X-Ray and Neutron Integrated Intensity diffracted by Perfect Crystals in Transmission

1982 ◽  
Vol 37 (5) ◽  
pp. 474-484
Author(s):  
D. Lambert ◽  
C. Malgrange

The integrated reflection power for perfect crystals has been measured with neutrons and X- Rays for different crystals in a wide range of absorption coefficients and values of |μh/μ0| where μh is the h Fourier term of the absorption coefficient. The influence of Compton effect and tem­perature factor is discussed. The results are compared to Kato’s theoretical values.

1990 ◽  
Vol 34 ◽  
pp. 325-335 ◽  
Author(s):  
Steve J. Chipera ◽  
David L. Bish

AbstractThe mass absorption coefficient is a useful parameter for quantitative characterization of materials. If the chemical composition of a sample is known, the mass absorption coefficient can be calculated directly. However, the mass absorption coefficient must be determined empirically if the chemical composition is unknown. Traditional methods for determining the mass absorption coefficient involve measuring the transmission of monochromatic X-rays through a sample of known thickness and density. Reynolds (1963,1967), however, proposed a method for determining the mass absorption coefficient by measuring the Compton or inelastic X-ray scattering from a sample using Mo radiation on an X-ray fluorescence spectrometer (XRF). With the recent advances in solid-state detectors/electronics for use with conventional powder diffractometers, it is now possible to readily determine mass absorption coefficients during routine X-ray diffraction (XRD) analyses.Using Cu Kα radiation and Reynolds’ method on a Siemens D-500 diffractometer fitted with a Kevex Si(Li) solid-state detector, we have measured the mass absorption coefficients of a suite of minerals and pure chemical compounds ranging in μ/ρ from graphite to Fe-metal (μ/ρ = 4.6-308 using Cu Kα radiation) to ±4.0% (lσ). The relationship between the known mass absorption coefficient and the inverse count rate is linear with a correlation coefficient of 0.997. Using mass absorption coefficients, phase abundances can be determined during quantitative XRD analysis without requiring the use of an internal standard, even when an amorphous component is present.


That a change of wave-length occurs in X-ray scattering was first indicated by absorption measurements with the ionisation chamber, which showed that the absorption coefficient of a light element like aluminium was slightly greater for the scattered than for the primary X-rays. Later more conclusive and direct evidence was obtained when spectrometric analysis of the scattered X-rays was made first by the ionisation and afterwards by the photographic method. This analysis disclosed the existence of an unshifted as well as the shifted line, and showed also that the latter becomes relatively more prominent with diminishing wave-length and lower atomic number of the scattering element. After the main features of the Compton effect were established by means of spectrometric measurements, however, absorption measurements with the ionisation method have again been employed for a detailed study of the phenomenon, for such measurements are much quicker than the spectrum experiments, where the final energy available is much smaller on account of the double scattering involved. As mentioned above, the absorption measurements were based on the slight increase in the absorption coefficient of a light element when the wave-length changes from the unmodified to the modified value. The much larger and sudden diminution in absorption of X-rays when the frequency is altered from the short to the long wave-length side of the critical K-absorption limit of the element used as a filter, furnishes us with an easy and convenient method of exhibiting the wave-length change in X-ray scattering. In the present paper will be described a photographic wedge photometer based on this principle, which enables the characteristics of the Compton effect to be readily observed. It may be pointed out that the same idea could no doubt be utilised also in connection with the ionisation measurements of the Compton effect.


Introduction . —Previous to the discovery of the behaviour of X-rays with regard to crystals, the most homogeneous radiation obtainable was that of the characteristic radiation of an element which is excited when that element is exposed to X-radiation of suitable hardness. These characteristic radiations are now found, however, by the new method of analysis, to be constituted of a number of radiations of different wave-lengths. Moseley, shortly after the discovery of the reflection of X-rays, showed that the characteristic radiations of most of the metals he examined consisted of two prominent wave-lengths; Bragg later found that, in the case of rhodium, palladium and silver, each of these lines could be further resolved into two components. Hence the spectra of the characteristic radiation of the K series of these elements consist of at least four different wave-lengths. The analysis of a beam of X-rays into its constituent radiations by reflection at a crystal face provides a means, therefore, of obtaining radiation of a definite wave length and of such intensity as to enable its absorption coefficient in different materials to be accurately measured. Bragg and Pierce have already measured the absorption coefficients of the two most prominent lines in the spectra of the elements Rh, Pd and Ag, in a number of metals. To make the absorption coefficient more directly comparable with other atomic characteristics, they gave their results in the form of atomic absorption coefficients: the atomic absorption coefficient expresses the proportion of the energy of an X-ray pencil which is absorbed in crossing a surface on which lies one atom to every square centimetre. The ordinary mass absorption coefficient can be calculated from this quantity by dividing it by the mass of the absorbing atom. The experimental results showed that the ratio of two absorption coefficients is independent of the wave-length of the radiation over considerable ranges, a result previously deduced by Barkla from his experiments; also, that the atomic absorption coefficient is proportional to the fourth power of the atomic number of the absorber.


2018 ◽  
Vol 620 ◽  
pp. A18 ◽  
Author(s):  
C. H. A. Logan ◽  
B. J. Maughan ◽  
M. N. Bremer ◽  
P. Giles ◽  
M. Birkinshaw ◽  
...  

