scholarly journals Investigation of the Internal Structure and Gold-thin Layer of the Gilt-bronze Seated Avalokitesvara Bodhisattva at Anseong Cheonryong Temple through the Non-destructive Analysis

2021 ◽  
Vol 37 (6) ◽  
pp. 670-678
Author(s):  
Jung Eun Choi ◽  
Hak Choi

Anseong Cheonryongsa, a temple located in Anseong Seoun Mountain, is a part of the second Jogye Order of Korean Buddhism, under the Yongju Temple, and enshrines a gilt-bronze seated Avalokitesvara Bodhisattva. In this study, X-ray fluorescence (XRF) analysis revealed that this statue is composed of Cu-27.2 wt%, Sn-12.6 wt% and Pb-48 wt%. A gamma (γ) ray (Ir-192) image confirmed damage on the backside of the statue, which was later repaired with wood. The XRF analysis and visual observation determined the boundary between the metal and wood in the statue. In addition, results of standard X-ray peak intensity of gold foil and correlation with thickness helped to derive an equation for calculating the thickness of the Avalokitesvara Bodhisattva’s gold foil. It was determined that the gilded chest (21 µm) and face (20.7 µm) of the statue were the thickest sections, the wooden substratum (11.9 µm) was the next-most thick, and the bronze (7.4 µm) was the thinnest layer.

2015 ◽  
Vol 73 (3) ◽  
Author(s):  
Jaafar Abdullah ◽  
Abibullah Samsudin ◽  
Nor Laili Omar ◽  
Hafizza Abdul Manan

Determining the fineness of gold jewelleries remains one of the most challenging tasks in gold trading. The existing technology of gold testing is inadequate, allowing gold counterfeiting worldwide. The most popular non-destructive method for analysis of gold jewelleries is X-ray fluorescence technique. However, the technique is limited to surface only and it is also greatly influenced by matrix effects. In this paper, dual-energy X-ray micro-computed tomography method was proposed to assay gold jewelleries. Experimental results demonstrated that grey values of reconstructed tomographic images in combination with advanced image analysis procedures could be used to detect fake jewelleries. Due to the uniqueness of X-ray absorption, the technique was also capable of identifying different materials in gold jewelleries. Further analysis on sectioned-earrings samples using X-ray diffraction techniques and visual observation confirmed all tomographic findings.  


2014 ◽  
Vol 21 (4) ◽  
pp. 751-755 ◽  
Author(s):  
Jian Zhu ◽  
Huiping Duan ◽  
Yimin Yang ◽  
Li Guan ◽  
Wei Xu ◽  
...  

Underglaze copper-red decoration,i.e.the copper colourant used to paint diversified patterns on the surface of a body and then covered by transparent glaze and fired at high temperature in a reductive firing environment, is famous all over the world. However, the red colouration mechanism generated by underglaze copper remains unclear. In particular, the fact that the edges of the red patterns are orange has been ignored in previous research. Here, non-destructive analysis has been carried out on a precious fragment of early underglaze red porcelain using synchrotron radiation X-ray fluorescence, X-ray absorption near-edge spectroscopy (XANES) and reflection spectrometry techniques. The results suggest that the copper content in the red region is higher than that in the orange region, and other colour generation elements do not have obvious content difference, indicating that the colour generation effect of the underglaze red product is related to the copper content. XANES analysis shows that the valence states of copper in the red and orange regions are similar and metal copper contributes to their hues. The results of reflection spectrometry demonstrate that tiny orange hues could be attributed to the Mie scatting effect. Therefore, light-scattering effects should be considered when researching the colouration mechanism of underglaze red.


1990 ◽  
Vol 187 ◽  
Author(s):  
H. Watabe ◽  
M. Iwami ◽  
M. Hirai ◽  
M. Kusaka ◽  
M. Kubota ◽  
...  

AbstractSpectra obtained by a new soft x-ray emission spectroscopy(SXES) apparatus again exhibited clear differences among Si-compounds and Si crystal. A non-destructive analysis of an annealed transition metal(TMSi:film)/Si(111) contact system was carried out using either the distinct differences of Si L2, 3 SXES spectra between TMSi's and Si single crystals or the fad that the soft x-ray production depth increases in a solid with the energy of the primary electron, Ep. It was shown that the apparatus was capable of exploring electronic and atomic structures of a multi-layered contact system grown on a Si(111) substrate.


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