Vocabulary of radioanalytical methods (IUPAC Recommendations 2020)

AbstractThese recommendations are a vocabulary of basic radioanalytical terms which are relevant to radioanalysis, nuclear analysis and related techniques. Radioanalytical methods consider all nuclear-related techniques for the characterization of materials where ‘characterization’ refers to compositional (in terms of the identity and quantity of specified elements, nuclides, and their chemical species) and structural (in terms of location, dislocation, etc. of specified elements, nuclides, and their species) analyses, involving nuclear processes (nuclear reactions, nuclear radiations, etc.), nuclear techniques (reactors, accelerators, radiation detectors, etc.), and nuclear effects (hyperfine interactions, etc.). In the present compilation, basic radioanalytical terms are included which are relevant to radioanalysis, nuclear analysis and related techniques.

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Nuclear Processes Related to the Ap Stars and the Heaviest Chemical Elements

International Astronomical Union Colloquium ◽

10.1017/s0252921100080520 ◽

1976 ◽

Vol 32 ◽

pp. 169-182

Author(s):

B. Kuchowicz

Keyword(s):

Nuclear Physics ◽

Nuclear Reactions ◽

Chemical Elements ◽

Fission Products ◽

Abundance Pattern ◽

Isotopic Shifts ◽

Processed Material ◽

R Process ◽

Ap Stars ◽

Nuclear Processes

SummaryIsotopic shifts in the lines of the heavy elements in Ap stars, and the characteristic abundance pattern of these elements point to the fact that we are observing mainly the products of rapid neutron capture. The peculiar A stars may be treated as the show windows for the products of a recent r-process in their neighbourhood. This process can be located either in Supernovae exploding in a binary system in which the present Ap stars were secondaries, or in Supernovae exploding in young clusters. Secondary processes, e.g. spontaneous fission or nuclear reactions with highly abundant fission products, may occur further with the r-processed material in the surface of the Ap stars. The role of these stars to the theory of nucleosynthesis and to nuclear physics is emphasized.

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Some applications of electron beam microanalysis techniques in VLSI process evaluation

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s042482010007463x ◽

1983 ◽

Vol 41 ◽

pp. 160-161

Author(s):

Simon Thomas

Keyword(s):

Integrated Circuits ◽

Process Evaluation ◽

Large Scale ◽

Technology Development ◽

Analytical Techniques ◽

Successful Implementation ◽

Analysis Of Failures ◽

Characterization Of Materials ◽

Circuits Vlsi

Trends in the technology development of very large scale integrated circuits (VLSI) have been in the direction of higher density of components with smaller dimensions. The scaling down of device dimensions has been not only laterally but also in depth. Such efforts in miniaturization bring with them new developments in materials and processing. Successful implementation of these efforts is, to a large extent, dependent on the proper understanding of the material properties, process technologies and reliability issues, through adequate analytical studies. The analytical instrumentation technology has, fortunately, kept pace with the basic requirements of devices with lateral dimensions in the micron/ submicron range and depths of the order of nonometers. Often, newer analytical techniques have emerged or the more conventional techniques have been adapted to meet the more stringent requirements. As such, a variety of analytical techniques are available today to aid an analyst in the efforts of VLSI process evaluation. Generally such analytical efforts are divided into the characterization of materials, evaluation of processing steps and the analysis of failures.

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Applications of ultramicrotomy for materials characterization

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100147004 ◽

1993 ◽

Vol 51 ◽

pp. 232-233

Author(s):

R.T. Blackham ◽

J.J. Haugh ◽

C.W. Hughes ◽

M.G. Burke

Keyword(s):

Materials Science ◽

Microstructural Analysis ◽

Analytical Electron Microscopy ◽

Austenitic Stainless Steels ◽

Specimen Preparation ◽

Preparation Technique ◽

Thermally Induced ◽

Radiation Induced ◽

Characterization Of Materials

Essential to the characterization of materials using analytical electron microscopy (AEM) techniques is the specimen itself. Without suitable samples, detailed microstructural analysis is not possible. Ultramicrotomy, or diamond knife sectioning, is a well-known mechanical specimen preparation technique which has been gaining attention in the materials science area. Malis and co-workers and Glanvill have demonstrated the usefulness and applicability of this technique to the study of a wide variety of materials including Al alloys, composites, and semiconductors. Ultramicrotomed specimens have uniform thickness with relatively large electron-transparent areas which are suitable for AEM anaysis.Interface Analysis in Type 316 Austenitic Stainless Steel: STEM-EDS microanalysis of grain boundaries in austenitic stainless steels provides important information concerning the development of Cr-depleted zones which accompany M23C6 precipitation, and documentation of radiation induced segregation (RIS). Conventional methods of TEM sample preparation are suitable for the evaluation of thermally induced segregation, but neutron irradiated samples present a variety of problems in both the preparation and in the AEM analysis, in addition to the handling hazard.

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