Mechanical Properties and Morphology of Pulsed – Laser Deposited BaTiO3 Thin Films

2003 ◽  
Vol 780 ◽  
Author(s):  
Jie Xu ◽  
Daniel P. Durisin ◽  
Gregory W. Auner
Keyword(s):  
Thin Films ◽  
Mechanical Properties ◽  
Laser Fluence ◽  
Photoelectron Spectroscopy ◽  
Pulsed Laser ◽  
Scratch Test ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Background Gas

AbstractBaTiO3 thin films have been grown on Si(100) substrate by KrF pulsed – laser deposition (PLD). The process parameters such as background gas pressure, substrate temperature, and laser fluence were varied in order to investigate their influence on the crystal structure, surface morphology and mechanical properties. The films were characterized by X-ray diffraction (XRD), UV/VIS/NIR spectrometer, atomic force microscopy (AFM) and X-ray photoelectron spectroscopy (XPS). The hardness, Young's modules and scratch testing of BaTiO3 films were measured using nano-indenter. The stoichiometric BaTiO3 films having uniform grains were grown. The defects and particulates were generated at higher laser fluence. The size and density of particulates were increased with tighter laser focus. The results from dynamic scratch test indicated that the films with good adhesion were grown at moderate laser fluence.

Matrix Assisted Pulsed Laser Evaporation of Poly (D, L) Lactic Acid Films

2004 ◽  
Vol 845 ◽  
Author(s):  
Timothy M. Patz ◽  
Anand Doraiswamy ◽  
Roger Narayan ◽  
Nicola Menegazzo ◽  
Christine Kranz ◽  
...  
Keyword(s):  
Thin Films ◽  
Lactic Acid ◽  
Photoelectron Spectroscopy ◽  
Pulsed Laser ◽  
Laser Evaporation ◽  
Absorption Bands ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Tissue Interface

ABSTRACTWe have deposited poly (D, L lactic acid) (PDLLA) thin films using matrix assisted pulsed laser evaporation (MAPLE). FTIR spectroscopy revealed that the PDLLA had similar absorption bands to the dropcast material. X-ray photoelectron spectroscopy has shown that peaks corresponding to C-H, C-O and C=O represented 38.4, 30.1 and 31.4% of the C1s spectrum, respectively. XPS O1s analysis revealed that the O=C and O-C components make up 52 and 48 % of the O1s content. Atomic force microscopy revealed that MAPLE deposition provides smooth, continuous thin biomaterial films. These matrix assisted pulsed laser evaporation-deposited biomaterial thin films may serve to improve the implant/tissue interface.

The Structural and Morphology of (La0.7Sr0.3)MnO3 Thin Films Prepared by Pulsed Laser Deposition

2010 ◽  
Vol 150-151 ◽  
pp. 908-911 ◽  
Author(s):  
Wei Rao ◽  
Jun Yu
Keyword(s):  
Thin Films ◽  
Pulsed Laser Deposition ◽  
Photoelectron Spectroscopy ◽  
Perovskite Phase ◽  
Pulsed Laser ◽  
Laser Deposition ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force

(La0.7Sr0.3)MnO3 (LSMO) thin films were prepared on Si (100) substrate by pulsed laser deposition (PLD). Both structure and surface morphology of the films were investigated by X-ray diffraction (XRD) and atomic force microscopy (AFM). Furthermore, the chemical states and chemical composition of the films were determined by X-ray photoelectron spectroscopy (XPS) near the surface. The results indicate that the films grown on Si (100) substrates have a single pseudo cubic perovskite phase structure with a high (100) orientation. The XPS results show that La, Sr and Mn exist mainly in the forms of perovskite structure and a SrO layer was found on outermost surface.

