scholarly journals Morphology, composition and structure of the fibers of a Chimu culture textile

MOMENTO ◽  
2022 ◽  
pp. 39-53
Author(s):  
Miguel A. Valverde-Alva ◽  
Jhenry F. Agreda-Delgado ◽  
Wilder Aldama-Reyna ◽  
Luis M. Angelats-Silva ◽  
Guillermo Gayoso-Bazán ◽  
...  
Keyword(s):  
Attenuated Total Reflection ◽  
Raw Material ◽  
Structural Quality ◽  
Spectroscopic Techniques ◽  
Northern Coast ◽  
X Ray ◽  
Composition And Structure ◽  
Cellulose Iβ ◽  
Microscopy Images

In this work we studied the microfibers of a textile (T-shirt) of the Chimú culture. This culture developed on the northern coast of Peru. To determine the raw material and structural quality of the microfibers, the results of the Chimú textile were compared with the corresponding results for the microfibers of cotton from the northern coast of Peru (native cotton). Scanning electron microscopy images revealed that the Chimú textile yarns are composed of a set of interwoven microfibers. Energy dispersive X-ray spectroscopy and pulsed laser-induced plasma spectroscopy techniques allowed the identification of characteristic cellulose atoms in the microfibers of Chimú textile and native cotton. Only for the Chimú textile, these spectroscopic techniques allowed the identification of atoms corresponding to natural dyes and powder residues. Attenuated total reflection Fourier transform infrared spectroscopy identified the same molecular bonds for the microfibers of Chimú textile and native cotton. For the microfibers of Chimú textile and native cotton, the X-ray diffractograms showed peaks characteristic of the cellulose Iβ polymorphism of  of monoclinic P21 structure. The raw material of the Chimú textile is cotton and the microfibers of this material show significant structural stability.

scholarly journals Исследование этапов превращения кремния в карбид кремния в процессе атомного замещения методами полного внешнего отражения рентгеновских лучей и рентгеновской дифрактомерии

2022 ◽  
Vol 64 (3) ◽  
pp. 326
Author(s):  
С.А. Кукушкин ◽  
А.В. Осипов ◽  
Е.В. Осипова ◽  
В.М. Стожаров
Keyword(s):  
Structural Quality ◽  
Total External Reflection ◽  
X Rays ◽  
Reflection Method ◽  
X Ray Diffraction ◽  
Modified Technique ◽  
Substitution Method ◽  
X Ray ◽  
Sic Films

X-ray diffraction and total external reflection of X-rays (X-ray reflectometry) methods were used to study the successive stages of synthesis of epitaxial SiC films on Si (100) X-ray diffraction and total external X-ray reflection (XRD) methods were used to study successive stages of synthesis of epitaxial SiC films on Si (100) surfaces, (110) and (111) surfaces by the atom substitution method. The data on the transformation evolution of (100) surfaces were studied, (110) and (111) Si, into SiC surfaces. A comparative analysis of the X-ray structural quality of the SiC layers grown on Si by the atom substitution method with the quality of SiC layers grown by Advanced Epi by the standard CVD method. A modified technique for the total outer X-ray reflection method, based on measurements of the intensity of the reflected X-rays using a special parabolic mirror. It is shown that the method of total external reflection method makes it possible to obtain important information about the degree of surface roughness of SiC layers, the evolution of their crystal structure and plasmon energy in the process of Si to SiC conversion.

Study of the structural quality of heteroepitaxial silicon-on-sapphire structures by high-resolution X-ray diffraction, X-ray reflectivity, and electron microscopy

2014 ◽  
Vol 59 (3) ◽  
pp. 315-322 ◽  
Author(s):  
A. E. Blagov ◽  
A. L. Vasiliev ◽  
A. S. Golubeva ◽  
I. A. Ivanov ◽  
O. A. Kondratev ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Structural Quality ◽  
X Ray Diffraction ◽  
X Ray

INFLUENCE OF Al MONOLAYERS ON THE PROPERTIES OF AlN LAYERS ON Si (111)

2009 ◽  
Vol 16 (01) ◽  
pp. 99-103 ◽  
Author(s):  
L. S. CHUAH ◽  
Z. HASSAN ◽  
H. ABU HASSAN
Keyword(s):  
Buffer Layers ◽  
Structural Quality ◽  
X Ray Diffraction ◽  
X Ray ◽  
Flat Surfaces ◽  
Gan On Si ◽  
Aln Buffer ◽  
Xrd Techniques ◽  
Substrate Temperatures

