A Microwave Measurement Method for Complex Permittivity Determination of Dielectric Materials at Ku-Band

2013 ◽  
Vol 1 (1) ◽  
pp. 6
Author(s):  
Nawfal Jebbor ◽  
Keyword(s):  
Complex Permittivity ◽  
Measurement Method ◽  
Dielectric Materials ◽  
Microwave Measurement ◽  
Ku Band

Dielectric Measurement Of Multi-Layered Medium Using An Open-Ended Waveguide

1996 ◽  
Vol 430 ◽  
Author(s):  
O. Tantot ◽  
M. Chatard-Moulin ◽  
P. Guillon
Keyword(s):  
Reflection Coefficient ◽  
Complex Permittivity ◽  
Layered Medium ◽  
Circular Waveguide ◽  
Air Gap ◽  
Dielectric Measurement ◽  
Microwave Measurement ◽  
Measurement Devices

AbstractThe use of a circular waveguide radiating into a multi-layered media allows the characterization of heterogeneous and fluid subtances. Many microwave measurement devices, based on reflection coefficient measurements, are subjected to air gap problems that introduce some inaccuracy in the determination of the unknown complex permittivity of the materials. Our purpose is to try and take the air gap into account in these measurements.

scholarly journals 2D-FDTD METHOD TO ESTIMATE THE COMPLEX PERMITTIVITY OF A MULTILAYER DIELECTRIC MATERIALS AT KU-BAND FREQUENCIES

2020 ◽  
Vol 91 ◽  
pp. 155-164
Author(s):  
Lahcen Ait Benali ◽  
Jaouad Terhzaz ◽  
Abdelwahed Tribak ◽  
Angel Mediavilla Sanchez
Keyword(s):  
Complex Permittivity ◽  
Fdtd Method ◽  
Dielectric Materials ◽  
2D Fdtd ◽  
Multilayer Dielectric ◽  
Ku Band

A New Technique to Determine the Complex Permittivity of Each Layer for a Bi-Layer Dielectric Material at Microwave Frequency

2017 ◽  
pp. 115-145
Author(s):  
Hassan Elmajid ◽  
Jaouad Terhzaz ◽  
Hassan Ammor
Keyword(s):  
Complex Permittivity ◽  
Relative Permittivity ◽  
Dielectric Material ◽  
Dielectric Materials ◽  
New Technique ◽  
S Parameters ◽  
A New Technique ◽  
Relative Errors ◽  
The Individual ◽  
Ku Band

A new technique is presented to determine the complex relative permittivity of each layer of a bi-layer dielectric material. The bi-layer material sample is loaded in a Ku-band rectangular waveguide and its two port S-parameters are measured as a function of frequency using a Network Analyzer. Also, by applying the mode matching technique, expressions for the S-parameters of the bi-layer dielectric material as a function of complex relative permittivity of each layer are developed. To estimate the complex permittivity of each layer for a bi-layer dielectric material, the square sums of errors between the measured and calculated S-parameters are minimized using a nonlinear optimization algorithm. The complex permittivity of each layer for a bi-layer dielectric material such as FR4-Teflon, FR4-Delrin and Delrin-Teflon are determined at the Ku-band frequencies, the average relative errors between the individual dielectric materials and those of each layer of bi-layer dielectric materials are calculated.

scholarly journals Continuous Characterization of Permittivity over a Wide Bandwidth Using a Cavity Resonator

2020 ◽  
Vol 20 (1) ◽  
pp. 39-44
Author(s):  
Rehab S. Hassan ◽  
Sung Ik Park ◽  
Ashwini Kumar Arya ◽  
Sanghoek Kim
Keyword(s):  
Complex Permittivity ◽  
Cavity Resonator ◽  
Dielectric Materials ◽  
Wide Frequency Range ◽  
Wide Bandwidth ◽  
Frequency Independent ◽  
5 Ghz ◽  
Continuous Determination

We examine a rectangular cavity resonator method to accurately characterize the complex permittivity of dielectric materials over a wide frequency range of 1–5 GHz by exploiting the fundamental mode and higher-order TE<sub>(1,0,<i>l</i>)</sub> modes. For this purpose, a rectangular waveguide is coupled with a cavity resonator through a large inductive aperture. The permittivity characterization at both even and odd TE<sub>(1,0,<i>l</i>)</sub> modes enables continuous determination of the permittivity over operating frequencies. The characterization of the permittivity for even TE<sub>(1,0,<i>l</i>)</sub> modes suffers from potential errors due to the displacement of materials. This paper also proposes a method to compensate for these errors and improve the accuracy in the even modes. The experimental results of the fabricated cavity are presented using different materials (frequency-independent and frequency-dependent). The measured complex permittivity results show a good agreement with the reported results over a wide bandwidth available in the literature.

scholarly journals Characterisation of dielectric 3D-printingmaterials at microwave frequencies

ACTA IMEKO ◽  
2020 ◽  
Vol 9 (3) ◽  
pp. 26
Author(s):  
Andrea Alimenti ◽  
Kostiantyn Torokhtii ◽  
Nicola Pompeo ◽  
Emanuele Piuzzi ◽  
Enrico Silva
Keyword(s):  
Quality Factor ◽  
Loss Tangent ◽  
Complex Permittivity ◽  
High Frequency ◽  
Measurement Method ◽  
Air Gap ◽  
3D Printer ◽  
Reliable Determination ◽  
Microwave Frequencies

<p class="Abstract">3D-printer materials are becoming increasingly appealing, especially for high frequency applications. As such, the electromagnetic characterisation of these materials is an important step in evaluating their applicability for new technological devices. We present a measurement method for complex permittivity evaluation based on a dielectric loaded resonator (DR). Comparing the quality factor <em>Q</em> of the DR with a disk-shaped sample placed on a DR base, with <em>Q</em> obtained when the sample is substituted with an air gap, allows a reliable determination of the loss tangent.</p>

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