X-Ray Photoelectron Spectroscopy of (La0.7Sr0.3)MnO3Thin Films Prepared by Pulsed Laser Deposition

2011 ◽  
Vol 284-286 ◽  
pp. 2191-2197 ◽  
Author(s):  
Hui Fang Xiong ◽  
Tie Dong Cheng ◽  
X.G. Tang ◽  
Jian Chen ◽  
Qiu Xiang Liu
Keyword(s):  
Thin Films ◽  
Pulsed Laser Deposition ◽  
Photoelectron Spectroscopy ◽  
Perovskite Phase ◽  
Pulsed Laser ◽  
Laser Deposition ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force

(La0.7Sr0.3)MnO3 (LSMO) thin films were grown on Si (100) substrate by using pulsed laser deposition (PLD) process. Both structure and surface morphology of the films were investigated by X-ray diffraction (XRD) and atomic force microscopy (AFM). Furthermore, the chemical states and chemical composition of the films were determined by X-ray photoelectron spectroscopy (XPS) near the surface. From XRD, the results indicate that the films grown on Si (100) substrates have a single pseudocubic perovskite phase structure with a high (100) orientation. The XPS results show that La, Sr and Mn exist mainly in the forms of perovskite structure and a SrO layer was found on outermost surface. The films resistivity emeasured under room temperature is 6.4´10-4 W×cm.

Synthesis and Characterization of Nb-Doped TiO2 Thin Films Prepared by RF Magnetron Sputtering

2015 ◽  
Vol 1117 ◽  
pp. 139-142 ◽  
Author(s):  
Marius Dobromir ◽  
Radu Paul Apetrei ◽  
A.V. Rogachev ◽  
Dmitry L. Kovalenko ◽  
Dumitru Luca
Keyword(s):  
Thin Films ◽  
Magnetron Sputtering ◽  
Photoelectron Spectroscopy ◽  
Rf Magnetron Sputtering ◽  
X Ray ◽  
Force Microscopy ◽  
Glass Substrates ◽  
Atomic Force ◽  
Vis Spectroscopy ◽  
Diffraction Patterns

Amorphous Nb-doped TiO2 thin films were deposited on (100) Si and glass substrates at room temperature by RF magnetron sputtering and a mosaic-type Nb2O5-TiO2 sputtering target. To adjust the amount of the niobium dopant in the film samples, appropriate numbers of Nb2O5 pellets were placed on the circular area of the magnetron target with intensive sputtering. By adjusting the discharge conditions and the number of niobium oxide pellets, films with dopant content varying between 0 and 16.2 at.% were prepared, as demonstrated by X-ray photoelectron spectroscopy data. The X-ray diffraction patterns of the as-deposited samples showed the lack of crystalline ordering in the samples. Surfaces roughness and energy band gap values increase with dopant concentration, as showed by atomic force microscopy and UV-Vis spectroscopy measurements.

Influence of Post Growth Annealing on the Optical Properties of Gallium Nitride Films Grown by Pulsed Laser Deposition

2012 ◽  
Vol 1432 ◽  
Author(s):  
M. Baseer Haider ◽  
M. F. Al-Kuhaili ◽  
S. M. A. Durrani ◽  
Imran Bakhtiari
Keyword(s):  
Thin Films ◽  
Gallium Nitride ◽  
Pulsed Laser Deposition ◽  
Pulsed Laser ◽  
Nitrogen Atmosphere ◽  
Laser Deposition ◽  
Optical Measurements ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force

Abstract:Gallium nitride thin films were grown by pulsed laser deposition. Subsequently, post-growth annealing of the samples was performed at 400, and 600 oC in the nitrogen atmosphere. Surface morphology of the as-grown and annealed samples was performed by atomic force microscopy, surface roughness of the films improved after annealing. Chemical analysis of the samples was performed using x-ray photon spectroscopy, stoichiometric Gallium nitride thin films were obtained for the samples annealed at 600 oC. Optical measurements of the samples were performed to investigate the effect of annealing on the band gap and optical constants the films.

scholarly journals Effects of Deposition Time on the Morphology, Structure, and Optical Properties of PbS Thin Films Prepared by Chemical Bath Deposition

