In situ X-ray Investigation of Hydrogen Charging in Thin Film Bimetallic Electrodes

1997 ◽  
Vol 12 (8) ◽  
pp. 2091-2098 ◽  
Author(s):  
Najeh M. Jisrawi ◽  
Harold Wiesmann ◽  
M. W. Ruckman ◽  
T. R. Thurston ◽  
G. Reisfeld ◽  
...  
Keyword(s):  
Thin Film ◽  
Cyclic Voltammetry ◽  
Hydrogen Uptake ◽  
Metallic Films ◽  
X Ray Diffraction ◽  
Cell Potential ◽  
Multilayered Thin Film ◽  
X Ray ◽  
Multilayer Electrode

Hydrogen uptake and discharge by thin metallic films under potentiostatic control was studied using x-ray diffraction at the National Synchroton Light Source (NSLS). The formation of metal-hydrogen phases in Pd, Pd-capped Nb, and Pd/Nb multilayer electrode structures was deduced from x-ray diffraction data and correlated with the cyclic voltammetry (CV) peaks. The x-ray data were also used to construct a plot of the hydrogen concentration as a function of cell potential for a multilayered thin film.

Nanoscale mechanics of thermally crystallized GST thin film by in situ x-ray diffraction

2020 ◽  
Vol 128 (23) ◽  
pp. 235107
Author(s):  
Frederic Fillot ◽  
Chiara Sabbione
Keyword(s):  
Thin Film ◽  
X Ray Diffraction ◽  
X Ray ◽  
Nanoscale Mechanics

Growth of Epitaxial a-Axis and c-Axis Oriented Sr2RuO4 Films

1995 ◽  
Vol 401 ◽  
Author(s):  
S. Madhavan ◽  
B. J. Gibbons ◽  
A. Dabkowski ◽  
H. A. Dabkowska ◽  
S. Trolier-Mckinstry ◽  
...  
Keyword(s):  
Pulsed Laser Deposition ◽  
Pulsed Laser ◽  
Epitaxial Films ◽  
Temperature Measurements ◽  
Laser Deposition ◽  
Metallic Films ◽  
X Ray Diffraction ◽  
X Ray ◽  
Oriented Films

AbstractEpitaxial films of Sr2RuO4 have been grown in situ by pulsed laser deposition on (100) LaAlO3 and (100) LaSrGaO4 substrates. X-ray diffraction results show that the films are single domain and grow c-axis oriented on (100) LaAlO3 and a-axis oriented on (100) LaSrGaO4 substrates. X-ray ø-scans indicate epitaxial alignment of the film and substrate in-plane axes in both cases. Resistivity versus temperature measurements reveal that the as-grown c-axis oriented films are semiconducting and the a-axis oriented films are metallic. The metallic films grown so far were found to be non-superconducting down to 50 mK.

Electromechanical Properties of Pb(Mg1/3Nb2/3)O3 Thin Film Capacitors

1998 ◽  
Vol 541 ◽  
Author(s):  
G. Catalan ◽  
M.H. Corbett ◽  
R.M. Bowman ◽  
J.M. Gregg
Keyword(s):  
Thin Film ◽  
Compressive Strain ◽  
X Ray Diffraction ◽  
Leakage Currents ◽  
Plan View ◽  
X Ray ◽  
Thin Film Capacitors ◽  
Transmission Electron ◽  
Tensile Strains

AbstractPulsed Laser Deposition was used to grow Pb(Mg1/3Nb2/3)O3 (PMN) thin film planar capacitor structures. PMN crystallography was verified by x-ray diffraction and plan-view Transmission Electron Microscopy (TEM). Capacitance of the thin film structures was measured as a function of temperature and frequency. Leakage current was also measured for each capacitor. A DC field was subsequently applied and crystallographic strain was monitored in-situ by X-ray diffraction. The electromechanical strain was found to strongly depend on the deposition conditions for each capacitor. Tensile strains of ∼0.2% and compressive strains of ∼0.3% parallel to the applied field were measured for capacitors of different oxygen contents and thicknesses. We propose that the compressive strain is caused by the combined effect of joule heating of the capacitor structure, caused by large leakage currents, and epitaxial coupling between substrate and films. Electrostrictive tensile strains are of the same order as observed inbulk.

