Structural Studies of Nickel Films and their Interface with Sapphire Substrates

1986 ◽  
Vol 77 ◽  
Author(s):  
C. J. Sparks ◽  
M. Hasaka ◽  
D. S. Easton ◽  
S. Baik ◽  
T. Habenschuss ◽  
...  
Keyword(s):  
Single Crystals ◽  
Vapor Deposition ◽  
Basal Plane ◽  
Nickel Atom ◽  
Structural Studies ◽  
X Ray Diffraction ◽  
X Ray ◽  
Nickel Films ◽  
Sapphire Substrates ◽  
X Ray Scattering

ABSTRACTThe perfection of epitaxial nickel films grown on the (00.ℓ) or basal plane of heated sapphire (A1203) single crystals were studied with X-ray diffraction techniques. Nickel films approximately 700 Å thick formed by vapor deposition increased in perfection as the temperature of the sapphire approached 1400°C. Although the nickel atom distances are 10.3% smaller than those of the closed-packed direction in sapphire, the strain was accommodated at the interface rather than being distributed through the thickness of the nickel film. Diffuse rods of X-ray scattering which are associated with diffraction from the interface gave information about the nature of the roughness at the interface.

Structural Studies Coupling X-ray Diffraction and High-Energy X-ray Scattering in the UO22+–HBraqSystem

2011 ◽  
Vol 50 (21) ◽  
pp. 10748-10754 ◽  
Author(s):  
Richard E. Wilson ◽  
S. Skanthakumar ◽  
C. L. Cahill ◽  
L. Soderholm
Keyword(s):  
High Energy ◽  
Structural Studies ◽  
X Ray Diffraction ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

ChemInform Abstract: Structural Studies Coupling X-Ray Diffraction and High-Energy X-Ray Scattering in the UO22+-HBraqSystem.

ChemInform ◽  
2011 ◽  
Vol 43 (4) ◽  
pp. no-no
Author(s):  
Richard E. Wilson ◽  
S. Skanthakumar ◽  
C. L. Cahill ◽  
L. Soderholm
Keyword(s):  
High Energy ◽  
Structural Studies ◽  
X Ray Diffraction ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

scholarly journals On the possibility of the Observation of Intramolecular Reaction Dynamics in Liquids by Time-resolved X-ray Scattering

2002 ◽  
Vol 216 (5) ◽  
Author(s):  
S. Techert ◽  
S. Schmatz
Keyword(s):  
Gas Phase ◽  
Free Electron Laser ◽  
Structural Changes ◽  
Reaction Dynamics ◽  
Structural Studies ◽  
X Ray Diffraction ◽  
Time Resolved ◽  
X Ray ◽  
X Ray Scattering ◽  
Trans Stilbene

The feasibility of time-resolved structural studies using pulsed X-ray radiation from a 3rd generation synchrotron is discussed and compared with scattering experiments which might be possible with a future free electron laser (X-FEL). As an example, it is shown that the structural changes during the isomerisation process of trans-stilbene into cis-stilbene can be observed using time-resolved X-ray diffraction in the gas-phase as well as in solution.

scholarly journals The Growth and Deformation of Ice Crystals

1954 ◽  
Vol 2 (16) ◽  
pp. 397-403 ◽  
Author(s):  
J. W. Glen ◽  
M. F. Perutz
Keyword(s):  
Melting Point ◽  
Single Crystals ◽  
Basal Plane ◽  
Growth Direction ◽  
Ice Crystals ◽  
X Ray Diffraction ◽  
X Ray ◽  
Original Length ◽  
Break Up

AbstractX-ray diffraction photographs were taken of ice dendrites grown from water and from the vapour. In both cases [1120] was found to be the growth direction.A method of growing cylindrical single crystals of any desired orientation has been devised. Some of these crystals were extended to several times their original length. Slip took place exclusively on the basal plane. Experiments designed to locate the glide direction gave inconclusive results and suggested that, in general, crystals near the melting point can glide in any direction.Before deformation, ice crystals gave fairly sharp X-ray diffraction spots on Laue photographs. After deformation the spots are drawn out into streaks which later break up into rows of small spots. This indicates that bending of the crystals is followed by the formation of small crystallites of slightly differing orientations. Analogous effects are observed in metals.

THE EFFECTS OF GRAIN BOUNDARIES ON THE PLASTIC DEFORMATION OF ZINC CRYSTALS

1957 ◽  
Vol 35 (1) ◽  
pp. 38-47 ◽  
Author(s):  
G. B. Craig ◽  
B. Chalmers
Keyword(s):  
Plastic Deformation ◽  
Single Crystal ◽  
Grain Boundaries ◽  
Single Crystals ◽  
Basal Plane ◽  
Basal Slip ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Patterns

The tensile plastic deformation of single-crystal and tricrystal specimens of zinc was investigated by analysis of the external change in shape of the specimens, and of the changes in X-ray diffraction patterns. It was demonstrated that the single crystals deformed by slip on the basal plane, but pyramidal as well as basal slip occurred in specimens containing grain boundaries.

