Revealing the Defects Introduced in N- or Ge-doped Cz-Si by γIrradiation and High Temperature-High Pressure Treatment
2008 ◽
Vol 114
(2)
◽
pp. 439-446
◽
1975 ◽
Vol 344
(1636)
◽
pp. 111-130
◽
2009 ◽
pp. 3-3-19
Keyword(s):
Keyword(s):