scholarly journals Current flow mechanisms in p-i-n­ structures based on cadmium telluride

2002 ◽  
Vol 5 (1) ◽  
pp. 46-50 ◽  
Author(s):  
P.M. Gorley ◽  
Author(s):  
В.В. Трегулов ◽  
В.Г. Литвинов ◽  
А.В. Ермачихин

AbstractThe temperature dependence of the forward and reverse portions of the current–voltage characteristic and the photovoltage spectrum of a CdS/ por -Si/ p -Si semiconductor heterostructure are studied. It is found that the current-flow mechanisms are controlled by generation–recombination processes in the spacecharge region of the por -Si/ p -Si heterojunction, carrier tunneling in the por -Si film, and the model of space-charge-limited currents. A simplified version of the energy-band diagram of the heterostructure under study is proposed.


1982 ◽  
Vol 16 ◽  
Author(s):  
A. Musa ◽  
J.P. Ponpon ◽  
M. Hage-Ali

ABSTRACTOhmic and rectifying contacts on high resistivity etched P-type cadmium telluride have been studied in order to produce diode structures.For this,we have first investigated the properties of gold contacts obtained by chemical reactions of CdTe dippedin gold chloride.Both electrical characterization and structure have been analyzed as a function of the experimental conditions of the contact deposition.The results can be interpreted in terms of a current flow enhanced by tunnelling through the Au-CdTe junction and related to the structure of the interface a few tens of nanometer below the gold contact. In addition,several rectifying contacts have been investigated , in order to achieve a structure having low leakage current.


2020 ◽  
Vol 1697 ◽  
pp. 012170
Author(s):  
M A Mintairov ◽  
V V Evstropov ◽  
S A Mintairov ◽  
M V Nakhimovich ◽  
M Z Shvarts ◽  
...  

2010 ◽  
Vol 44 (6) ◽  
pp. 745-751 ◽  
Author(s):  
A. E. Belyaev ◽  
N. S. Boltovets ◽  
S. A. Vitusevich ◽  
V. N. Ivanov ◽  
R. V. Konakova ◽  
...  

2018 ◽  
Vol 52 (7) ◽  
pp. 891-896
Author(s):  
V. V. Tregulov ◽  
V. G. Litvinov ◽  
A. V. Ermachikhin
Keyword(s):  

2016 ◽  
Vol 42 (11) ◽  
pp. 1107-1109
Author(s):  
O. S. Talarico ◽  
V. V. Tregulov ◽  
V. G. Litvinov ◽  
A. V. Ermachikhin

1993 ◽  
Vol 74 (9) ◽  
pp. 5569-5574 ◽  
Author(s):  
Wei‐Nan Jiang ◽  
Umesh K. Mishra
Keyword(s):  

Author(s):  
T. J. Magee ◽  
J. Peng ◽  
J. Bean

Cadmium telluride has become increasingly important in a number of technological applications, particularly in the area of laser-optical components and solid state devices, Microstructural characterizations of the material have in the past been somewhat limited because of the lack of suitable sample preparation and thinning techniques. Utilizing a modified jet thinning apparatus and a potassium dichromate-sulfuric acid thinning solution, a procedure has now been developed for obtaining thin contamination-free samples for TEM examination.


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