2018 ◽  
Vol 2018 ◽  
pp. 1-8 ◽  
Author(s):  
B. Abdallah ◽  
A. Ismail ◽  
H. Kashoua ◽  
W. Zetoun
Keyword(s):  
Thin Films ◽  
Chemical Bath Deposition ◽  
Photoelectron Spectroscopy ◽  
Deposition Time ◽  
Optical Band Gap ◽  
Optical Transmittance ◽  
Xrd Analysis ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force

Lead sulfide thin films were prepared by chemical bath deposition (CBD) on both glass and Si (100) substrates. XRD analysis of the PbS film deposited at 25°C showed that the prepared films have a polycrystalline structure with (200) preferential orientation. Larger grains could be obtained by increasing the deposition time. The prepared films were also chemically characterized using X-ray photoelectron spectroscopy (XPS), which confirmed the presence of lead and sulfur as PbS. While energy dispersive X-ray spectroscopy (EDX) technique was used to verify the stoichiometry of the prepared films. Atomic force microscopy (AFM) was used to study the change in the films’ morphology with the deposition time. The effect of the deposition time, on both optical transmittance in the UV-Vis-NIR region and the structure of the film, was studied. The obtained results demonstrated that the optical band gap decreased when the thickness increased.

Structural and Morphological Differences of Thin Films Obtained by Plasma Polymerization of Pyrrole (Ppy) and Thiophene (Pth)

2002 ◽  
Vol 725 ◽  
Author(s):  
Salvador Borrós ◽  
M.Paz Diago ◽  
Joan Esteve ◽  
Núria Agulló
Keyword(s):  
Thin Films ◽  
Electrical Conductivity ◽  
Photoelectron Spectroscopy ◽  
Plasma Polymerization ◽  
Morphological Characterization ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Morphological Differences

AbstractIn this work, thin films (thickness ∼ 0.5 μm) were obtained by plasma polymerization of pyrrole (Ppy) and thiophene (Pth) at 25-30 W and 0.1-0.2 mbar of pressure. Further doping with iodine was carried out to some of the Ppy and Pth films (Ppy/I2, Pth/I2) in order to enhance their electrical conductivity properties.Structural and morphological characterization of both Ppy and Pth as well as of Ppy/I2 and Pth/I2 was performed using Infrared Spectroscopy (IR), X-ray Photoelectron Spectroscopy (XPS) and Atomic Force Microscopy (AFM).In the light of the information given by IR, XPS and AFM techniques, exhaustive and accurate description of both undoped and I2/doped Ppy and Pth films obtained by Plasma Polymerization is attained.

PHOTONIC GAPS OF ALUMINIUM–NITRIDE FILM RELATED WITH STRUCTURE AND DEPOSITION

2011 ◽  
Vol 25 (04) ◽  
pp. 487-497
Author(s):  
CONETT HUERTA ESCAMILLA ◽  
FABIO CHALE LARA ◽  
MUFEI XIAO
Keyword(s):  
Photoelectron Spectroscopy ◽  
Pulsed Laser ◽  
Nitride Film ◽  
Reflection Spectroscopy ◽  
X Ray ◽  
Force Microscopy ◽  
Optical Reflection ◽  
Optical Responses ◽  
Atomic Force ◽  
Deposition Conditions

Work is reported on the characterizations of pulsed laser deposited aluminum–nitride thin films. The films were deposited on silicon substrate with a KrF 248 nm pulse laser operating in a Riber LDM-22 system. Optical reflection spectroscopy (400–900 nm) was carried out, which revealed that, under certain deposition conditions, the films could show strong periodic spectra with reflection gaps of about 50–100 nm in width. The microscopic structures, such as crystalline status and element composition, were also investigated with Auger electron spectroscopy, X-ray photoelectron spectroscopy, atomic force microscopy, scanning electron microscopy, and profilometry etc. Relations between the optical responses and the microscopic structures were established. The foundations underlying the relations were studied and discussed.

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