Deep Level Luminescence in InP: Phonon Feature Analysis

1989 ◽  
Vol 163 ◽  
Author(s):  
S. Banerjee ◽  
A.K. Srivastava ◽  
B.M. Arora
Keyword(s):  
Deep Level ◽  
Feature Analysis ◽  
Native Defects ◽  
Fe And Mn ◽  
Coordinate Model ◽  
First Time ◽  
Configuration Coordinate

AbstractThe phonon features in the deep level luminescence (PL) bands related to Fe and Mn and native defects in InP have been clearly identified and the lineshape of the bands are analysed using configuration coordinate model. A consistent set of phonon parameters are determined for the first time.

Bistable Defects Induced in GaAs by H2 Plasma Process

1989 ◽  
Vol 146 ◽  
Author(s):  
X. Boddaert ◽  
D. Vuillaume ◽  
D. Stievenard ◽  
J.C. Bourgoin ◽  
P. Boher
Keyword(s):  
Deep Level Transient Spectroscopy ◽  
Deep Level ◽  
Plasma Process ◽  
Stable States ◽  
Native Defects ◽  
Complete Determination ◽  
Lec Gaas ◽  
Transient Spectroscopy ◽  
Configuration Coordinate

ABSTRACTWe have studied the effect of an H2 plasma (150 W; 150°C; 10, 20, 50, 100 s) on unannealed and annealed (850°C, AsH3 atmosphere) LEC GaAs material. Using Deep Level Transient Spectroscopy, we have shown that the plasma induces a main bistable defect DO, which has two possible stable states Dl and D2. A complete determination of the corresponding Configuration Coordinate Diagram has been done. Finally, no correlation has been obtained between DO and the native defects EL6, EL3 and EL2. No passivation of the EL2 defect has been observed and the evolution of the D0 concentration results from the association of hydrogen with AsGa. These observations are in disagreement with the identification of EL2 with an isolated AsGa.

Carbon-related Deep States in Compensated n-type and Semi-Insulating GaN:C and their Influence on Yellow Luminescence

2004 ◽  
Vol 831 ◽  
Author(s):  
A. Armstrong ◽  
D. Green ◽  
A. R. Arehart ◽  
U. K. Mishra ◽  
J. S. Speck ◽  
...  
Keyword(s):  
Deep Level Transient Spectroscopy ◽  
Deep Level ◽  
Yellow Luminescence ◽  
Physical Origin ◽  
Co Doping ◽  
Coordinate Model ◽  
Transient Spectroscopy ◽  
Franck Condon ◽  
Co Doped ◽  
Configuration Coordinate

ABSTRACTThe physical origin of the yellow luminescence in MBE-grown GaN co-doped with C and Si was investigated. Deep level optical spectroscopy (DLOS), deep level transient spectroscopy (DLTS), and photoluminescence (PL) were used to study the deep level spectrum as a function of C incorporation. In the absence of C co-doping, samples were n-type and demonstrated a weak yellow luminescence band, likely related to VGa. For increasing C co-doping, samples became semi-insulating concurrent with increased intensity of the yellow luminescence and the concentration of C-related deep acceptors. The DLOS results were used to develop a configuration-coordinate model for a C-related deep level with optical ionization energy of 3.0 eV and Franck-Condon shift of 0.4 eV that is consistent with the observed yellow luminescence and DLTS results. From these findings, a general model for independent mechanisms of the yellow luminescence related to VGa for n-type GaN and C for n-type and semi-insulating GaN:C:Si is discussed.

Properties of the EL2 Level in Organometallic Ga1−xAlxAs

1987 ◽  
Vol 104 ◽  
Author(s):  
A. Ben Cherifa ◽  
R. Azoulay ◽  
G. Guillot
Keyword(s):  
Vapor Deposition ◽  
Deep Level Transient Spectroscopy ◽  
Metalorganic Chemical Vapor Deposition ◽  
Deep Level ◽  
Chemical Vapor ◽  
Electron Trap ◽  
Quenching Effect ◽  
Deep Electron Trap ◽  
Transient Spectroscopy ◽  
First Time

ABSTRACTWe have studied by means of deep level transient spectroscopy and photocapacitance measurements deep electron traps in undoped Ga1−xAlxAs of n-type grown by metalorganic chemical vapor deposition with 0≤x≤ 0.3. A dominant deep electron trap is detected in the series of alloys. Its activation energy is found at EC-0.8 eV in GaAs and it increases with x. Its concentration is found nearly independent of x. For the first time we observed for this level in the Ga1−xAlxAs alloys, the photocapacitance quenching effect typical for the EL2 defect in GaAs thus confirming clearly that EL2 is also created in MOCVD Ga1−xAlxAs.

