Surface Sensitivity Effects With Local Probe Scanning Auger-Scanning Electron Microscopy

AbstractUltra-high-vacuum segregation studies on in-situ fractured Cu-Sb alloys were performed in terms of nanometer scale scanning Auger/Electron microscopy. S contamination leads to the formation of Cu2S precipitates which, upon removal due to fracture, expose pits with morphology that depends on the precipitate size and shape. Local variations of S and Sb distributions inside the pits were correlated to local surface orientations as Atomic Force Microscopy analysis revealed.

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The Heteroepitaxial Nucleation and Growth of Metal Oxides by Llvsztu Oxidation

MRS Proceedings ◽

10.1557/proc-648-p9.6 ◽

2000 ◽

Vol 648 ◽

Author(s):

Mridula D. Bharadwaj ◽

Gnang-wen Zhou ◽

Judith C. Yang

Keyword(s):

Electron Microscopy ◽

Water Vapor ◽

High Vacuum ◽

Ultra High Vacuum ◽

Force Microscopy ◽

Atomic Force ◽

Transmission Electron ◽

Cu Film ◽

Cu Oxidation

AbstractHere we report our investigations on the initial stages of Cu(OO1) oxidation in dry and moist atmosphere using in situ ultra high vacuum (UHV) transmission electron microscopy (TEM), atomic force microscopy (AFM) and scanning electron microscopy (SEM). Cu20 islands were observed to grow 3-dimensionally into the Cu film as seen through the above mentioned techniques. Further, we discuss our interpretation of the experimental observations that presence of water vapor in the oxidizing atmosphere retards the rate of Cu oxidation and Cu20 shows surprising reduction when exposed to water vapor.

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Nanotribology of Diamond Films Studied by Atomic Force Microscopy

MRS Proceedings ◽

10.1557/proc-188-219 ◽

1990 ◽

Vol 188 ◽

Author(s):

Gabi Neubauer ◽

Sidney R. Cohen ◽

Gary M. Mcclelland ◽

Hajime Seki

Keyword(s):

High Vacuum ◽

Diamond Films ◽

Ultra High Vacuum ◽

Nanometer Scale ◽

Kinetic Friction ◽

Experimental Conditions ◽

Stick Slip ◽

Force Microscopy ◽

Atomic Force ◽

The Difference

ABSTRACTAn atomic force microscope, operated in ultra-high vacuum has been employed to study the tribological properties of diamond films under small loads (< 10−6 N) on a nanometer scale. The incidence of intermittent motion, “stick-slip”, while sliding a diamond tip across the diamond film, is detected under certain experimental conditions and is discussed with respect to the difference between static and kinetic friction, sample topography and a varying sample condition.

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Properties of Metal / Polyphenylquinoxaline Interfaces

MRS Proceedings ◽

10.1557/proc-337-715 ◽

1994 ◽

Vol 337 ◽

Cited By ~ 2

Author(s):

L. Bellard ◽

J.M. Themlin ◽

F. Palmino ◽

A. Cros

Keyword(s):

Metal Layer ◽

High Vacuum ◽

Polymer Surface ◽

Pure Metal ◽

Ultra High Vacuum ◽

Ex Situ ◽

Layer By Layer ◽

Force Microscopy ◽

Atomic Force

ABSTRACTWe have investigated the microscopic properties of copper and chromium layers deposited on polyphenylquinoxaline (PPQ). PPQ is a thermostable polymer used for multichip module applications. The metal is deposited under ultra-high vacuum conditions and analysed in-situ by X-ray photoemission (XPS) and atomic force microscopy (ex situ). Copper does not react significantly with the PPQ and tends to diffuse into the polymer matrix upon annealing. On the contrary, chromium strongly reacts with the polymer surface at room temperature. With increasing metal coverage, chromium grows in a layer-by-layer mode and the reacted interface is progressively burried under the pure metal layer.

