New method for rapid determination of crystal orientation via Kikuchi patterns

1995 ◽  
Vol 10 (12) ◽  
pp. 3026-3036
Author(s):  
G.P.E.M. Van Bakel ◽  
D.N. Seidman
Keyword(s):  
Electron Microscopy ◽  
Root Mean Square ◽  
Measurement Errors ◽  
Rapid Determination ◽  
New Method ◽  
Complete Analysis ◽  
Mean Square ◽  
Crystal Orientations ◽  
Diffraction Patterns ◽  
Projection Center

Kikuchi electron diffraction patterns are used extensively to determine crystal orientations via transmission electron microscopy (TEM) or in the electron backscattering pattern (EBSP) mode of scanning electron microscopy (SEM). A new method is presented that is capable of finding crystal orientations, the camera length, and the projection center from only one pattern per grain using a least-squares technique. This method eliminates the need to perform an alignment with a reference crystal in the backscattering mode. Application to a Σ = 13a silicon bicrystal is presented for TEM patterns and EBSP's. A complete analysis of the propagation of random measurement errors into the disorientation axis/angle pair is carried out. The root mean square deviation from the nominal disorientation angle is found to be 0.3°in the case of TEM and 0.5°in the case of EBSP. The root mean square inclination between the nominal and measured disorientation axis is found to be 1°in the case of TEM and 0.5°in the case of EBSP.

Reduction of Forced Vibration Response by Optimum Balance of Linkage and Optimum Design of System

1997 ◽  
Author(s):  
She-min Zhang ◽  
Nobuyoshi Morita ◽  
Takao Torii
Keyword(s):  
Objective Function ◽  
Root Mean Square ◽  
Forced Vibration ◽  
Vibration Response ◽  
New Method ◽  
Mean Square ◽  
Design Variables ◽  
Calculation Results ◽  
Angular Velocities ◽  
Optimum Balance

Abstract This paper proposes a new method to reduce the forced vibration response of frame of linkage. It is that the root-mean-square (RMS) value of binary maximum (Bmax) of forced vibration response at a series of angular velocities is taken as the objective function, and the counterweight mass parameters of links and the stiffness factors are used as design variables. Then, it is found out that the responses are related not only to the Bmax value of shaking forces, but also to the shape of curve of shaking forces. The calculation results are compared with those of two other methods used in the reduction of forced vibration response by optimized balance of linkages, and it is shown that the new method can significantly reduce the responses of frame of linkage.

Comparison of the evaluation of measurement errors by their entropy, root-mean-square, and boundary values

1966 ◽  
Vol 9 (9) ◽  
pp. 1130-1135 ◽  
Author(s):  
P. V. Novitskii ◽  
I. A. Nazarov ◽  
V. Ya. Ivanova ◽  
G. A. Kondrashova
Keyword(s):  
Root Mean Square ◽  
Measurement Errors ◽  
Mean Square ◽  
Boundary Values

A NEW METHOD FOR CALCULATING THE FRACTAL DIMENSION OF SURFACE TOPOGRAPHY

Fractals ◽  
2015 ◽  
Vol 23 (03) ◽  
pp. 1550022 ◽  
Author(s):  
XUE ZUO ◽  
HUA ZHU ◽  
YUANKAI ZHOU ◽  
YAN LI
Keyword(s):  
Fractal Dimension ◽  
Root Mean Square ◽  
Relative Error ◽  
New Method ◽  
Variation Method ◽  
Triangular Prism ◽  
Mean Square ◽  
Fractal Function ◽  
Fractal Curve ◽  
Machined Surfaces

A new method termed as three-dimensional root-mean-square (3D-RMS) method, is proposed to calculate the fractal dimension (FD) of machined surfaces. The measure of this method is the root-mean-square value of surface data, and the scale is the side length of square in the projection plane. In order to evaluate the calculation accuracy of the proposed method, the isotropic surfaces with deterministic FD are generated based on the fractional Brownian function and Weierstrass–Mandelbrot (WM) fractal function, and two kinds of anisotropic surfaces are generated by stretching or rotating a WM fractal curve. Their FDs are estimated by the proposed method, as well as differential boxing-counting (DBC) method, triangular prism surface area (TPSA) method and variation method (VM). The results show that the 3D-RMS method performs better than the other methods with a lower relative error for both isotropic and anisotropic surfaces, especially for the surfaces with dimensions higher than 2.5, since the relative error between the estimated value and its theoretical value decreases with theoretical FD. Finally, the electrodeposited surface, end-turning surface and grinding surface are chosen as examples to illustrate the application of 3D-RMS method on the real machined surfaces. This method gives a new way to accurately calculate the FD from the surface topographic data.

