Evaluation of Anti-Phase-Boundaries in GaAs/Si Heterostructures by Transmission Electron Microscopy
Keyword(s):
ABSTRACTThe nature and behavior of anti-phase-boundaries in GaAs/Si heterostructures using GaP, GaP/GaAsP and GaAsP/GaAs strained layer superlattices as intermediate buffer layers, have been investigated by transmission electron microscopy. It has been found that anti-phasedomains are very complicated three dimensional polygons consisting of several sub-boundaries in different orientations. Self-annihilation of anti-phase-domains during crystal growth of GaAs on (001)just or (001)2°off Si substrates is directly observed for the first time through planview and cross-sectional observations. Based on these findings, a mechanism of annihilation of these domains is proposed.
1987 ◽
Vol 1
(2)
◽
pp. 322-329
◽
2008 ◽
Vol 381-382
◽
pp. 525-528
◽
1990 ◽
Vol 48
(4)
◽
pp. 678-679
2002 ◽
Vol 17
(4)
◽
pp. 784-789
◽