Tensile testing low density multilayers: Aluminum/titanium

1998 ◽  
Vol 13 (10) ◽  
pp. 2902-2909 ◽  
Author(s):  
D. Josell ◽  
D. van Heerden ◽  
D. Read ◽  
J. Bonevich ◽  
D. Shechtman
Keyword(s):  
Thin Films ◽  
Yield Stress ◽  
Tensile Testing ◽  
Tensile Tests ◽  
Uniaxial Tensile ◽  
Low Density ◽  
Multilayer Thin Films ◽  
Bilayer Thickness ◽  
Relationship Of ◽  
The Relationship

Yield stresses, ultimate tensile strengths, and specific strengths of aluminum/titanium multilayer thin films are determined from the results of uniaxial tensile tests. The plasticity in the stress-strain curves, the nature of the fracture surfaces, and the relationship of the yield stress and the bilayer thickness are discussed. Properties are compared with those of other multilayer materials published in the literature.

Tensile Tests of Low Density Multilayer Thin Films

1995 ◽  
Vol 403 ◽  
Author(s):  
D. van Heerden ◽  
D. Josell ◽  
D. Shechtman
Keyword(s):  
Thin Films ◽  
Tensile Tests ◽  
Low Density ◽  
Multilayer Thin Films ◽  
Free Standing ◽  
Aerospace Applications ◽  
Transmission Electron ◽  
Film Hardness ◽  
Potential Use ◽  
Mechanical Studies

AbstractAlthough mechanical studies of multilayer thin films are increasingly more abundant, the majority of studies merely determine film hardness using micro- or nanoindentation techniques. Actual tensile tests are still quite rare. We have therefore conducted tensile tests of free standing aluminum-titanium multilayer thin films. This system was selected for its potential use as a low density (3.3 g/cm3) structural material with potential aerospace applications. The strongest multilayers produced, with bilayer thicknesses 7nm Ti/16 nm Al, fractured at tensile stresses (UTS) of 900 MPa - well beyond the UTS of either of the constituent materials. Specimen characterization by xray diffraction as well as transmission electron microscopy (TEM) revealed near perfect texturing and an intriguing hcp to fec transformation of the titanium layers during preparation of samples for TEM viewing.

scholarly journals On the relationship of magnetocrystalline anisotropy and stoichiometry in epitaxial L10 CoPt (001) and FePt (001) thin films

2005 ◽  
Vol 98 (3) ◽  
pp. 033904 ◽  
Author(s):  
K. Barmak ◽  
J. Kim ◽  
L. H. Lewis ◽  
K. R. Coffey ◽  
M. F. Toney ◽  
...  
Keyword(s):  
Thin Films ◽  
Magnetocrystalline Anisotropy ◽  
Relationship Of ◽  
The Relationship

A Novel MEMS-Based Technique for In-Situ Characterization of Freestanding Nanometer Scale Thin Films Inside SEM and TEM

2001 ◽  
Author(s):  
M. A. Haque ◽  
M. T. A. Saif
Keyword(s):  
Thin Films ◽  
Tensile Testing ◽  
Uniaxial Tensile ◽  
Aluminum Specimen ◽  
Sem And Tem ◽  
Uniaxial Tensile Testing ◽  
Testing Facility ◽  
Film Specimen ◽  
On Chip

Abstract We present a MEMS-based technique for in-situ uniaxial tensile testing of freestanding thin films inside SEM and TEM. It integrates a freestanding thin film specimen with MEMS force sensors and structures to produce an on-chip tensile testing facility. Cofabrication of the specimen with force and displacement measuring mechanisms produces the following unique features: 1) Quantitative experimentation can be carried out in both SEM and TEM, 2) No extra gripping mechanism is required, 3) Specimen misalignment can be eliminated, 4) Pre-stress in specimen can be determined, and 5) Specimens with micrometer to nanometer thickness can be tested. We demonstrate the technique by testing a 200-nanometer thick Aluminum specimen in-situ in SEM. Significant strengthening and anelasticity were observed at this size scale.

On the relationship of high coercivity and L10 ordered phase in CoPt and FePt thin films

1999 ◽  
Vol 86 (8) ◽  
pp. 4527-4533 ◽  
Author(s):  
R. A. Ristau ◽  
K. Barmak ◽  
L. H. Lewis ◽  
K. R. Coffey ◽  
J. K. Howard
Keyword(s):  
Thin Films ◽  
High Coercivity ◽  
Relationship Of ◽  
The Relationship ◽  
Fept Thin Films

The relationship of yield stress minima to the apparent isoelectric temperature in LiF

1972 ◽  
Vol 6 (12) ◽  
pp. 1129-1132 ◽  
Author(s):  
C. Norman Ahlquist ◽  
Lennart Carlsson
Keyword(s):  
Yield Stress ◽  
Relationship Of ◽  
The Relationship

On the Temperature-Related Mechanical Properties of UV-LIGA Nickel Material

2015 ◽  
Vol 645-646 ◽  
pp. 926-930 ◽  
Author(s):  
Shuang Shi Yuan ◽  
Guang He ◽  
Ming Zhang ◽  
Guo Zhong Li
Keyword(s):  
Mechanical Properties ◽  
Elastic Modulus ◽  
Yield Stress ◽  
Environmental Temperature ◽  
Experimental System ◽  
Failure Stress ◽  
Uniaxial Tensile ◽  
Mechanical Parameters ◽  
Static Mechanical ◽  
The Relationship

MEMS nickel material is commonly used for structural material in micro devices. In order to study the effect of environmental temperature on its mechanical properties,this paper has built up a experimental system which can measure the temperature-related static mechanical parameters of the UV-LIGA nickel material. By using the system for uniaxial tensile experiments of the micro specimen under different temperature, the stress-strain curves of the micro specimen under different temperature were obtained; the mechanical parameters of the micro specimen such as elastic modulus, yield stress and failure stress under different temperature were also calculated out;Finally, the relationship between temperature and mechanical parameters including elastic modulus, yield stress and failure stress was analyzed.

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