Surface Chemistry of Porous Silicon

1998 ◽  
Vol 536 ◽  
Author(s):  
J.-N. Chazalviel ◽  
F. Ozanam

AbstractAs-prepared porous silicon comes out covered with covalently bonded hydrogen. This hydrogen coating provides a good electronic passivation of the surface, but it exhibits limited stability, being removed by thermal desorption or converted into an oxide upon prolonged storage in air. Starting from the hydrogenated surface, an oxide layer with good electronic properties is also obtained by anodic oxidation or rapid thermal oxidation.The hydrogenated surface may be nitridized using thermal treatments in nitrogen or ammonia. Fast halogenation of the surface may be obtained at room temperature, but the resulting coating is rapidly converted to an oxide in the presence of moisture. Many metals have been incorporated into the pores, using chemical or vacuum techniques, or even direct incorporation during porous silicon formation.More interestingly, organic derivatization may increase surface stability or provide chemical functionalities. The poor reactivity of the hydrogenated surface can be remedied by using various methods: thermal desorption of hydrogen, hydroxylation or halogenation of the surface, thermal or UV assisted reaction. However, most promising results have been obtained through either Lewis-acid catalyzed grafting or electrochemical activation of the surface. The latter method has been used for grafting formate, alkoxy, and recently methyl groups. In most of these methods, oxidation is present as a parallel path, and care must be taken if it is not desired. Also, 100% substitution of the hydrogens by organic groups has never been attained, due to steric hindrance problems. The electrochemical method appears especially fast, and has led to 80% substitution of the hydrogens by methyl groups, with no photoluminescence loss and a chemical stability increased by one order of magnitude.

2018 ◽  
Vol 85 (4) ◽  
pp. 445-448 ◽  
Author(s):  
Mina Martini ◽  
Federica Salari ◽  
Iolanda Altomonte ◽  
Giuseppe Ragona ◽  
Alice Piazza ◽  
...  

Until now there are only few data on the effects of thermal treatments on the nutritional and hygienic characteristics of donkey milk. This Research Communication aims to provide information on the effects of pasteurization (at +65 °C for 30 min) and prolonged storage at refrigeration and freezing temperatures (21 d at + 3 °C ± 2 °C and up to 90 d at −20 °C ± 5 °C) on some nutritional and hygienic characteristics of Amiata donkey milk. The milk was monitored by chemical and microbiological analysis. Pasteurization ensured compliance with EC Regulation No 1441/2007, as Enterobacteriaceae were never found in the milk, or during storage at refrigeration and freezing temperatures. Colony count at 30 °C in pasteurized milk never went beyond 1 log CFU/ml. The heat treatment and the storage did not result in any variations in the main constituents of the milk. Only a decrease in lactose and few variations in some fatty acids at 90 d of freezing were observed. In conclusion, pasteurization was able to achieve and maintain a high hygienic-sanitary quality over time; storage at refrigeration or freezing temperatures did not alter the nutritional quality of fat and the gross composition of the product. These findings are useful to improve knowledge on the milk shelf life in order to guarantee safety and nutritional quality for infants who need small quantities of daily milk.


2003 ◽  
Vol 101 (1-3) ◽  
pp. 249-254 ◽  
Author(s):  
R GUERREROLEMUS ◽  
F BENHANDER ◽  
C HERNANDEZRODRIGUEZ ◽  
J MARTINEZDUART

1987 ◽  
Vol 107 ◽  
Author(s):  
J.D. L'ecuyer ◽  
M.H. Loretto ◽  
J.P.G. Farr ◽  
J.M. Keen ◽  
J.G. Castledine ◽  
...  

AbstractSOI structures up to 60nm wide have been produced using oxidized porous silicon formed by selective n/n+ anodizing. The microstructures of the islands were investigated using TEM in both the planar and cross-section geometries. Typical island thickness is about 0.15nm and the buried oxidized porous silicon about 0.65μm. Retention of the island geometry is excellent. Few defects (essentially dislocations) are associated with either the anodizing or oxidation treatments. The interface sharpness between the epitaxial silicon/oxidized porous silicon is 10-20nm, an order of magnitude sharper than the back interface between the oxidized porous silicon and the substrate.


2014 ◽  
Vol 5 ◽  
pp. 2222-2229 ◽  
Author(s):  
Fabio Lupo ◽  
Cristina Tudisco ◽  
Federico Bertani ◽  
Enrico Dalcanale ◽  
Guglielmo G Condorelli

Free 4-undecenoxyphthalocyanine molecules were covalently bonded to Si(100) and porous silicon through thermic hydrosilylation of the terminal double bonds of the undecenyl chains. The success of the anchoring strategy on both surfaces was demonstrated by the combination of X-ray photoelectron spectroscopy with control experiments performed adopting the commercially available 2,3,9,10,16,17,23,24-octakis(octyloxy)-29H,31H-phthalocyanine, which is not suited for silicon anchoring. Moreover, the study of the shape of the XPS N 1s band gave relevant information on the interactions occurring between the anchored molecules and the substrates. The spectra suggest that the phthalocyanine ring interacts significantly with the flat Si surface, whilst ring–surface interactions are less relevant on porous Si. The surface-bonded molecules were then metalated in situ with Co by using wet chemistry. The efficiency of the metalation process was evaluated by XPS measurements and, in particular, on porous silicon, the complexation of cobalt was confirmed by the disappearance in the FTIR spectra of the band at 3290 cm−1 due to –NH stretches. Finally, XPS results revealed that the different surface–phthalocyanine interactions observed for flat and porous substrates affect the efficiency of the in situ metalation process.


