Chemical Vapor Deposition (CVD) of Iridium and Platinum Films and Gas-Phase Chemical Etching of Iridium Thin Films

1998 ◽  
Vol 541 ◽  
Author(s):  
Chongying Xu ◽  
Frank Dimeo ◽  
Thomas H. Baum ◽  
Michael Russell

AbstractChemical vapor deposition (CVD) of noble metal thin-films is increasingly important for future memory storage applications. Integration of ferroelectric perovskites and/or high permittivity oxides requires specialized metal interconnect technologies. Platinum and iridium are two preferred metal electrode materials being explored since they are highly resistant to corrosion and exhibit excellent stability at high temperatures. Further, the formation of stable oxides (IrO2) provides a mechanism for decreased inter-diffusion of oxygen and elemental film constituents, and provides improved reliability in silicon-based devices. CVD provides conformal electrode films that are required to achieve high-densities; high purity films of both platinum and iridium were deposited in this research, using (β-diketonate)Ir(I)L and (MeCp)Me3Pt(IV) as the precursors.Concurrently, chemical etching of these metals is highly desirable for creating patterns of the electrical contacts and for CVD reactor cleaning. To date, etching of noble metal electrodes has relied upon physical sputtering or chemically assisted etching. In this paper, we also report the first chemical etching of iridium films under ambient conditions, such as room temperature.

2018 ◽  
Vol 10 (3) ◽  
pp. 03001-1-03001-6 ◽  
Author(s):  
Bharat Gabhale ◽  
◽  
Ashok Jadhawar ◽  
Ajinkya Bhorde ◽  
Shruthi Nair ◽  
...  

2009 ◽  
Vol 23 (09) ◽  
pp. 2159-2165 ◽  
Author(s):  
SUDIP ADHIKARI ◽  
MASAYOSHI UMENO

Nitrogen incorporated hydrogenated amorphous carbon (a-C:N:H) thin films have been deposited by microwave surface-wave plasma chemical vapor deposition on silicon and quartz substrates, using helium, methane and nitrogen ( N 2) as plasma source. The deposited a-C:N:H films were characterized by their optical, structural and electrical properties through UV/VIS/NIR spectroscopy, Raman spectroscopy, atomic force microscope and current-voltage characteristics. The optical band gap decreased gently from 3.0 eV to 2.5 eV with increasing N 2 concentration in the films. The a-C:N:H film shows significantly higher electrical conductivity compared to that of N 2-free a-C:H film.


2017 ◽  
Vol 19 (8) ◽  
pp. 1700193 ◽  
Author(s):  
Mattias Vervaele ◽  
Bert De Roo ◽  
Jolien Debehets ◽  
Marilyne Sousa ◽  
Luman Zhang ◽  
...  

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