The Doping and Characterization of Erbium-Implanted Gan
Keyword(s):
AbstractStrong room temperature Er-related photoluminescence (PL) and electroluminescence (EL) at 1539 nm was observed from Er and 0 implanted n-type GaN. Good device performance requires that the Er-related excitation and emission processes be efficient. Single exponential PL and EL time decays with l/e lifetimes of 2.33 ms and 1.74 ms indicates highly efficient radiative process. The Er excitation process in GaN was studied by comparing the efficiency of direct Erabsorption, electron-hole pair recombination, and hot electron (impact) excitation. The strongest Er luminescence and the lowest pump power was found using impact excitation.
2007 ◽
Vol 131-133
◽
pp. 595-600
2007 ◽
Vol 534-536
◽
pp. 105-108
2009 ◽
Vol 11
(46)
◽
pp. 11022
◽
Keyword(s):
Keyword(s):
Keyword(s):
Keyword(s):