Anti-reflective coating with a conductive indium tin oxide layer on flexible glass substrates

2018 ◽  
Vol 57 (9) ◽  
pp. 2202 ◽  
Author(s):  
Yilin Sung ◽  
Robert E. Malay ◽  
Xin Wen ◽  
Christian N. Bezama ◽  
Varun V. Soman ◽  
...  
2013 ◽  
Vol 14 (2) ◽  
pp. 457-463 ◽  
Author(s):  
Bao-Fu Ding ◽  
Wallace C.H. Choy ◽  
Wai-Ming Kwok ◽  
Yao Yao ◽  
Keith Y.F. Ho ◽  
...  

2014 ◽  
Vol 997 ◽  
pp. 337-340
Author(s):  
Jian Guo Chai

Indium tin oxide (ITO) films were deposited on glass substrates by magnetron sputtering. Properties of ITO films showed a dependence on substrate temperature. With an increasing in substrate temperature, the intensity of XRD peak increased and the grain size showed an evident increasing. The results show that increasing substrate temperature remarkably improves the characteristics of the films. The sheet resistance of 10 Ω/sq and the maximum optical transmittance of 90% in the visible range with optimized conditions can be achicved. The results of experiment demonstrate that high-quality films have been achieved by this technique.


1993 ◽  
Vol 8 (12) ◽  
pp. 3135-3144 ◽  
Author(s):  
Dennis Gallagher ◽  
Francis Scanlan ◽  
Raymond Houriet ◽  
Hans Jörg Mathieu ◽  
Terry A. Ring

In2O3–SnO2 films were produced by thermal decomposition of a deposit which was dip coated on borosilicate glass substrates from an acetylacetone solution of indium and tin acetoacetonate. Thermal analysis showed complete pyrolysis of the organics by 400 °C. The thermal decomposition reaction generated acetylacetone gas and was found to be first order with an activation energy of 13.6 Kcal/mole. Differences in thermal decomposition between the film and bulk materials were noted. As measured by differential scanning calorimetry using a 40 °C/min temperature ramp, the glass transition temperature of the deposited oxide film was found to be ∼462 °C, and the film crystallization temperature was found to be ∼518 °C. For film fabrication, thermal decomposition of the films was performed at 500 °C in air for 1 h followed by reduction for various times at 500 °C in a reducing atmosphere. Crystalline films resulted for these conditions. A resistivity of ∼1.01 × 10−3 Ω · cm, at 8 wt. % tin oxide with a transparency of ∼95% at 400 nm, has been achieved for a 273 nm thick film.


2007 ◽  
Vol 48 (8) ◽  
pp. 2230-2234 ◽  
Author(s):  
Shi-Wei Chen ◽  
Ching-Yuan Bai ◽  
Cho-Chi Jain ◽  
Chau-Jie Zhan ◽  
Chun-Hao Koo

2013 ◽  
Vol 721 ◽  
pp. 33-36 ◽  
Author(s):  
Hong Cheng Pan ◽  
Xue Peng Li ◽  
Wei Hong Liu ◽  
Yan Bin Ren

ZnS thin films were deposited on indium–tin-oxide (ITO) coated glass substrates by a chemical bath deposition method. Then the ZnS/ITO slides were immersed in the solution containing 6 mM phosphate buffer solution (pH 7.4), sodium polyacrylate (0.01% w/w), and 0.24 mM AgNO3 at 37°C for 3 h to growth Ag2S films on the surface of ZnS/ITO slides. The absorption band of Ag2S/ZnS/ITO slide displays a considerably blue-shifted. The X-ray diffraction analysis demonstrated the presence of acanthite Ag2S on the surface of ZnS/ITO slides, which is consistent with the cyclic voltammetic data.


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