Thermochemistry and Electrical Contact Behavior of Electrode-Thermistor Interfaces

1996 ◽  
Vol 458 ◽  
Author(s):  
David P. Cann ◽  
Clive A. Randall

ABSTRACTThe electronic structure of electrode-thermistor interfaces will be related to the thermochemical properties of the interface. Sessile drop wetting experiments of metallic electrodes on commercial BaTiO3 PTCR ceramic devices in combination with measurements of the electrical contact properties of the interface through impedance spectroscopy measurements will be used to establish a fundamental perspective of the electrode-ceramic interface. It will be shown that the thermodynamic work of adhesion (Wad), which is the sum of the strengths of chemical interactions present at the interface, can be manipulated by the addition of chemically active elements to the electrode metal which can segregate to the interface and enhance adhesion. This same procedure will be used to modify the important electrical interfacial properties such as the contact resistance and capacitance.

1997 ◽  
Vol 12 (7) ◽  
pp. 1685-1688 ◽  
Author(s):  
David P. Cann ◽  
Clive A. Randall

The interfacial characteristics of positive temperature coefficient of resistance (PTCR) BaTiO3-electrode interfaces were studied. Sessile drop wetting experiments in combination with measurements of the contact resistance of the interface were used to establish a fundamental perspective of the electrode-ceramic interface. It was shown that the thermodynamic work of adhesion Wad), which is the sum of the strengths of chemical interactions present at the interface, can be manipulated by the addition of chemically active elements to the electrode metal which enhance adhesion. This same procedure is shown to modify the important electrical interfacial properties such as the contact resistance.


1976 ◽  
Vol 46 (11) ◽  
pp. 796-801 ◽  
Author(s):  
Brett O. Bateup ◽  
John R. Cook ◽  
H. Douglas Feldtman ◽  
Barry E. Fleischfresser

The durability of wool/polymer adhesive Joints in wash liquors of different surface tension was determined by measuring the rate of felting shrinkage of polymer-treated wool sliver and fabric in each liquor. The rate of felting shrinkage increased as the surface tension of the liquor decreased. This trend in the rate of felting shrinkage of polymer-treated wool agreed well with the trend in the magnitude of the thermodynamic work of adhesion of a wool/polymer “adhint” in different liquids, calculated assuming only secondary bonding forces across the wool/polymer interface. Limitations of the theory are discussed


2018 ◽  
Vol 245 ◽  
pp. 03007
Author(s):  
Nikolai Zaichenko ◽  
Vladislav Nefedov

The possibility of filling the recycled polyethylene terephthalate (rPET) with fly ash was studied to make a polymer composite material (PCM). It is shown that high adhesion between polymeric matrix and mineral filler is the key parameter to produce high performance PCM. For this purpose the acid-basic interaction as well as the thermodynamic work of adhesion between components of PCM were calculated. The technique of modifying fly ash filler with 5% concentration solution of sulfuric acid to increase acid-basic interaction has been elaborated. The resulting behavioral patterns are listed and compared to those of composites containing untreated fly ash particles.


1996 ◽  
Vol 445 ◽  
Author(s):  
Raymond A. Pearson ◽  
Thomas B. Lloyd

AbstractOrganic adhesives are commonly used in the microelectronics industry to bond silicon chips to a wide variety of substrates. The substrates include copper, silver, nickel / palladium, polyimide, and glass‐filled epoxies. The surfaces of these substrates are affected by the processing steps used in the manufacturing process used to produce the final package. The most common adhesives used in the assembly of microelectronic packages are epoxy‐based and there are numerous grades and types to chose from. Therefore, the packaging engineer is faced with the dilemma of what criterion to use to select the best adhesive for a particular package design.At the crux of the problem is how does one predict adhesion and how does one measure it? It is proposed that the surfaces play an important role in forming the interfacial bond and that strength of the mating surfaces can be characterized in terms of the thermodynamic work of adhesion. Roughness is also a factor but will not be dealt with here. The thermodynamic work of adhesion describes the energy to reversibly separate two surfaces (elastic). Interfacial fracture mechanics may be used to quantify the strain energy release rate for separating two surfaces and contains both elastic and inelastic contributions. This talk will contain a discussion of our studies on the use of a three liquid probe method to determine the thermodynamic work of adhesion and a mixed‐mode bending method to measure interfacial fracture toughness. Moreover, we will comment on the perils of relating the thermodynamic work of adhesion to the interfacial fracture toughness.


1997 ◽  
Vol 473 ◽  
Author(s):  
M. D. Kriese ◽  
N. R. Moody ◽  
W. W. Gerberich

ABSTRACTNano-indentation testing has been used to quantitatively assess the adhesion of thin copper films, sputtered to thicknesses of 150 nm to 1500 nm. Copper films of low residual stress were deposited via RF diode cathode sputtering onto SiO2/Si substrates. Overlayers of DC magnetron sputtered high residual stress tungsten, 850 nm thick, were additionally used to provide a driving force for delamination. All films tested exhibited buckle-driven delamination, from which the interfacial toughness was estimated to be 0.2 – 2 J/m2, which is comparable to the thermodynamic work of adhesion. The use of an overlayer requires extensions of existing models, but otherwise does not change the interfacial adhesion, allowing measurements of films that would not otherwise delaminate.


1999 ◽  
Vol 14 (7) ◽  
pp. 3019-3026 ◽  
Author(s):  
Michael D. Kriese ◽  
William W. Gerberich ◽  
Neville R. Moody

Sputtered copper and tungsten thin films both with and without tungsten and chromium superlayers were tested by using nanoindentation probing to initiate and drive delamination. The adhesion energies of the films were calculated from the induced delaminations using the analysis presented in “Quantitative adhesion measures of multilayer films: Part I. Indentation mechanics.” Copper films ranging in thickness from 150 to 1500 nm in the as-sputtered condition had measured adhesion energies ranging from 0.2 to 2 J/m2, commensurate with the thermodynamic work of adhesion. Tungsten films ranging in thickness from 500 to 1000 nm in the as-sputtered condition had measured adhesion energies ranging from 5 to 15 J/m2. The superlayer was shown to induce radial cracking when under residual tension, resulting in underestimation of the adhesion energy when the film was well adhered. Under conditions of weak adherence or residual compression, the superlayer provided an excellent means to induce a delamination and allowed an accurate and reasonably precise quantitative measure of thin film adhesion.


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