Analysis of the Mechanical Failure in a Multilayered Thin Film System Tested by Microtensile Loading

1995 ◽  
Vol 391 ◽  
Author(s):  
T. Marieb ◽  
M. Ignat ◽  
H. Fujimoto ◽  
P. Flinn
Keyword(s):  
Critical Stress ◽  
Film System ◽  
X Ray Diffraction ◽  
Multilayered Thin Film ◽  
X Ray ◽  
Thin Film System ◽  
Tin Film ◽  
Before And After ◽  
Multilayered Thin Films

AbstractMultilayered thin films were deposited on pure Al substrate test bars for in situ scanning electron microscope (SEM) microtensile deformation. The films consisted of a TiN layer covered by either SiO2 or W. Deformation of the samples showed that the TiN film dominated cracking events and caused cracking in the W to occur at lower critical stress values than previously reported. Crack deflections along the TiN-W interface were also seen. W film strain was measured by X-ray diffraction before and after testing to look at the effect of cracking and deformation on stress in this film.

Quantitative Study of Al/W Interaction In Si/SiO2/W-Ti/Al Thin Film System

1988 ◽  
Vol 119 ◽  
Author(s):  
Hung-Yu Liu ◽  
Peng-Heng Chang ◽  
Jim Bohlman ◽  
Hun-Lian Tsai
Keyword(s):  
Thin Film ◽  
Film System ◽  
X Ray Diffraction ◽  
Compound Formation ◽  
X Ray ◽  
Thin Film System ◽  
Glancing Angle ◽  
Integrated Intensity ◽  
Al Thin Film ◽  
Kinetics Of

AbstractThe interaction of Al and W in the Si/SiO2/W-Ti/Al thin film system is studied quantitatively by glancing angle x-ray diffraction. The formation of Al-W compounds due to annealing is monitored by the variation of the integrated intensity from a few x-ray diffraction peaks of the corresponding compounds. The annealing was conducted at 400°C, 450°C and 500°C from 1 hour to 300 hours. The kinetics of compound formation is determined using x-ray diffraction data and verified by TEM observations. We will also show the correlation of the compound formation to the change of the electrical properties of these films.

scholarly journals In Situ Coherent X-ray Diffraction during Three-Point Bending of a Au Nanowire: Visualization and Quantification

2018 ◽  
Vol 2 (4) ◽  
pp. 24 ◽  
Author(s):  
Anton Davydok ◽  
Thomas Cornelius ◽  
Zhe Ren ◽  
Cedric Leclere ◽  
Gilbert Chahine ◽  
...  
Keyword(s):  
Three Dimensional ◽  
Reciprocal Space ◽  
X Ray Diffraction ◽  
Complex Deformation ◽  
X Ray ◽  
Three Point Bending ◽  
Atomic Force ◽  
Au Nanowire ◽  
Before And After

The three-point bending behavior of a single Au nanowire deformed by an atomic force microscope was monitored by coherent X-ray diffraction using a sub-micrometer sized hard X-ray beam. Three-dimensional reciprocal-space maps were recorded before and after deformation by standard rocking curves and were measured by scanning the energy of the incident X-ray beam during deformation at different loading stages. The mechanical behavior of the nanowire was visualized in reciprocal space and a complex deformation mechanism is described. In addition to the expected bending of the nanowire, torsion was detected. Bending and torsion angles were quantified from the high-resolution diffraction data.

In-Situ X-ray Diffraction Study of Lithium Intercalation in Nanostructured Anatase Titanium dioxide

1998 ◽  
Vol 536 ◽  
Author(s):  
R. Van de Krol ◽  
E. A. Meulenkamp ◽  
A. Goossens ◽  
J. Schoonman
Keyword(s):  
Phase Transformation ◽  
Maximum Amount ◽  
Lithium Intercalation ◽  
X Ray Diffraction ◽  
X Ray ◽  
Before And After ◽  
The Difference ◽  
Two Phases ◽  
Reversible Phase

AbstractElectrochemical lithium intercalation in nanostructured anatase TiO2 is investigated with in-situ X-ray diffraction. A complete and reversible phase transformation from tetragonal anatase TiO2 to orthorhombic anatase Li0.5TiO2 is observed. The difference of the XRD spectra before and after insertion can be fitted with the lattice parameters of the two phases as fit parameters. The maximum amount of lithium that can be dissolved in anatase TiO2 before the phase transformation occurs is found to be very small.