1992 ◽  
Vol 262 ◽  
Author(s):  
Kamal Mishra ◽  
W. Huber ◽  
Jacek Lagowski

ABSTRACTIn this study the effect of oxygen agglomeration on minority carrier diffusion length in as-grown p-CZ silicon has been studied in detail. Oxygen-related defects were found acting as minority carrier traps in p-CZ silicon. These defects are not found in either oxygen-free FZ silicon or in n-type CZ silicon samples. The traps have profound effect on low excitation level diffusion length values leading to an apparent lifetime decrease by as much as an order of magnitude. This effect can be eliminated by a steady state “bias light” superimposed on the chopped excitation light. The traps can be annihilated and re-generated by thermal treatments.Our study has also revealed oxygen-induced recombination centers. Significant improvement in lifetime is realized in p-type CZ silicon after heat treatment between 550°C and 800°C.


2020 ◽  
Vol 24 (09) ◽  
pp. 1129-1137 ◽  
Author(s):  
Aviwe May ◽  
John Mack ◽  
Tebello Nyokong

The optical limiting properties of three meso-pentafluorophenylstyrylBODIPY dyes are investigated in the presence and absence of methyl groups at the 1,7-positions that hinder free rotation of the meso-aryl group. Pentafluorophenyl groups are introduced at the meso-position, while 4-diethylaminostyryl groups are introduced at the 3- and/or 5-positions to form dyes with strong donor-[Formula: see text]-acceptor (D-[Formula: see text]-A) properties to enhance the dipole moment of the molecule. Favorable optical limiting properties are obtained for all three dyes, with the highest second-order hyperpolarizability value obtained for a monostyryl dye with no methyl groups at the 1,7-position. Bromination at the 2,6-positions of a 1,7-methyl substituted dye is found to result in second-order hyperpolarizability that is an order of magnitude lower than that calculated for the analogous non-halogenated dye.


1992 ◽  
Vol 264 ◽  
Author(s):  
John C. Coburn ◽  
M. T. Pottiger ◽  
A. E. Nader ◽  
C. A. Pryde

AbstractAdding photoreactive substituents onto a biphenyldianhydride (BPDA) and p-phenylene diamine (PPD) poly(amic acid) precursor influences the onset of imidization and the development of anisotropy and crystalline morphology during processing and the resulting morphology and properties of the fully cured films. Amine salts shift the imidization to lower temperatures while the covalently bonded esters shift the imidization to slightly higher temperatures. Anisotropy of the photosensitive polyimides develops at higher cure temperatures compared to the poly(amic acid). The photoreactive substituents do not affect the crystal structure, but do influence the crystallite orientation and morphology. Out-of-plane coefficients of thermal expansion (CTEs), calculated from the volume expansivities of these systems, are an order of magnitude larger than the in-plane CTEs.


2013 ◽  
Vol 21 (1) ◽  
pp. 23-29 ◽  
Author(s):  
Gunjan Aggarwal ◽  
Prabhash Mishra ◽  
Bipin Joshi ◽  
Harsh ◽  
S. S. Islam

2000 ◽  
Vol 638 ◽  
Author(s):  
Herman A. Lopez ◽  
J. Eduardo Lugo ◽  
Selena Chan ◽  
Sharon M. Weiss ◽  
Christopher C. Striemer ◽  
...  

AbstractControl over the 1.5 µm emission from erbium is desirable for communication and computational technologies because the erbium emission falls in the window of maximum transmission for silica based fiber optics. Tunable, narrow, directional, and enhanced erbium emission from silicon based 1-D photonic bandgap structures will be demonstrated. The structures are prepared by anodic etching of crystalline silicon and consist of two highly reflecting Bragg reflectors sandwiching an active layer. The cavities are doped by electro-migrating the erbium ions into the porous silicon matrix, followed by high temperature oxidation. By controlling the oxidation temperature, porosity, and thickness of the structure, the position of the erbium emission is tuned to emit in regions where the normal erbium emission is very weak. The erbium emission from the cavity is narrowed to a full width at half maximum (FWHM) of 12 nm with a cavity quality factor Q of 130, highly directional with a 20 degree emission cone around the normal axis, and enhanced by more than one order of magnitude when compared to its lateral emission. Erbium photoluminescence (PL) from porous silicon 2-D photonic bandgap structures is also demonstrated.


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