Fast Determination of Dioscin in Dioscorea zingiberensis C.H.Wright by PLS-NIR Spectroscopy

2013 ◽  
Vol 807-809 ◽  
pp. 2079-2084 ◽  
Author(s):  
Cai Xia Xie ◽  
Rui Liu ◽  
Hai Yan Gong ◽  
Jing Wei Lei ◽  
Xiao Yan Duan ◽  
...  
Keyword(s):  
Infrared Spectroscopy ◽  
Root Mean Square ◽  
Near Infrared Spectroscopy ◽  
Near Infrared ◽  
Cross Validation ◽  
Rapid Determination ◽  
Nir Spectroscopy ◽  
Calibration Model ◽  
Mean Square ◽  
Dioscorea Zingiberensis

A rapid determination method was builded about content of dioscin in Dioscorea zingiberensis C. H. Wright by near-infrared spectroscopy (NIRS) technology. The calibration model were builded through comparison of the content of dioscin in Dioscorea zingiberensis C. H. Wright and the near infrared spectroscopy of Dioscorea zingiberensis C. H. Wright with partial least squares. The internal correlation coefficient of cross-validation (R2) was 0.99208, root-mean-square error of cross-validation (RMSECV) was 0.0104, and external root mean square prediction deviation RMSEP was 0.0105, and the predictive value of the aversge relative error was 4.12%.

Electron microscopy and diffraction studies of polyimides

1983 ◽  
Vol 41 ◽  
pp. 28-29
Author(s):  
O.C. de Hodgins ◽  
K. R. Lawless ◽  
R. Anderson
Keyword(s):  
Electron Microscopy ◽  
Electron Microscope ◽  
Structural Features ◽  
Inert Atmosphere ◽  
Polyimide Films ◽  
Resolution Electron ◽  
The Matrix ◽  
High Resolution Electron Microscope ◽  
Diffraction Patterns ◽  
Polymeric Samples

Commercial polyimide films have shown to be homogeneous on a scale of 5 to 200 nm. The observation of Skybond (SKB) 705 and PI5878 was carried out by using a Philips 400, 120 KeV STEM. The objective was to elucidate the structural features of the polymeric samples. The specimens were spun and cured at stepped temperatures in an inert atmosphere and cooled slowly for eight hours. TEM micrographs showed heterogeneities (or nodular structures) generally on a scale of 100 nm for PI5878 and approximately 40 nm for SKB 705, present in large volume fractions of both specimens. See Figures 1 and 2. It is possible that the nodulus observed may be associated with surface effects and the structure of the polymers be regarded as random amorphous arrays. Diffraction patterns of the matrix and the nodular areas showed different amorphous ring patterns in both materials. The specimens were viewed in both bright and dark fields using a high resolution electron microscope which provided magnifications of 100,000X or more on the photographic plates if desired.

Zero-loss omega-filtered REM and RHEED on the new Zeiss 912

1991 ◽  
Vol 49 ◽  
pp. 616-617
Author(s):  
J.C.H. Spence ◽  
J. Mayer
Keyword(s):  
Electron Microscopy ◽  
Materials Science ◽  
Surface States ◽  
Ccd Camera ◽  
Dark Field ◽  
Ion Pump ◽  
Magnetic Imaging ◽  
Reflection Electron Microscopy ◽  
Diffraction Patterns ◽  
Large Background

The Zeiss 912 is a new fully digital, side-entry, 120 Kv TEM/STEM instrument for materials science, fitted with an omega magnetic imaging energy filter. Pumping is by turbopump and ion pump. The magnetic imaging filter allows energy-filtered images or diffraction patterns to be recorded without scanning using efficient parallel (area) detection. The energy loss intensity distribution may also be displayed on the screen, and recorded by scanning it over the PMT supplied. If a CCD camera is fitted and suitable new software developed, “parallel ELS” recording results. For large fields of view, filtered images can be recorded much more efficiently than by Scanning Reflection Electron Microscopy, and the large background of inelastic scattering removed. We have therefore evaluated the 912 for REM and RHEED applications. Causes of streaking and resonance in RHEED patterns are being studied, and a more quantitative analysis of CBRED patterns may be possible. Dark field band-gap REM imaging of surface states may also be possible.