The Application of In Situ 3D X-Ray Diffraction in Annealing Experiments: First Interpretation of Substructure Development in Deformed NaCl

2012 ◽  
Vol 715-716 ◽  
pp. 461-466 ◽  
Author(s):  
Verity Borthwick ◽  
Søren Schmidt ◽  
Sandra Piazolo ◽  
Carsten Gundlach ◽  
Albert Griera ◽  
...  
Keyword(s):  
Subgrain Boundary ◽  
Surface Effects ◽  
Sample Volume ◽  
European Synchrotron Radiation Facility ◽  
X Ray Diffraction ◽  
Boundary Misorientation ◽  
X Ray ◽  
Before And After ◽  
Annealing Experiments

n-situ 3D X-ray diffraction (3DXRD) annealing experiments were conducted at the ID-11 beamline at the European Synchrotron Radiation Facility in Grenoble. This allowed us to non-destructively document and subsequently analyse the development of substructures during heating, without the influence of surface effects. A sample of deformed single crystal halite was heated to between 260-400 °C. Before and after heating a volume of 500 by 500 by 300 μm was mapped using a planar beam, which was translated over the sample volume at intervals of 5-10 µm in the vertical dimension. In the following we present partially reconstructed orientation maps over one layer before and after heating for 240min at 260 °C. Additional small syn-heating maps over a constrained sample rotation of 12-30º. The purpose of this was to illuminate a few reflections from 1 or 2 subgrains and follow their evolution during heating. Preliminary results show that significant changes occurred within the sample volume, for which, surface effects can be excluded. Results show a number of processes, including: i) change in subgrain boundary misorientation angle and ii) subgrain subdivision into areas of similar lattice orientation with new subgrain boundary formation. These results demonstrate that 3DXRD coupled with in-situ heating is a successful non-destructive technique for examining real-time post-deformational annealing in strongly deformed crystalline materials with complicated microstructures.

Assessment of Cleaning Conservation Interventions on Architectural Surfaces Using an Integrated Methodology

2002 ◽  
Vol 712 ◽  
Author(s):  
Antonia Moropoulou ◽  
Ekaterini T. Delegou ◽  
Nicolas P. Avdelidis ◽  
Maria Koui
Keyword(s):  
Historic Buildings ◽  
X Ray Diffraction ◽  
Laboratory Methods ◽  
X Ray ◽  
Integrated Methodology ◽  
Physico Chemical ◽  
Before And After ◽  
Of Greece ◽  
Blasting Method

ABSTRACTIn this work, pilot cleaning interventions applied by a wet micro-blasting method on architectural surfaces of three historic buildings in marble and porous stone were evaluated in situ and in the laboratory. The investigation was performed on characteristic stone surfaces (marbles and porous stone) of the following historic buildings: Athens Academy and National Library of Greece in Athens center polluted urban environment and Bank of Greece in Piraeus marine environment. The materials of the facades were characterized, and the mechanism of decay was diagnosed. In addition, the cleaning method's efficiency was evaluated based on the acceptability of the alteration of the cleaned architectural surfaces. Criteria were both aesthetic and physico-chemical. In particular, the architectural surfaces were examined in situ by the means of fiber optic microscopy, infrared thermography and colorimetry. In the laboratory, methods of investigation were optical microscopy, X-ray diffraction, scanning electron microscopy with energy dispersion by X-ray analysis, mercury intrusion porosimetry, Fourier transform infrared spectroscopy, conductivity and pH measurements. The majority of measurements and analyses were applied before and after the pilot cleaning interventions. Finally, the results of this study contribute to the development of an integrated methodology for the assessment of cleaning interventions applied on architectural surfaces.

In situ X-ray Investigation of Hydrogen Charging in Thin Film Bimetallic Electrodes

1997 ◽  
Vol 12 (8) ◽  
pp. 2091-2098 ◽  
Author(s):  
Najeh M. Jisrawi ◽  
Harold Wiesmann ◽  
M. W. Ruckman ◽  
T. R. Thurston ◽  
G. Reisfeld ◽  
...  
Keyword(s):  
Thin Film ◽  
Cyclic Voltammetry ◽  
Hydrogen Uptake ◽  
Metallic Films ◽  
X Ray Diffraction ◽  
Cell Potential ◽  
Multilayered Thin Film ◽  
X Ray ◽  
Multilayer Electrode

Hydrogen uptake and discharge by thin metallic films under potentiostatic control was studied using x-ray diffraction at the National Synchroton Light Source (NSLS). The formation of metal-hydrogen phases in Pd, Pd-capped Nb, and Pd/Nb multilayer electrode structures was deduced from x-ray diffraction data and correlated with the cyclic voltammetry (CV) peaks. The x-ray data were also used to construct a plot of the hydrogen concentration as a function of cell potential for a multilayered thin film.

Phase Formation and Phase Stability in the Al-Ti Thin Film System

1990 ◽  
Vol 213 ◽  
Author(s):  
L.R. Parks ◽  
D.A. Lilienfeld ◽  
P. BØRgesen ◽  
R. Raj
Keyword(s):  
Thin Film ◽  
Phase Stability ◽  
Rutherford Backscattering Spectrometry ◽  
Intermetallic Phases ◽  
Film System ◽  
X Ray Diffraction ◽  
X Ray ◽  
Annealing Temperatures ◽  
Thin Film System ◽  
Sequential Formation

ABSTRACTThis study focuses on the sequential formation of aluminide phases during annealing of titanium and aluminum thin film bilayers. The formation of titanium-rich intermetallic phases at higher annealing temperatures is emphasized. Using Rutherford Backscattering Spectrometry (RBS) analysis, and x-ray diffraction, phases formed as a function of temperature have been identified. The phases Al3Ti through Ti3Al were observed over the temperature range 450–750°C, where reaction with the SiO2 substrate occurred. All phases were present as discreet layers within the samples with several layered phases coexisting at the higher temperatures.

