Assessment of Cleaning Conservation Interventions on Architectural Surfaces Using an Integrated Methodology

2002 ◽  
Vol 712 ◽  
Author(s):  
Antonia Moropoulou ◽  
Ekaterini T. Delegou ◽  
Nicolas P. Avdelidis ◽  
Maria Koui
Keyword(s):  
Historic Buildings ◽  
X Ray Diffraction ◽  
Laboratory Methods ◽  
X Ray ◽  
Integrated Methodology ◽  
Physico Chemical ◽  
Before And After ◽  
Of Greece ◽  
Blasting Method

ABSTRACTIn this work, pilot cleaning interventions applied by a wet micro-blasting method on architectural surfaces of three historic buildings in marble and porous stone were evaluated in situ and in the laboratory. The investigation was performed on characteristic stone surfaces (marbles and porous stone) of the following historic buildings: Athens Academy and National Library of Greece in Athens center polluted urban environment and Bank of Greece in Piraeus marine environment. The materials of the facades were characterized, and the mechanism of decay was diagnosed. In addition, the cleaning method's efficiency was evaluated based on the acceptability of the alteration of the cleaned architectural surfaces. Criteria were both aesthetic and physico-chemical. In particular, the architectural surfaces were examined in situ by the means of fiber optic microscopy, infrared thermography and colorimetry. In the laboratory, methods of investigation were optical microscopy, X-ray diffraction, scanning electron microscopy with energy dispersion by X-ray analysis, mercury intrusion porosimetry, Fourier transform infrared spectroscopy, conductivity and pH measurements. The majority of measurements and analyses were applied before and after the pilot cleaning interventions. Finally, the results of this study contribute to the development of an integrated methodology for the assessment of cleaning interventions applied on architectural surfaces.

scholarly journals In Situ Coherent X-ray Diffraction during Three-Point Bending of a Au Nanowire: Visualization and Quantification

2018 ◽  
Vol 2 (4) ◽  
pp. 24 ◽  
Author(s):  
Anton Davydok ◽  
Thomas Cornelius ◽  
Zhe Ren ◽  
Cedric Leclere ◽  
Gilbert Chahine ◽  
...  
Keyword(s):  
Three Dimensional ◽  
Reciprocal Space ◽  
X Ray Diffraction ◽  
Complex Deformation ◽  
X Ray ◽  
Three Point Bending ◽  
Atomic Force ◽  
Au Nanowire ◽  
Before And After

The three-point bending behavior of a single Au nanowire deformed by an atomic force microscope was monitored by coherent X-ray diffraction using a sub-micrometer sized hard X-ray beam. Three-dimensional reciprocal-space maps were recorded before and after deformation by standard rocking curves and were measured by scanning the energy of the incident X-ray beam during deformation at different loading stages. The mechanical behavior of the nanowire was visualized in reciprocal space and a complex deformation mechanism is described. In addition to the expected bending of the nanowire, torsion was detected. Bending and torsion angles were quantified from the high-resolution diffraction data.

In-Situ X-ray Diffraction Study of Lithium Intercalation in Nanostructured Anatase Titanium dioxide

1998 ◽  
Vol 536 ◽  
Author(s):  
R. Van de Krol ◽  
E. A. Meulenkamp ◽  
A. Goossens ◽  
J. Schoonman
Keyword(s):  
Phase Transformation ◽  
Maximum Amount ◽  
Lithium Intercalation ◽  
X Ray Diffraction ◽  
X Ray ◽  
Before And After ◽  
The Difference ◽  
Two Phases ◽  
Reversible Phase

AbstractElectrochemical lithium intercalation in nanostructured anatase TiO2 is investigated with in-situ X-ray diffraction. A complete and reversible phase transformation from tetragonal anatase TiO2 to orthorhombic anatase Li0.5TiO2 is observed. The difference of the XRD spectra before and after insertion can be fitted with the lattice parameters of the two phases as fit parameters. The maximum amount of lithium that can be dissolved in anatase TiO2 before the phase transformation occurs is found to be very small.

The Application of In Situ 3D X-Ray Diffraction in Annealing Experiments: First Interpretation of Substructure Development in Deformed NaCl

2012 ◽  
Vol 715-716 ◽  
pp. 461-466 ◽  
Author(s):  
Verity Borthwick ◽  
Søren Schmidt ◽  
Sandra Piazolo ◽  
Carsten Gundlach ◽  
Albert Griera ◽  
...  
Keyword(s):  
Subgrain Boundary ◽  
Surface Effects ◽  
Sample Volume ◽  
European Synchrotron Radiation Facility ◽  
X Ray Diffraction ◽  
Boundary Misorientation ◽  
X Ray ◽  
Before And After ◽  
Annealing Experiments