Evidence for Metastabile State of DX Center in AxGa1-xAs

1992 ◽  
Vol 262 ◽  
Author(s):  
Subhasis Ghosh ◽  
Vikram Kumar
Keyword(s):  
Activation Energy ◽  
Deep Level Transient Spectroscopy ◽  
Thermal Activation ◽  
Deep Level ◽  
Thermal Activation Energy ◽  
Dx Centers ◽  
Dx Center ◽  
Transient Spectroscopy ◽  
Silicon Doped ◽  
First Time

ABSTRACTPhoto-Deep Level Transient Spectroscopy with 1.38 eV light reveals a new level with thermal activation energy 0.2 eV of DX centers in silicon doped Alx Ga1-xAs (x = 0.26) for the first time. The observation of this level directly proves the negative-U properties of DX centers and the existence of thermodynamically metastable state DX.

scholarly journals Chemical trends of deep levels in van der Waals semiconductors

2020 ◽  
Vol 11 (1) ◽  
Author(s):  
Penghong Ci ◽  
Xuezeng Tian ◽  
Jun Kang ◽  
Anthony Salazar ◽  
Kazutaka Eriguchi ◽  
...  
Keyword(s):  
Deep Level ◽  
Energy Levels ◽  
Van Der Waals ◽  
Deep Levels ◽  
Persistent Photoconductivity ◽  
Sulfur Vacancy ◽  
Native Defects ◽  
Crystal Imperfections ◽  
Dx Center ◽  
Chemical Trends

AbstractProperties of semiconductors are largely defined by crystal imperfections including native defects. Van der Waals (vdW) semiconductors, a newly emerged class of materials, are no exception: defects exist even in the purest materials and strongly affect their electrical, optical, magnetic, catalytic and sensing properties. However, unlike conventional semiconductors where energy levels of defects are well documented, they are experimentally unknown in even the best studied vdW semiconductors, impeding the understanding and utilization of these materials. Here, we directly evaluate deep levels and their chemical trends in the bandgap of MoS2, WS2 and their alloys by transient spectroscopic study. One of the deep levels is found to follow the conduction band minimum of each host, attributed to the native sulfur vacancy. A switchable, DX center - like deep level has also been identified, whose energy lines up instead on a fixed level across different hosts, explaining a persistent photoconductivity above 400 K.

Ge Related Defect-Complex Induced Luminescence in InGaAsP

1987 ◽  
Vol 104 ◽  
Author(s):  
B. M. Arora ◽  
S. Chakravarty ◽  
S. S. Chandvankar ◽  
R. Rajalakshmi ◽  
A. K. Srivastava
Keyword(s):  
Activation Energy ◽  
Liquid Phase ◽  
Broad Band ◽  
Emission Spectra ◽  
Integrated Intensity ◽  
Coordinate Model ◽  
Related Defect ◽  
Ge Doping ◽  
Type Conduction ◽  
Configuration Coordinate

ABSTRACTGermanium doping of InGaAsP epitaxial layers grown by liquid phase epitaxy produces n type conduction with a net distribution coefficient KGe∼ 5×10-3. In addition, Ge doping introduces a broad band (∼0.2eV) of efficient luminescence which is red shifted with respect to the band edge. The intensity of this band grows with increasing Ge concentration. In all the samples, the integrated intensity of the broad band varies relatively less in the temperature range 15K to about 90K. At higher temperatures, the intensity falls exponentially with an activation energy of 0.05 - 0.07 eV. The emission spectra are compared with the configuration-coordinate model of the emission from a Ge related complex.

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