Context. The XMM-XXL survey has used observations from the XMM-Newton observatory to detect clusters of galaxies over a wide range in mass and redshift. The moderate PSF (FWHM ~ 6″ on-axis) of XMM-Newton means that point sources within or projected onto a cluster may not be separated from the cluster emission, leading to enhanced luminosities and affecting the selection function of the cluster survey. Aims. We present the results of short Chandra observations of 21 galaxy clusters and cluster candidates at redshifts z > 1 detected in the XMM-XXL survey in X-rays or selected in the optical and infra-red. Methods. With the superior angular resolution of Chandra, we investigate whether there are any point sources within the cluster region that were not detected by the XMM-XXL analysis pipeline, and whether any point sources were misclassified as distant clusters. Results. Of the 14 X-ray selected clusters, 9 are free from significant point source contamination, either having no previously unresolved sources detected by Chandra or with less than about 10% of the reported XXL cluster flux being resolved into point sources. Of the other five sources, one is significantly contaminated by previously unresolved AGN, and four appear to be AGN misclassified as clusters. All but one of these cases are in the subset of less secure X-ray selected cluster detections and the false positive rate is consistent with that expected from the XXL selection function modelling. We also considered a further seven optically selected cluster candidates associated with faint XXL sources that were not classed as clusters. Of these, three were shown to be AGN by Chandra, one is a cluster whose XXL survey flux was highly contaminated by unresolved AGN, while three appear to be uncontaminated clusters. By decontaminating and vetting these distant clusters, we provide a pure sample of clusters at redshift z > 1 for deeper follow-up observations, and demonstrate the utility of using Chandra snapshots to test for AGN in surveys with high sensitivity but poor angular resolution.


2013 ◽  
Vol 46 (5) ◽  
pp. 1508-1512 ◽  
Author(s):  
Byron Freelon ◽  
Kamlesh Suthar ◽  
Jan Ilavsky

Coupling small-angle X-ray scattering (SAXS) and ultra-small-angle X-ray scattering (USAXS) provides a powerful system of techniques for determining the structural organization of nanostructured materials that exhibit a wide range of characteristic length scales. A new facility that combines high-energy (HE) SAXS and USAXS has been developed at the Advanced Photon Source (APS). The application of X-rays across a range of energies, from 10 to 50 keV, offers opportunities to probe structural behavior at the nano- and microscale. An X-ray setup that can characterize both soft matter or hard matter and high-Zsamples in the solid or solution forms is described. Recent upgrades to the Sector 15ID beamline allow an extension of the X-ray energy range and improved beam intensity. The function and performance of the dedicated USAXS/HE-SAXS ChemMatCARS-APS facility is described.


2014 ◽  
Vol 2014 ◽  
pp. 1-3 ◽  
Author(s):  
Alka Garg ◽  
Monika Tomar ◽  
Vinay Gupta

Bismuth iodide is a potentially active material for room temperature radiation detector, as it is well reported in the literature that it has both wide energy band gap and high atomic absorption coefficient. Crystalline films of high atomic number and high radiation absorption coefficient can absorb the X-rays and convert them directly into electrical charges which can be read by imaging devices. Therefore, it was proposed to grow thin films of Bismuth iodide on glass substrate using thermal evaporation technique in vacuum to avoid the inclusion of impurities in the films. The structural studies of the films were carried out using XRD and optical absorption measurement was carried out in the UV/VIS region using spectrophotometer. All Bismuth iodide films grown at room temperature are polycrystalline and show X-ray diffraction peaks at angles reported in research papers. The optical transmission spectra of BiI3 films show a high transmission of about 80% in visible region with a sharp fall near the fundamental absorption at 650 nm. Resistivity of the as-grown film was found to be around 1012 ohm-cm suitable value for X-ray detection application. Films were subjected to scanning electron microscopy to study the growth features of both as-grown and annealed films.


1975 ◽  
Vol 19 ◽  
pp. 381-391 ◽  
Author(s):  
F. Bazan ◽  
N. A. Bonner

The discovery of a very simple and useful relationship between the absorption coefficient of a particular element and the ratio of incoherent to coherent scattering by the sample containing the element is discussed. By measuring the absorption coefficients for a few elements in a few samples, absorption coefficients for many elements in an entire set of similar samples can be obtained.


2016 ◽  
Vol 12 (S329) ◽  
pp. 355-358
Author(s):  
Peter Kretschmar ◽  
Silvia Martínez-Núñez ◽  
Enrico Bozzo ◽  
Lidia M. Oskinova ◽  
Joachim Puls ◽  
...  

AbstractStrong winds from massive stars are a topic of interest to a wide range of astrophysical fields. In High-Mass X-ray Binaries the presence of an accreting compact object on the one side allows to infer wind parameters from studies of the varying properties of the emitted X-rays; but on the other side the accretor’s gravity and ionizing radiation can strongly influence the wind flow. Based on a collaborative effort of astronomers both from the stellar wind and the X-ray community, this presentation attempts to review our current state of knowledge and indicate avenues for future progress.


1986 ◽  
Vol 1 (5) ◽  
pp. 629-634 ◽  
Author(s):  
J.W. McCamy ◽  
M.J. Godbole ◽  
A.J. Pedraza ◽  
D.H. Lowndes

A simple, precise method for obtaining the average thickness of an amorphous layer formed by any surface treatment has been developed. The technique uses an x-ray diffractoeter to measure the reduction in the integrated intensity of several diffracted x-ray lines due to the near surface amorphous layer. The target material for generation of x rays is selected so that the emitted x rays are strongly absorbed by the specimen. This method permits thickness measurements down to ∼ 100 nm. It has been tested on a specimen of Fe80B20 on which an amorphous layer was produced by pulsed XeCl (308 nm) laser irradiation; the amorphous layer thickness was found to be 1.34 (∼0.1) um.


The X-ray inelastic scattering phenomena during the time-dependent perturbations are described with the aid of dynamical dispersion equations coupled with charge current in the Maxwell equations towards the appearance of the Debye-Waller factor driving the absorption coefficient, either for inelastic thermal diffusion and the Compton scattering, respectively.


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