ait-Hamouda ◽  
A. Ababou ◽  
N. Gabouze
Keyword(s):  
Solar Cell ◽  
Porous Silicon ◽  
Spectral Response ◽  
Silicon Layer ◽  
Chemical Vapor ◽  
Antireflection Coating ◽  
Porous Silicon Layer ◽  
Electrochemical Process ◽  
Multicrystalline Silicon ◽  
Cell Parameters

In this work, we report on the results of using a Diamond-Like Carbon / Porous Silicon (DLC/PS) double layer as antireflection coating to enhance the performance of multicrystalline silicon photovoltaic cells. DLC layers were obtained by Plasma Enhanced Chemical Vapor Deposition (PECVD) method. The properties of these layers were investigated in order to establish the optimum preparation conditions for solar cell applications. Then, thin films of combined porous silicon-DLC structure were fabricated for antireflection coating use. The spectral response of a solar cell based on multicrystalline silicon (mc-Si) coated with a PS layer, formed by electrochemical process was enhanced compared to a cell without porous silicon layer as emitter. Further improvements are obtained by a deposition of a thin DLC film. The results of the solar cell parameters before and after porous silicon formation and DLC coating are discussed.

Gettering impurities from crystalline silicon by phosphorus diffusion using a porous silicon layer

2005 ◽  
Vol 87 (1-4) ◽  
pp. 605-611 ◽  
Author(s):  
N. Khedher ◽  
M. Hajji ◽  
M. Hassen ◽  
A. Ben Jaballah ◽  
B. Ouertani ◽  
...  
Keyword(s):  
Porous Silicon ◽  
Crystalline Silicon ◽  
Silicon Layer ◽  
Porous Silicon Layer ◽  
Phosphorus Diffusion

Effect of the Porous Silicon Layer Structure on Gas Adsorption

2020 ◽  
Vol 12 (4) ◽  
pp. 04020-1-04020-5
Author(s):  
A. P. Oksanich ◽  
◽  
S. E. Pritchin ◽  
M. A. Mashchenko ◽  
A. Yu. Bobryshev ◽  
...  
Keyword(s):  
Porous Silicon ◽  
Gas Adsorption ◽  
Layer Structure ◽  
Silicon Layer ◽  
Porous Silicon Layer

scholarly journals Morphology and FT IR spectra of porous silicon

2017 ◽  
Vol 68 (7) ◽  
pp. 53-57 ◽  
Author(s):  
Martin Kopani ◽  
Milan Mikula ◽  
Daniel Kosnac ◽  
Jan Gregus ◽  
Emil Pincik
Keyword(s):  
Porous Silicon ◽  
Ir Spectra ◽  
Silicon Layer ◽  
Porous Silicon Layer ◽  
Layer Formation ◽  
Porous Si ◽  
Ft Ir ◽  
P Type ◽  
Type Sample ◽  
Ftir Investigation

AbstractThe morphology and chemical bods of p-type and n-type porous Si was compared. The surface of n-type sample is smooth, homogenous without any features. The surface of p-type sample reveals micrometer-sized islands. FTIR investigation reveals various distribution of SiOxHycomplexes in both p-and n-type samples. From the conditions leading to porous silicon layer formation (the presence of holes) we suggest both SiOxHyand SiFxHycomplexes in the layer.

Sensing mechanism analysis on one-dimensional photonic crystal with air slot-porous silicon-air slot F–P cavity

2019 ◽  
Vol 33 (13) ◽  
pp. 1950159 ◽  
Author(s):  
Ying Chen ◽  
Xinbei Gao ◽  
Pei Luo ◽  
Yangmei Xu ◽  
Jinggang Cao ◽  
...  
Keyword(s):  
Refractive Index ◽  
Photonic Crystal ◽  
Porous Silicon ◽  
Structural Parameters ◽  
Silicon Layer ◽  
Porous Silicon Layer ◽  
Resonant Peak ◽  
Mechanism Analysis ◽  
Q Value ◽  
Quality Factor Q

Based on the evanescent wave resonance, a photonic crystal sensing structure with air slot-porous silicon-air slot Fabry–Perot cavity (F–P cavity) is proposed. Taking the F–P cavity as the sensing unit, when the gas to be detected is filled into the sensing unit, the refractive index of the air slot will be changed and the refractive index of the porous silicon layer will also be varied, both of which will shift the resonant peak and greatly increase the sensitivity of the sensor. By adjusting the structural parameters, the quality factor (Q value) can be optimized. A model for the relationship between the resonant wavelength and the refractive index of the detected organic gas was established, and the refractive index sensing performance was analyzed. The results show that the Q value of the structure can attain to 12312.2 and the sensitivity is about 8661.708 nm/RIU, which can provide effective theoretical reference and technical guidance for organic gas detection with low concentration.

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