n-situ 3D X-ray diffraction (3DXRD) annealing experiments were conducted at the ID-11 beamline at the European Synchrotron Radiation Facility in Grenoble. This allowed us to non-destructively document and subsequently analyse the development of substructures during heating, without the influence of surface effects. A sample of deformed single crystal halite was heated to between 260-400 °C. Before and after heating a volume of 500 by 500 by 300 μm was mapped using a planar beam, which was translated over the sample volume at intervals of 5-10 µm in the vertical dimension. In the following we present partially reconstructed orientation maps over one layer before and after heating for 240min at 260 °C. Additional small syn-heating maps over a constrained sample rotation of 12-30º. The purpose of this was to illuminate a few reflections from 1 or 2 subgrains and follow their evolution during heating. Preliminary results show that significant changes occurred within the sample volume, for which, surface effects can be excluded. Results show a number of processes, including: i) change in subgrain boundary misorientation angle and ii) subgrain subdivision into areas of similar lattice orientation with new subgrain boundary formation. These results demonstrate that 3DXRD coupled with in-situ heating is a successful non-destructive technique for examining real-time post-deformational annealing in strongly deformed crystalline materials with complicated microstructures.

Analysis of the Mechanical Failure in a Multilayered Thin Film System Tested by Microtensile Loading

1995 ◽  
Vol 391 ◽  
Author(s):  
T. Marieb ◽  
M. Ignat ◽  
H. Fujimoto ◽  
P. Flinn
Keyword(s):  
Critical Stress ◽  
Film System ◽  
X Ray Diffraction ◽  
Multilayered Thin Film ◽  
X Ray ◽  
Thin Film System ◽  
Tin Film ◽  
Before And After ◽  
Multilayered Thin Films

AbstractMultilayered thin films were deposited on pure Al substrate test bars for in situ scanning electron microscope (SEM) microtensile deformation. The films consisted of a TiN layer covered by either SiO2 or W. Deformation of the samples showed that the TiN film dominated cracking events and caused cracking in the W to occur at lower critical stress values than previously reported. Crack deflections along the TiN-W interface were also seen. W film strain was measured by X-ray diffraction before and after testing to look at the effect of cracking and deformation on stress in this film.

scholarly journals In-Situ Coherent X-Ray Diffraction during Three-Point Bending of a Au Nanowire: Visualization and Quantification

2018 ◽  
Author(s):  
Anton Davydok ◽  
Thomas W. Cornelius ◽  
Zhe Ren ◽  
Cedric Leclere ◽  
Gilbert Chahine ◽  
...  
Keyword(s):  
Three Dimensional ◽  
Reciprocal Space ◽  
X Ray Diffraction ◽  
Complex Deformation ◽  
X Ray ◽  
Three Point Bending ◽  
Atomic Force ◽  
Au Nanowire ◽  
Before And After

The three-point bending behavior of a single Au nanowire deformed with an atomic force microscope was monitored by coherent X-ray diffraction using a sub-micrometer sized hard X-ray beam. While three-dimensional reciprocal-space maps were recorded before and after deformation by standard rocking curves, they were measured by scanning the energy of the incident X-ray beam during deformation at different loading stages. The mechanical behavior of the nanowire is visualized in reciprocal space and a complex deformation mechanism is described. In addition to the expected bending of the nanowire, torsion is detected. Bending and torsion angles are quantified from the high resolution diffraction data.

The incommensurately modulated structures of volcanic plagioclase: displacement, ordering and phase transition

2019 ◽  
Vol 75 (4) ◽  
pp. 643-656 ◽  
Author(s):  
Shiyun Jin ◽  
Huifang Xu ◽  
Xiaoping Wang ◽  
Dongzho Zhang ◽  
Ryan Jacobs ◽  
...  
Keyword(s):  
Phase Transition ◽  
Initial Position ◽  
Diffraction Experiment ◽  
X Ray Diffraction ◽  
Dramatic Decrease ◽  
X Ray ◽  
Obvious Change ◽  
Modulated Structures ◽  
Before And After

Four basaltic phenocryst samples of plagioclase, with compositions ranging from An48 (andesine) to An64 (labradorite), have been studied with single-crystal X-ray and neutron diffraction techniques. The samples were also subjected to a heating experiment at 1100°C for two weeks in an effort to minimize the Al–Si ordering in their structures. The average and the modulated structures of the samples (before and after the heating experiment) were compared, in order to understand the mechanism of the phase transition from the disordered C\bar 1 structure to the e-plagioclase structure. A comparison between the structures from neutron and X-ray diffraction data shows that the 〈T—O〉 distance does not solely depend on the Al occupancy as previously thought. A dramatic decrease of the Al–Si ordering is observed after heating at 1100°C for two weeks for all four samples, with an obvious change in the intensities of the satellite reflections (e-reflections) in the diffraction pattern. Evident changes in the modulation period were also observed for the more calcic samples. No obvious change in the Ca–Na ordering was observed after the heating experiment. An in situ heating X-ray diffraction experiment was carried out on the andesine sample (An48) to study the change in the satellite intensity at high temperature. A dramatic weakening of the satellite peaks was observed between 477°C and 537°C, which strongly supports the displacive nature of the initiation of e2 ordering. Rigid-Unit Mode (RUM) analysis of the plagioclase structure suggests the initial position of the e-reflections is determined by the anti-RUMs in the framework.

