N-Type Doping by Plasma Ion Implantation Using a PH3 SDS System
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AbstractPH3 SDS (safe delivery system) gas was used for the first time in P11 doping experiments to fabricate n+p junctions and NMOS devices. Two gas recipes (PH3 diluted in H2 and He) were investigated. Under lower pressure, a minimum etching effect was observed. A 4x1015/cm2 phosphorus dose and a 22 Ω/□ sheet resistance were achieved in 4 seconds. Very low contamination level was involved. An anomalous tail of P profile in Si substrate was observed using SIMS measurements.
2012 ◽
Vol 531-532
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pp. 543-546
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2007 ◽
Vol 46
(9B)
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pp. 6260-6266
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2017 ◽
Vol 5
(12)
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pp. 2245-2253
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