In situ high temperature X-ray diffraction studies of ZnO thin film

2011 ◽  
Vol 20 (9) ◽  
pp. 096102 ◽  
Author(s):  
Xiang-Cun Chen ◽  
Jie-Ping Zhou ◽  
Hai-Yang Wang ◽  
Peng-Shou Xu ◽  
Guo-Qiang Pan
Keyword(s):  
Thin Film ◽  
High Temperature ◽  
Zno Thin Film ◽  
X Ray Diffraction ◽  
X Ray

In-situ study of Ni–Ti thin film growth on a TiN intermediate layer by X-ray diffraction

2007 ◽  
Vol 126 (1) ◽  
pp. 332-337 ◽  
Author(s):  
R MARTINS ◽  
N SCHELL ◽  
R SILVA ◽  
L PEREIRA ◽  
K MAHESH ◽  
...  
Keyword(s):  
Thin Film ◽  
Intermediate Layer ◽  
Film Growth ◽  
Thin Film Growth ◽  
X Ray Diffraction ◽  
X Ray ◽  
In Situ Study

In situ structural analysis of BPDA-PPD polyimide thin film using two-dimensional grazing incidence X-ray diffraction

2008 ◽  
Vol 23 (2) ◽  
pp. 109-112 ◽  
Author(s):  
J. Kikuma ◽  
T. Nayuki ◽  
T. Ishikawa ◽  
S. Matsuno ◽  
G. Asano
Keyword(s):  
Thin Film ◽  
Grazing Incidence ◽  
Molecular Chain ◽  
Curing Temperature ◽  
Two Dimensional ◽  
X Ray Diffraction ◽  
Cooling Process ◽  
X Ray ◽  
Plane Direction

Structural development of BPDA-PPD polyimide thin film has been investigated by in situ grazing incidence X-ray diffraction at the BL24XU beamline of the SPring-8. Optimizing the sample shape, two-dimensional images were measured successfully without sacrificing angle resolution. It has been clearly shown that the crystallization first begins in the in-plane direction, at the curing temperature of 180 °C, in which the periodic structure of the molecular chain axis (c axis) is developed. The crystallization in the surface normal (out-of-plane) direction is observed later, at the curing temperature above 300 °C. A slight increase of the d spacing of the c axis during heating process has been observed, suggesting the stretching of the contracted molecular chain in accordance with the curing process. In the cooling process, the decrease of the d spacings for a and b axes was considerable, which indicates thermal expansion of the crystals at high temperatures. The increases in the peak intensities during the cooling process have been observed, which indicate the d spacing of each axis becomes close to the equilibrium value to produce higher periodicity.

Electrodeposition of Nanocrystalline CoNiFe Thin Films Prepared by Cyclic Voltammetry

2009 ◽  
Vol 620-622 ◽  
pp. 731-734 ◽  
Author(s):  
Chao Cai ◽  
Qiu Ping Wang ◽  
Zhao Zhang ◽  
Jian Feng Yang
Keyword(s):  
Thin Film ◽  
Cyclic Voltammetry ◽  
Growth Process ◽  
Magnetic Flux Density ◽  
Magnetic Thin Film ◽  
X Ray Diffraction ◽  
Soft Magnetic ◽  
X Ray ◽  
Xrd Techniques ◽  
Scanning Electron

The electroplating behavior of nanocrystalline CoNiFe soft magnetic thin film with high saturation magnetic flux density and low coercivity was investigated using cyclic voltammetry and chronoamperometry methods in conjunction with the scanning electron microscopy (SEM/EDX) and X-ray diffraction (XRD) techniques. The results show that, the co-deposition of CoNiFe alloy behaves anomalously. And the nucleation/growth process of CoNiFe ternary alloy followed 3D instantaneous mechanism at higher potentials, while in the case of lower potentials it followed 3D progressive mechanism.

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