Atomic Force Microscopy Study of Initial Nucleation in the Deposition OF μc-Si:H
Keyword(s):
AbstractThe initial stages of microcrystalline silicon growth of n+ doped films prepared by rf plasma enhanced chemical vapor deposition (PECVD) and of intrinsic films prepared by hot-wire chemical vapor deposition (HW-CVD) are studied using atomic force microscopy, Raman spectroscopy and parallel dark conductivity measurements. The effect of the use of a plasma hydrogen treatment, of chamber conditioning prior to this treatment, of the type of substrate (glass or c-Si) used and the effects of a seed layer on the film properties are discussed.
2006 ◽
Vol 15
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pp. 1292-1299
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1995 ◽
Vol 10
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pp. 3037-3040
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pp. 366-374
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1998 ◽
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pp. 724-726
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1997 ◽
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pp. 1007-1013
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