Conducting Thin Films of Ruthenium Oxide Prepared by Mocvd

1998 ◽  
Vol 514 ◽  
Author(s):  
P. Hones ◽  
C.-H. Kohli ◽  
R. Sanjinés ◽  
F. Lévy ◽  
T. Gerfin ◽  
...  
Keyword(s):  
Thin Films ◽  
Metalorganic Chemical Vapor Deposition ◽  
Resistivity Measurement ◽  
Ruthenium Oxide ◽  
Chemical Vapor ◽  
X Ray Diffraction ◽  
X Ray ◽  
Sputtered Films ◽  
Before And After

ABSTRACTConducting thin films of RuO2 were grown at temperatures down to 623K on glass by metalorganic chemical vapor deposition (MOCVD). Tris-trifluoroacetylacetonate-ruthenium(III) (Ru(tfa)3) served as precursor. Smooth, specular and well adherent films were deposited, if the reaction gas contained water. The films were investigated by X-ray diffraction, SEM, and fourprobe resistivity measurement. Growth kinetics were also studied by in situ ellipsometry. The results are compared with films prepared by d.c. reactive sputtering before and after annealing. The properties of the MOCVD films, in particular the resistivity (ρ down to 72 μΩcm), are comparable to CVD films deposited at much higher temperatures and sputtered films after high temperature annealing.

scholarly journals Organo-montimorillonites containing a reactive thiophene group for polythiophenes nanocomposites

Cerâmica ◽  
2016 ◽  
Vol 62 (362) ◽  
pp. 133-139
Author(s):  
J. C. Macêdo-Fonsêca ◽  
A. A. A. Tino ◽  
M. P. A. Silva-Alves ◽  
R. M. Souto-Maior
Keyword(s):  
Thermal Stability ◽  
Fourier Transform ◽  
Montmorillonite Clay ◽  
Polymerization Reaction ◽  
Ammonium Bromide ◽  
X Ray Diffraction ◽  
X Ray ◽  
Before And After ◽  
Thermal Stability Of

Abstract A sodium montmorillonite clay (Na+MMT) was modified with different contents of a reactive salt derived from thiophene (trimethyl-(2-thiophen-3-yl-ethyl)-ammonium bromide) (TMETA). The thiophene salt in the organoclay (xtioMMT) was oxidatively polymerized in situ, giving rise to montmorillonite clay intercalated with a polythiophene salt (xpoltioMMT). Analysis by Fourier transform infrared spectroscopy shows a difference in organization of the salt inside the clay lamellae, before and after its polymerization. X-ray diffraction indicates that the salts, whether polymeric or not, are arranged as a monolayer for all compositions. Differently to the expected, the thermal stability of the organoclays decreases upon polymerization suggesting degradation of TMETA in the polymerization reaction.

Molecular composite films of MoS2 and styrene

1991 ◽  
Vol 6 (5) ◽  
pp. 1103-1107 ◽  
Author(s):  
W.M.R. Divigalpitiya ◽  
R.F. Frindt ◽  
S.R. Morrison
Keyword(s):  
Electrical Conductivity ◽  
Organic Molecules ◽  
Composite Films ◽  
Water Molecules ◽  
X Ray Diffraction ◽  
X Ray ◽  
Before And After ◽  
Molecular Layers

Novel composite films with a monolayer of organic molecules included between single molecular layers of MoS2 can be prepared with a recently described technique. Styrene-included MoS2, before and after polymerization, is discussed as an example that exhibits interesting properties. The sensitivity to humidity of the styrene-included MoS2 system is monitored in situ with x-ray diffraction where reversible incorporation and removal of water molecules are observed. Films with an anisotropy of electrical conductivity of about 108 are obtained by polymerizing the monomer between the layers.

The Use of Advanced Analytical Techniques for Characterization of the Chemical, Physical, and Crystallographic Nature of a Surface

1973 ◽  
Vol 31 ◽  
pp. 132-133 ◽  
Author(s):  
R. E. Herfert
Keyword(s):  
Surface Characterization ◽  
Analytical Techniques ◽  
X Ray Diffraction ◽  
Depth Of Penetration ◽  
X Ray ◽  
The Past ◽  
Transmission Electron ◽  
Scanning Electron

Studies of the nature of a surface, either metallic or nonmetallic, in the past, have been limited to the instrumentation available for these measurements. In the past, optical microscopy, replica transmission electron microscopy, electron or X-ray diffraction and optical or X-ray spectroscopy have provided the means of surface characterization. Actually, some of these techniques are not purely surface; the depth of penetration may be a few thousands of an inch. Within the last five years, instrumentation has been made available which now makes it practical for use to study the outer few 100A of layers and characterize it completely from a chemical, physical, and crystallographic standpoint. The scanning electron microscope (SEM) provides a means of viewing the surface of a material in situ to magnifications as high as 250,000X.

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