High-quality aluminum nitride ( AlN ) layers with full width at half maximum (FWHM) values of 11 arcmin were grown by plasma-assisted molecular-beam epitaxy on Si (111) substrates. AlN nucleation layers are being investigated for the growth of GaN on Si . Growth using AlN buffer layers leads to Al -polar films, with surfaces strongly dependent on the flux conditions used. Flat surfaces can be obtained by growing as Al -rich as possible, although Al droplets tend to form. Before starting the AlN growth, a few monolayers of Al are deposited on the substrate to avoid the formation of Si 3 N 4. X-ray diffraction (XRD) techniques were employed to determine the surface and structural quality of the layers. XRD revealed that monocrystalline AlN was obtained. Best AlN films were obtained at high substrate temperatures (875°C) and III/V ratios close to stoichiometry.

scholarly journals PENYELIDIKAN KELAYAKAN KIMIA DAN PENYEBARAN CADANGAN PASIR BESI DAERAH TIKU KABUPATEN AGAM UNTUK BAHAN BAKU SEMEN PADA PT. SEMEN PADANG

2018 ◽  
Vol 19 (1) ◽  
pp. 39-42
Author(s):  
Heri Prabowo
Keyword(s):  
Mineral Content ◽  
Mapping Method ◽  
Raw Material ◽  
Tio2 Content ◽  
Soil Layers ◽  
X Ray ◽  
Surface Data ◽  
Chemical Content ◽  
Method Analysis

The purpose of this research is to know the mineral content of iron sand and its spreading both vertically and horizontally with the purpose of providing information and data for local government of Agam district for the development and arrangement of environment along the coast. In order to obtain information about the depth of iron sand can be used geoelectric method because one of the physical properties of metal elements including iron is to have low resistivity. In this study used resistivity mapping method that aims to determine the variation of the arrangement of soil layers vertically and horizontally. The configuration used in this method is Schlumberger configuration. To know the chemical content of iron sand is done by taking samples of iron sand systematically and represented at some point. The sample was analyzed chemical composition by XRF method (X-Ray Fluorescence), then correlated with some surface data, so that the depiction of the quality of iron sand of Tiku Regency. From the interpretation of soil resistivity value on 2 paths it can be concluded that iron sand in Tiku Beach area is in depth 0 - 20 m. Chemical content of iron sand from XRF method analysis shows Fe2O3 percentage of 10 - 35%, with TiO2 content of 1 - 3%. The quality of iron sand can be used as raw material for cement maker.

scholarly journals Conjugation of Penicillin-G with Silver(I) Ions Expands Its Antimicrobial Activity against Gram Negative Bacteria

Antibiotics ◽  
2020 ◽  
Vol 9 (1) ◽  
pp. 25 ◽  
Author(s):  
Ioannis Ketikidis ◽  
Christina N. Banti ◽  
Nikolaos Kourkoumelis ◽  
Constantinos G. Tsiafoulis ◽  
Christina Papachristodoulou ◽  
...  
Keyword(s):  
Antimicrobial Activities ◽  
Attenuated Total Reflection ◽  
Penicillin G ◽  
Therapeutic Window ◽  
Spectroscopic Techniques ◽  
Gram Positive ◽  
Gram Negative ◽  
X Ray ◽  
Ft Ir

Conjugation of penicillin G (PenH) with silver(I) ions forms a new CoMeD (conjugate of metal with a drug) with formula [Ag(pen)(CH3OH)]2 (PenAg). PenAg was characterized by a plethora of physical and spectroscopic techniques, which include in the solid state m.p.; elemental analysis; X-ray fluorescence (XRF) spectroscopy; scanning electron microscopy (SEM); energy-dispersive X-ray spectroscopy (EDX); FT-IR; and in solution: attenuated total reflection spectroscopy (FT-IR-ATR), UV–Vis, 1H NMR, and atomic absorption (AA). The structure of PenAg was determined by NMR spectroscopy. Silver(I) ions coordinate to the carboxylic group of PenH, while secondary intra-molecular interactions are developed through (i) the nitrogen atom of the amide group in MeOD-d4 or (ii) the sulfur atom in the thietane ring in deuterated dimethyl sulfoxide DMSO-d6. The antibacterial activities of PenAg and the sodium salt of penicillin (PenNa) (the formulation which is clinically used) against Gram positive (Staphylococcus epidermidis (S. epidermidis) and Staphylococcus aureus (S. aureus)) and Gram negative (Pseudomonas aeruginosa (P. aeuroginosa PAO1)) bacteria were evaluated by the means of minimum inhibitory concentration (MIC), minimum bactericidal concentration (MBC), and inhibition zone (IZ). PenAg inhibits the growth of the Gram negative bacterial strain P. aeuroginosa with a MIC value of 23.00 ± 2.29 μM, in contrast to PenNa, which shows no such activity (>2 mM). The corresponding antimicrobial activities of PenAg against the Gram positive bacteria S. epidermidis and S. aureus are even better than those of PenNa. Moreover, PenAg exhibits no in vivo toxicity against Artemia salina at concentration up to 300 μΜ. The wide therapeutic window and the low toxicity, make PenAg a possible candidate for the development of a new antibiotic.