scholarly journals In-Situ Coherent X-Ray Diffraction during Three-Point Bending of a Au Nanowire: Visualization and Quantification

2018 ◽  
Author(s):  
Anton Davydok ◽  
Thomas W. Cornelius ◽  
Zhe Ren ◽  
Cedric Leclere ◽  
Gilbert Chahine ◽  
...  
Keyword(s):  
Three Dimensional ◽  
Reciprocal Space ◽  
X Ray Diffraction ◽  
Complex Deformation ◽  
X Ray ◽  
Three Point Bending ◽  
Atomic Force ◽  
Au Nanowire ◽  
Before And After

The three-point bending behavior of a single Au nanowire deformed with an atomic force microscope was monitored by coherent X-ray diffraction using a sub-micrometer sized hard X-ray beam. While three-dimensional reciprocal-space maps were recorded before and after deformation by standard rocking curves, they were measured by scanning the energy of the incident X-ray beam during deformation at different loading stages. The mechanical behavior of the nanowire is visualized in reciprocal space and a complex deformation mechanism is described. In addition to the expected bending of the nanowire, torsion is detected. Bending and torsion angles are quantified from the high resolution diffraction data.

The incommensurately modulated structures of volcanic plagioclase: displacement, ordering and phase transition

2019 ◽  
Vol 75 (4) ◽  
pp. 643-656 ◽  
Author(s):  
Shiyun Jin ◽  
Huifang Xu ◽  
Xiaoping Wang ◽  
Dongzho Zhang ◽  
Ryan Jacobs ◽  
...  
Keyword(s):  
Phase Transition ◽  
Initial Position ◽  
Diffraction Experiment ◽  
X Ray Diffraction ◽  
Dramatic Decrease ◽  
X Ray ◽  
Obvious Change ◽  
Modulated Structures ◽  
Before And After

Four basaltic phenocryst samples of plagioclase, with compositions ranging from An48 (andesine) to An64 (labradorite), have been studied with single-crystal X-ray and neutron diffraction techniques. The samples were also subjected to a heating experiment at 1100°C for two weeks in an effort to minimize the Al–Si ordering in their structures. The average and the modulated structures of the samples (before and after the heating experiment) were compared, in order to understand the mechanism of the phase transition from the disordered C\bar 1 structure to the e-plagioclase structure. A comparison between the structures from neutron and X-ray diffraction data shows that the 〈T—O〉 distance does not solely depend on the Al occupancy as previously thought. A dramatic decrease of the Al–Si ordering is observed after heating at 1100°C for two weeks for all four samples, with an obvious change in the intensities of the satellite reflections (e-reflections) in the diffraction pattern. Evident changes in the modulation period were also observed for the more calcic samples. No obvious change in the Ca–Na ordering was observed after the heating experiment. An in situ heating X-ray diffraction experiment was carried out on the andesine sample (An48) to study the change in the satellite intensity at high temperature. A dramatic weakening of the satellite peaks was observed between 477°C and 537°C, which strongly supports the displacive nature of the initiation of e2 ordering. Rigid-Unit Mode (RUM) analysis of the plagioclase structure suggests the initial position of the e-reflections is determined by the anti-RUMs in the framework.

Stacking fault energy in austenitic steels determined by usingin situX-ray diffraction during bending

2014 ◽  
Vol 47 (3) ◽  
pp. 936-947 ◽  
Author(s):  
D. Rafaja ◽  
C. Krbetschek ◽  
C. Ullrich ◽  
S. Martin
Keyword(s):  
Critical Stress ◽  
Partial Dislocation ◽  
Stacking Faults ◽  
Stacking Fault ◽  
Stacking Fault Energy ◽  
Austenitic Steels ◽  
X Ray Diffraction ◽  
X Ray ◽  
Partial Dislocations

A method is presented which determines the stacking fault energy in face-centred cubic materials from the critical stress that is inducedviasample bending in the early stages of plastic deformation. The critical stress is gauged byin situX-ray diffraction. This method utilizes the results of Byun's consideration of the stress dependence of the partial dislocation separation [Byun (2003).Acta Mater.51, 3063–3071]. Byun showed that the separation distance of the partial dislocations increases rapidly when the critical stress is reached and that the critical stress needed for the rapid separation of the partial dislocations is directly proportional to the stacking fault energy. In the approach presented here, the partial dislocation separation and the corresponding triggering stress are monitored by usingin situX-ray diffraction during sample bending. Furthermore, thein situX-ray diffraction measurement checks the possible interactions between stacking faults present on equivalent lattice planes and the interactions of the stacking faults with other microstructure defects. The capability of the proposed method was tested on highly alloyed austenitic steels containing chromium (∼16 wt%), manganese (∼7 wt%) and nickel as the main alloying elements. For the steels containing 5.9 and 3.7 wt% Ni, stacking fault energies of 17.5 ± 1.4 and 8.1 ± 0.9 mJ m−2were obtained, respectively.

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