Observation of the Ordered CoPt3 Alloy in Co-Pt Multilayers

1992 ◽  
Vol 263 ◽  
Author(s):  
M.F. Toney ◽  
R.F.C. Farrow ◽  
R.F. Marks ◽  
G. Harp ◽  
T.A. Rabedeau
Keyword(s):  
Diffraction Study ◽  
Basal Plane ◽  
Grazing Incidence ◽  
Real Space ◽  
Perpendicular Anisotropy ◽  
X Ray Diffraction ◽  
X Ray ◽  
Sapphire Substrates ◽  
Chemical Ordering ◽  
Bulk Alloys

ABSTRACTWe report results of a synchrotron X-ray diffraction study of Co-Pt multilayers, with Pt[111] as the growth axis. The multilayers were grown by MBE on Pt seedfilms on basal-plane sapphire substrates at growth temperatures of 100 and 200ºC.The multilayers comprised 15 periods of Co 3Å, Pt 15Å and both exhibited perpendicular anisotropy. Grazing-incidence radial- and phi-scans revealed a set of {110{ peaks indicating doubling of real space periodicity consistent with the presence of the ordered alloy CoPt3. This supports the results of other studies which indicate interdiffused interfaces in Co-Pt multilayers and shows that chemical ordering can occur at much lower temperatures than in bulk alloys where annealing times of several days at ∼ 700ºC are required to stimulate ordering.

scholarly journals Chemical vapor deposition of sp2-boron nitride films on Al2O3 (0001), (11𝟐0), (1𝟏02) and (10𝟏0) substrates

2021 ◽  
Author(s):  
Sachin Sharma ◽  
Laurent Souqui ◽  
Henrik Pedersen ◽  
Hans Högberg
Keyword(s):  
Chemical Vapor Deposition ◽  
Boron Nitride ◽  
Vapor Deposition ◽  
Chemical Vapor ◽  
X Ray Diffraction ◽  
X Ray ◽  
Sapphire Substrates ◽  
Crystalline Films ◽  
Boron Nitride Films ◽  
Potential Use

Thin films of boron nitride in its sp2-hybridized form (sp2-BN) have potential use in UV-devices and dielectrics. Here, we explore chemical vapor deposition (CVD) of sp2-BN on various cuts of sapphire; Al2O3(112̅0), Al2O3(11̅02), Al2O3(11̅00) and Al2O3 (0001) using two CVD processes with different boron precursors; triethylborane (TEB) and trimethylborane (TMB). Fourier transform infrared spectroscopy (FTIR) showed that sp2-BN grows on all the sapphire substrates, using X-ray diffraction (XRD), 2θ/ω diffractograms showed that only Al2O3(112̅0) and Al2O3(0001) renders crystalline films and using phi(ɸ)-scans the growth of rhombohedral polytype (r-BN) films on these substrates is confirmed. These films are found to be epitaxially grown on an AlN interlayer with a higher crystalline quality for the films grown on the Al2O3(112̅0) substrate which is determined using omega(ω)-scans. Our study suggests that Al2O3(112̅0) is the most favorable sapphire substrate to realize the envisioned applications of r-BN films.

Ribosome Structural Organization

1974 ◽  
Vol 32 ◽  
pp. 332-333
Author(s):  
James A. Lake
Keyword(s):  
Ribosomal Proteins ◽  
Structural Organization ◽  
Three Dimensional ◽  
Small Subunit ◽  
Structural Studies ◽  
X Ray Diffraction ◽  
Specific Antibodies ◽  
X Ray ◽  
E Coli ◽  
Complete Sequences

The understanding of ribosome structure has advanced considerably in the last several years. Biochemists have characterized the constituent proteins and rRNA's of ribosomes. Complete sequences have been determined for some ribosomal proteins and specific antibodies have been prepared against all E. coli small subunit proteins. In addition, a number of naturally occuring systems of three dimensional ribosome crystals which are suitable for structural studies have been observed in eukaryotes. Although the crystals are, in general, too small for X-ray diffraction, their size is ideal for electron microscopy.

Microstructure and Physical Properties of Clay-Polymer Composites

2000 ◽  
Vol 628 ◽  
Author(s):  
T.N. Blanton ◽  
D. Majumdar ◽  
S.M. Melpolder
Keyword(s):  
Composite Materials ◽  
Physical Properties ◽  
Polymer Composites ◽  
Basal Plane ◽  
X Ray Diffraction ◽  
X Ray ◽  
Layered Clay

ABSTRACTClay-polymer nanoparticulate composite materials are evaluated by the X-ray diffraction technique. The basal plane spacing provided information about the degree of intercalation and exfoliation of the 2: 1 layered clay structure. Both intercalation and exfoliation are controlled by the identity of the polymer and the clay:polymer ratio.

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