High Resolution X-ray Diffraction of GaN Grown on Sapphire Substrates

1996 ◽  
Vol 449 ◽  
Author(s):  
A. Saxler ◽  
M. A. Capano ◽  
W. C. Mitchel ◽  
P. Kung ◽  
X. Zhang ◽  
...  
Keyword(s):  
Metalorganic Chemical Vapor Deposition ◽  
Reciprocal Lattice ◽  
Chemical Vapor ◽  
Lattice Points ◽  
Structural Quality ◽  
X Ray Diffraction ◽  
X Ray ◽  
Sapphire Substrates ◽  
Primary Mechanism

ABSTRACTX-ray rocking curves are frequently used to assess the structural quality of GaN thin films. In order to understand the information given by the line shape, we need to know the primary mechanism by which the curves are broadened. The GaN films used in this study were grown by low pressure metalorganic chemical vapor deposition (MOCVD) on (00•1) sapphire substrates. GaN films with both broad and very narrow (open detector linewidth of 40 arcseconds for the (00•2) GaN reflection) rocking curves are examined in this work. Reciprocal space maps of both symmetric and asymmetric reciprocal lattice points are used to determine that the cause of the broadening of GaN rocking curves is a limited in-plane coherence length.

Characterization of CdTe:Zn:V crystals grown under microgravity conditions

2002 ◽  
Vol 17 (12) ◽  
pp. 3037-3041 ◽  
Author(s):  
V. Corregidor ◽  
V. Babentsov ◽  
J. L. Castaño ◽  
M. Fiederle ◽  
T. Feltgen ◽  
...  
Keyword(s):  
Growth Process ◽  
Structural Quality ◽  
Seed Region ◽  
Photoluminescence Spectra ◽  
Positive Role ◽  
X Ray ◽  
Microgravity Conditions

CdTe:Zn:V crystals grown by the seeded Bridgman method in microgravity conditions during the STS95-Spacelab-AGHF-1 mission and in the ground laboratory (l-g) were analyzed and compared. The results obtained clearly show that the structural quality of the space crystal is better. Density of inclusions, concentration of dislocations, and presence of stresses are lower in the microgravity-grown (μ-g) crystal. The l-g crystal contains twins and grains from the beginning of the growth process, that is, from the near-seed region. In general, the concentration of inclusions and amount of segregated impurities on the l-g crystal are larger than in the μ-g crystal. X-ray rocking curves and low-temperature photoluminescence spectra demonstrate the relatively high quality of both crystals on a microscale at the beginning of the growth and show that the l-g conditions were worse at the end. The results of this investigation demonstrate a positive role of contactless growth and μ-g conditions in the melt in suppressing the creation of inclusions and dislocations.

scholarly journals X Ray Diffraction: An Approach to Structural Quality of Biological Preserved Tissues in Tissue Banks

10.5772/33725 ◽  
2012 ◽  
Author(s):  
H. Perez ◽  
Mc. Saldias ◽  
G. Sanchez ◽  
P. Martucci ◽  
Mc. Acosta ◽  
...  
Keyword(s):  
Structural Quality ◽  
Tissue Banks ◽  
X Ray Diffraction ◽  
X Ray

scholarly journals Optical and structural studies of Hg0.7Cd0.3Te samples grown by various methods

2021 ◽  
Vol 2103 (1) ◽  
pp. 012148
Author(s):  
D A Andryushchenko ◽  
M S Ruzhevich ◽  
A M Smirnov ◽  
N L Bazhenov ◽  
K D Mynbaev
Keyword(s):  
Molar Fraction ◽  
Optoelectronic Devices ◽  
Considerable Degree ◽  
Structural Quality ◽  
Structural Studies ◽  
X Ray Diffraction ◽  
X Ray ◽  
Alloy Disorder ◽  
Photoluminescence Studies

Abstract Photoluminescence and X-ray diffraction (XRD) were used for the studies of the properties of HgCdTe samples with CdTe molar fraction x=0.3 grown by various methods. According to the results of photoluminescence studies, all samples possessed a considerable degree of alloy disorder, yet the scale of the disorder seemed not to be directly related to the structural quality of the material as revealed using XRD. Prospects of using HgCdTe material grown by various methods in optoelectronic devices are discussed.

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