Selective Sampling and Orientation of Non-Homogeneous Tissues

1968 ◽  
Vol 26 ◽  
pp. 98-99
Author(s):  
C. C. Clawson ◽  
L. W. Anderson ◽  
R. A. Good
Keyword(s):  
Electron Microscopy ◽  
Electron Microscope ◽  
Light Microscopy ◽  
Random Sampling ◽  
New Method ◽  
Microscope Examination ◽  
Small Areas ◽  
Selective Sampling ◽  
Large Numbers ◽  
Specific Orientation

Investigations which require electron microscope examination of a few specific areas of non-homogeneous tissues make random sampling of small blocks an inefficient and unrewarding procedure. Therefore, several investigators have devised methods which allow obtaining sample blocks for electron microscopy from region of tissue previously identified by light microscopy of present here techniques which make possible: 1) sampling tissue for electron microscopy from selected areas previously identified by light microscopy of relatively large pieces of tissue; 2) dehydration and embedding large numbers of individually identified blocks while keeping each one separate; 3) a new method of maintaining specific orientation of blocks during embedding; 4) special light microscopic staining or fluorescent procedures and electron microscopy on immediately adjacent small areas of tissue.

Effects of High-Energy Ions on Synthetic Quartz

1972 ◽  
Vol 30 ◽  
pp. 544-545
Author(s):  
Joseph J. Comer ◽  
Charles Bergeron ◽  
Lester F. Lowe
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Beam ◽  
High Energy ◽  
Transmission Electron ◽  
Kikuchi Lines ◽  
High Energy Ions ◽  
Diffraction Patterns ◽  
Dauphiné Twinning ◽  
Beam Damage

Using a Van De Graaff Accelerator thinned specimens were subjected to bombardment by 3 MeV N+ ions to fluences ranging from 4x1013 to 2x1016 ions/cm2. They were then examined by transmission electron microscopy and reflection electron diffraction using a 100 KV electron beam.At the lowest fluence of 4x1013 ions/cm2 diffraction patterns of the specimens contained Kikuchi lines which appeared somewhat broader and more diffuse than those obtained on unirradiated material. No damage could be detected by transmission electron microscopy in unannealed specimens. However, Dauphiné twinning was particularly pronounced after heating to 665°C for one hour and cooling to room temperature. The twins, seen in Fig. 1, were often less than .25 μm in size, smaller than those formed in unirradiated material and present in greater number. The results are in agreement with earlier observations on the effect of electron beam damage on Dauphiné twinning.

Electron Microscopic Characterization and Quantitation of Air Borne Particulate Matter with Special Emphasis on Asbestos

1972 ◽  
Vol 30 ◽  
pp. 356-357
Author(s):  
Peter K. Mueller ◽  
Glenn R. Smith ◽  
Leslie M Carpenter ◽  
Ronald L. Stanley
Keyword(s):  
Electron Microscopy ◽  
Light And Electron Microscopy ◽  
Ambient Air ◽  
Quality Standard ◽  
Primary Objective ◽  
Cellulose Ester ◽  
Main Concept ◽  
Electron Microscopic ◽  
Air Samples ◽  
Diffraction Patterns

At the present time the primary objective of the electron microscopy group of the Air and Industrial Hygiene Laboratory is the development of a method suitable for use in establishing an air quality standard for asbestos in ambient air and for use in its surveillance. The main concept and thrust of our approach for the development of this method is to obtain a true picture of fiber occurrence as a function of particle size and asbestos type utilizing light and electron microscopy.We have now available an electron micrographic atlas of all asbestos types including selected area diffraction patterns and examples of fibers isolated from air samples. Several alternative approaches for measuring asbestos in ambient air have been developed and/or evaluated. Our experiences in this regard will be described. The most promising method involves: 1) taking air samples on cellulose ester membrane filters with a nominal pore size of 0.8 micron; 2) ashing in a low temperature oxygen plasma for several hours;

Resolution assessment from spectral signal-to-noise ratios

1987 ◽  
Vol 45 ◽  
pp. 746-747
Author(s):  
M. Unser ◽  
B.L. Trus ◽  
A.C. Steven
Keyword(s):  
Electron Microscopy ◽  
Limiting Factor ◽  
Biological Macromolecules ◽  
Signal To Noise ◽  
Differential Phase ◽  
Traditional Measure ◽  
Spectral Signal ◽  
Two Measures ◽  
Diffraction Patterns ◽  
Averaging Techniques

Since the resolution-limiting factor in electron microscopy of biological macromolecules is not instrumental, but is rather the preservation of structure, operational definitions of resolution have to be based on the mutual consistency of a set of like images. The traditional measure of resolution for crystalline specimens in terms of the extent of periodic reflections in their diffraction patterns is such a criterion. With the advent of correlation averaging techniques for lattice rectification and the analysis of non-crystalline specimens, a more general - and desirably, closely compatible - resolution criterion is needed. Two measures of resolution for correlation-averaged images have been described, namely the differential phase residual (DPR) and the Fourier ring correlation (FRC). However, the values that they give for resolution often differ substantially. Furthermore, neither method relates in a straightforward way to the long-standing resolution criterion for crystalline specimens.

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