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Carbon-Based and Other Nanostructures Obtained via Cluster-Assembling: A View Combining Electron Spectroscopies and Nanospectroscopies

Advances in Science and Technology ◽

10.4028/www.scientific.net/ast.51.81 ◽

2006 ◽

Vol 51 ◽

pp. 81-89

Author(s):

L. Gavioli ◽

M. Sancrotti

Keyword(s):

High Vacuum ◽

Auger Spectroscopy ◽

Ultra High Vacuum ◽

Force Microscopy ◽

Atomic Force ◽

Electron Energy Loss ◽

Cluster Beam Deposition ◽

Beam Deposition ◽

Carbon Based

This work will provide an overview of recent experiments devoted to study the nature and properties of materials obtained in situ via cluster-assembling, by using supersonic cluster beam deposition. This technique has proved to be a powerful tool for assembling nanostructured materials with tailored physical properties, in particular for: 1) carbon-based clusters deposited in situ on appropriate substrates in Ultra High Vacuum compatible conditions; 2) a micro-structured pattern based on pristine carbon-based dots and then promoted to the formation of SiC via in situ thermal annealing; 3) thermo-chemically doped nanostructured TiO2, revealing the possibility to control the band gap of this material. The electronic structure of the systems has been studied combining a wide variety of experimental methods, including valence-band and core-level photoemission, Electron Energy Loss Spectroscopy, Scanning Auger Spectroscopy, Atomic Force Microscopy.

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Transmission Electron Microscopy of Epitaxial silicides grown by ultra high vacuum deposition

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100154287 ◽

1989 ◽

Vol 47 ◽

pp. 462-463

Author(s):

D. Loretto ◽

J. M. Gibson ◽

S. M. Yalisove

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Electron Diffraction ◽

High Vacuum ◽

High Energy ◽

Energy Electron ◽

Ultra High Vacuum ◽

Ex Situ ◽

Transmission Electron

The silicides CoSi2 and NiSi2 are both metallic with the fee flourite structure and lattice constants which are close to silicon (1.2% and 0.6% smaller at room temperature respectively) Consequently epitaxial cobalt and nickel disilicide can be grown on silicon. If these layers are formed by ultra high vacuum (UHV) deposition (also known as molecular beam epitaxy or MBE) their thickness can be controlled to within a few monolayers. Such ultrathin metal/silicon systems have many potential applications: for example electronic devices based on ballistic transport. They also provide a model system to study the properties of heterointerfaces. In this work we will discuss results obtained using in situ and ex situ transmission electron microscopy (TEM).In situ TEM is suited to the study of MBE growth for several reasons. It offers high spatial resolution and the ability to penetrate many monolayers of material. This is in contrast to the techniques which are usually employed for in situ measurements in MBE, for example low energy electron diffraction (LEED) and reflection high energy electron diffraction (RHEED), which are both sensitive to only a few monolayers at the surface.

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Laser cleaning of exfoliated graphene

MRS Proceedings ◽

10.1557/opl.2012.1196 ◽

2012 ◽

Vol 1455 ◽

Cited By ~ 2

Author(s):

Oliver Ochedowski ◽

Benedict Kleine Bußmann ◽

Marika Schleberger

Keyword(s):

Local Heating ◽

High Vacuum ◽

Ultra High Vacuum ◽

Ambient Conditions ◽

Kelvin Probe ◽

Structural Modifications ◽

Force Microscopy ◽

Exfoliated Graphene ◽

Atomic Force ◽

P Type

ABSTRACTWe have employed atomic force and Kelvin-Probe force microscopy to study graphene sheets exfoliated on TiO2 under the influence of local heating achieved by laser irradiation. Exfoliation and irradiation took place under ambient conditions, the measurements were performed in ultra high vacuum. We show that after irradiation times of 6 min, an increase of the surface potential is observed which indicates a decrease of p-type carrier concentration. We attribute this effect to the removal of adsorbates like water and oxygen. After irradiation times of 12 min our topography images reveal severe structural modifications of graphene. These resemble the nanocrystallite network which form on graphene/SiO2 but after much longer irradiation times. From our results we propose that short laser heating at moderate powers might offer a way to clean graphene without inducing unwanted structural modifications.

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