Thickness Effect On The Crystallization Kinetics Of Electrolessly-Deposited Ni(P) Thin Films

1993 ◽  
Vol 321 ◽  
Author(s):  
L. T. Shi ◽  
E. J. M. O'Sullivan

ABSTRACTIn order to understand thickness and interfacial effects on the crystallization kinetics of amorphous solids, Ni(P) thin films electrolessly deposited on Cu seed layers were annealed at constant heating rates or at constant temperatures in a DSC to obtain activation energies andAvrami exponents. It was found that the activation energy of crystallization in Ni(P) changes asa function of sample thickness when the sample thickness is less than 1.0 μm. Furthermore, the Avrami exponent was found to change not only as a function of thickness but also as a function of annealing temperature.

2017 ◽  
Vol 898 ◽  
pp. 657-665
Author(s):  
Dao Zhang ◽  
Wang Shu Lu ◽  
Xiao Yan Wang ◽  
Sen Yang

The non-isothermal crystallization kinetics of Mg61Zn35Ca4 glassy alloy prepared via melt-spinning were studied by using isoconversion method. The crystalline characterization of Mg61Zn35Ca4 was examined by X-ray diffraction. Different scanning calorimeter was used to investigate the non-isothermal crystallization kinetics at different heating rates (3-60 K/min). The calculated value of Avrami exponent obtained by Matusita method indicated that the crystalline transformation for Mg61Zn35Ca4 is a complex process of nucleation and growth. The Kissinger-Akahira-Sunose method was used to investigate the activation energy. The activation energy of crystallization varies with the extent of crystallization and hence with temperature. The Sestak-Berggren model was used to describe the non-isothermal crystallization kinetics.


1998 ◽  
Vol 13 (8) ◽  
pp. 2291-2296 ◽  
Author(s):  
Hsin-Yi Lee ◽  
Tai-Bor Wu

The kinetics of in situ crystallization of LaNiO3 thin films in sputtering deposition at temperatures ranging from 250 to 450 °C and isothermal crystallization of room-temperature (RT) sputtered LaNiO3 thin films in annealing at 350–500 °C were investigated by the x-ray diffraction method. The crystallization in both cases basically followed the Johnson–Mehl–Avrami (JMA) relation. However, different crystallization kinetics were observed. The transformation index and activation energy of crystallization in high temperature sputtering were about 1.5 and 33 kJ/mole, respectively, while in the annealing of RT-sputtered films, 1.0 and 63 kJ/mole were found. From the determined transformation index, it is suggested that the crystallization rate in high temperature sputtering was determined by a diffusion-controlled process of lateral growth with a decreasing nucleation rate of crystallites in the adsorption layer. However, the annealed films crystallized by an interface-controlled and one-dimensional growth of existing nuclei.


2020 ◽  
Vol 11 (1) ◽  
pp. 107-112
Author(s):  
A Said Sikder ◽  
SD Nath ◽  
SS Sikder

Amorphous soft magnetic materials have significant potential applications in specialist power transformers and in inductive devices. With the composition of Fe82Si8B10, 82% of the transition metals Fe and about 18% of metalloid or glass-former elements like B and Si are strongly magnetic at room temperature and offer dynamic opportunities for engineering applications. The crystallization kinetics has been studied by differential thermal analysis (DTA). The sample was annealed in a controlled way in the temperature range of 350-450°C at constant annealing time one hour. The kinetics of primary crystallization α-Fe(Si) phase and secondary crystallization Fe2B phase was studied as affected due to temperature. The sample annealed at 350oC temperature is almost unchanged which is still lower than that of primary crystallization temperature but the same condition when sample annealed at 450°C completely shows that the primary crystallization α-Fe(Si) phase has vanished and crystallization event took place to a good extent. Journal of Engineering Science 11(1), 2020, 107-112


2018 ◽  
Vol 495 ◽  
pp. 19-26 ◽  
Author(s):  
Xiaohua Tian ◽  
Zhenhua Wang ◽  
Jiachen Zhu ◽  
Changlong Tan ◽  
Kun Zhang ◽  
...  

2019 ◽  
Vol 48 (4) ◽  
pp. 2137-2143
Author(s):  
Jiachen Zhu ◽  
Changlong Tan ◽  
WenBin Zhao ◽  
ZhaiPing Yang ◽  
Kun Zhang ◽  
...  

2010 ◽  
Vol 405 (3) ◽  
pp. 947-950 ◽  
Author(s):  
Yongchao Lei ◽  
HuiJie Zhao ◽  
Wei Cai ◽  
Xu An ◽  
Laixu Gao

Vacuum ◽  
2017 ◽  
Vol 140 ◽  
pp. 144-148 ◽  
Author(s):  
Sin-Liang Ou ◽  
Sheng-Chi Chen ◽  
Yan-Cheng Lin ◽  
Po-Chun Lin ◽  
Chao-Kuang Wen ◽  
...  

2008 ◽  
Vol 10 (10) ◽  
pp. 1416-1421 ◽  
Author(s):  
A. Abu El-Fadl ◽  
M.M. Hafiz ◽  
M.M. Wakkad ◽  
A.S. Aashour

2004 ◽  
Vol 19 (10) ◽  
pp. 2938-2946 ◽  
Author(s):  
Chain-Ming Lee ◽  
Yeong-Iuan Lin ◽  
Tsung-Shune Chin

Isothermal crystallization kinetics of amorphous Ga–Sb–Te films was studied by means of a time-resolved optical transmission method. Thin films with compositions along the pseudo-binary tie-lines Sb7Te3–GaSb and Sb2Te3–GaSb in the ternary phase diagram were prepared by the co-sputtering method. Crystallization of GaSbTe films reveals a two-stage process: an initial surface nucleation and coarsening (Stage 1) followed by the one-dimensional grain growth (Stage 2). The kinetic exponent (n) value in Stage 1 shows strong dependence on film compositions, while that of Stage 2 is less dependent. The activation energy in Stage 1 increases with increasing GaSb content and reaches the maximum values at compositions close to GaSb, but a decreasing trend was observed in Stage 2. Kinetics parameters between isothermal crystallization of thin films and non-isothermal crystallization of powder samples analyzed by differential scanning colorimetry [J. Mater. Res. 19, 2929 (2004)] are compared. The kinetic parameters in Stage 1 show much correspondence with those of non-isothermal cases in comparable kinetic exponents but with lower activation energies. The discrepancies between nonisothermal and isothermal kinetics are attributed to the sample morphology and the constraint effects.


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